Abstract:
A safety system monitors faults in an embedded control system. The embedded control system is modeled to produce one or more model check values by calculating how many clock cycles will pass between an initialization time point and at least one event time point for a specific event. The initialization time point is a certain point in an initialization function of a scheduler in the embedded control system. The at least one event time point is an expected number of clock cycles to pass before a specific event occurs. In operation, the embedded control system is initialized, a current clock cycle counter value is retrieved at a certain point in the initialization, and either an occurrence or an absence of an occurrence of a scheduled event is recognized. A current clock cycle value is recorded upon the recognition, and a mathematic check value is produced from the clock cycle value stored at the certain point in the initialization and the clock cycle value recorded upon the recognition. Subsequently, the model check value is compared to the mathematic check value, and action is taken based on the comparison.
Abstract:
A Schmitt Trigger is implemented in FDSOI technology. The Schmitt Trigger includes a first inverting stage having an NMOS and PMOS transistor having their drains tied together. The NMOS and PMOS transistor each have a first gate coupled to the input voltage and a back gate coupled to the output of the Schmitt Trigger.
Abstract:
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.
Abstract:
An amplitude limiting circuit for a crystal oscillator circuit includes a current source configured to supply drive current to the crystal oscillator circuit and a current sensing circuit configured to sense operating current in an inverting transistor of the crystal oscillator circuit. The current comparison circuit functions to compare the sensed operating current to at least a reference current and generate an output signal. A current control circuit generates a control signal for controlling operation of the current source in response to the output signal.
Abstract:
A phase locked loop includes a voltage-controlled oscillator and a current mirror circuit that supplies a drive current to the voltage-controlled oscillator. The current mirror circuit includes a filter between a bias current generator and current mirror transistor. The filter includes a first and a second switch driven in unison with a small duty cycle.
Abstract:
An integrated circuit die includes multiple temperature sensor units each for measuring the temperature of respective regions of a semiconductor substrate of the integrated circuit die. The temperature sensor units are each coupled to a multiplexer by respective groups of signal lines. The signal lines include resistance compensation areas for maintaining a particular ratio of resistances of the signal lines of each group.
Abstract:
A phase locked loop includes a voltage controlled oscillator and a frequency divider or frequency multiplier. The voltage controlled oscillator and the frequency divider/multiplier are coupled together in a stacked configuration. A drive current is supplied to the voltage controlled oscillator. The drive current passes from the voltage controlled oscillator to the frequency divider/multiplier, thereby driving the frequency divider/multiplier with the same drive current that was supplied to the voltage controlled oscillator.
Abstract:
A plurality of frames of data are transmitted over a serial interface in a manner that limits interference on the interface. This involves generating a pseudo-random number and asserting a read control signal at a moment in time, wherein a timing of the moment in time is influenced by the pseudo-random number. In response to the asserted read control signal, a frame of data is read from a data buffer. The read frame of data is then transmitted over the serial interface. A number of alternative embodiments are possible, such as embodiments in which buffer read operations are triggered based on the buffer fill level, and other embodiments in which buffer read operations are triggered by a timer. By using the pseudo-random number to influence the buffer read operations, timing coherency between the reading of frames is made low, thereby limiting interference.
Abstract:
A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.
Abstract:
The invention concerns a circuit comprising: a first transistor (102) having first and second main current nodes, and a gate node adapted to receive a first timing signal (CLK) for causing the first transistor to transition between conducting and non-conducting states; a biasing circuit (108) coupled to a further node of said first transistor; and a control circuit (110) adapted to control said biasing circuit to apply a first control voltage (VCTRL) to said further node to adjust the timing of at least one of said transitions.