Abstract:
A system includes a memory controller and a plurality of memory devices connected in-series that communicate with the memory controller. Each of the memory devices has multiple independent serial ports for receiving and transmitting data. The memory controller a device address (DA) or ID number for designating a device that executes a command. Data contained in the command sent by the memory controller is captured by an individual link control circuit, in response to internally generated clock with appropriate latencies. The captured data is written into a corresponding memory bank. The data stored in one of a plurality of memory banks of one memory device is read in accordance with the addresses issued by the memory controller. The read data is propagated from the memory device through the series-connected memory devices to the memory controller.
Abstract:
An apparatus, system, and computer-implemented method for controlling data transfer between a plurality of serial data link interfaces and a plurality of memory banks in a semiconductor memory is disclosed. In one example, a flash memory device with multiple links and memory banks, where the links are independent of the banks, is disclosed. The flash memory devices may be cascaded in a daisy-chain configuration using echo signal lines to serially communicate between memory devices. In addition, a virtual multiple link configuration is described wherein a single link is used to emulate multiple links.
Abstract:
A system controller communicates with devices in a serial interconnection. The system controller sends a read command, a device address identifying a target device in the serial interconnection and a memory location. The target device responds to the read command to read data in the location identified by the memory location. Read data is provided as an output signal that is transmitted from a last device in the serial interconnection to a data receiver of the controller. The data receiver establishes acquisition instants relating to clocks in consideration of a total flow-through latency in the serial interconnection. Where each device has a clock synchronizer, a propagated clock signal through the serial interconnection is used for establishing the acquisition instants. The read data is latched in response to the established acquisition instants in consideration of the flow-through latency, valid data is latched in the data receiver.
Abstract:
A system includes a plurality of memory devices connected in-series that communicate with a memory controller. When a memory device receives a command strobe signal indicating the start of a command having an ID number, the memory device is placed in a de-selected state and the ID number is compared to the memory device's device address. Delayed versions of the command strobe signal and the command are forwarded while the memory device is in the de-selected state. If the ID number matches the device address with reference to the ID number, the memory device is placed in a selected state. In the selected state, the memory device may refrain from forwarding the delayed versions of the command strobe signal and the command, such that if there is a match, a truncated part of the command is forwarded before the memory device is placed in the selected state.
Abstract:
Provided is a memory system that has a plurality of memory banks and a plurality of link controllers. For each memory bank, there is first switching logic for receiving output for each link controller, and for passing on the output of only one of the link controllers to the memory bank. For each link controller, there is second switching logic for receiving an output of each memory bank, and for passing on the output of only one of the memory banks to the link controller. According to an embodiment of the invention, there is switch controller logic for controlling operation of both the first switching logic and the second switching logic to prevent simultaneous or overlapping access by multiple link controllers to the same memory bank, and for preventing simultaneous or overlapping access to multiple banks by the same link controller.
Abstract:
A semiconductor device for transferring input data to a non-volatile memory device. The semiconductor device comprises a virtual page buffer including a plurality of data elements; a mask buffer including a corresponding plurality of data elements; control logic circuitry for (i) setting each of the mask buffer data elements to a first logic state upon receipt of a trigger; (ii) causing input data to be written to selected virtual page buffer data elements; and (iii) causing those mask buffer data elements corresponding to the selected virtual page buffer data elements to be set to a different logic state; mask logic circuitry configured to generate masked output data by combining, for each of the virtual page buffer data elements, data read therefrom together with the logic state of the corresponding mask buffer data element; and an output interface configured to release the masked output data towards the non-volatile memory device.
Abstract:
Bridge device architecture for connecting discrete memory devices is disclosed. A bridge device is used in conjunction with a composite memory device including at least one discrete memory device. The bridge device comprises a local control interface connected to the at least one discrete memory device, a local input/output interface connected to the at least one discrete memory device, and a global input/output interface interposed between the local control interface and the local input/output interface. The global input/output interface receives and provides global memory control signals and also receives and provides write data to and read data from the at least one discrete memory device.
Abstract:
A method and system for high speed testing of memories in a multi-device system, where individual devices of the multi-device system are arranged in a serial interconnected configuration. High speed testing is achieved by first writing test pattern data to the memory banks of each device of the multi-device system, followed by local test read-out and comparison of the data in each device. Each device generates local result data representing the absence or presence of a failed bit position in the device. Serial test circuitry in each device compares the local result data with global result data from a previous device. The test circuitry compresses this result of this comparison and provides it to the next device as an updated global result data. Hence, the updated global result data will represent the local result data of all the previous devices.
Abstract:
A system includes a memory controller and a plurality of semiconductor devices that are series-connected. Each of the devices has memory core for storing data. The memory controller provides a clock signal for synchronizing the operations of the devices. Each device includes a phase-locked loop (PLL) that is selectively enabled or disabled by a PLL enable signal. In each group, the PLLs of a selected number of devices are enabled by PLL enable signals and the other devices are disabled. The enabled PLL provides a plurality of reproduced clock signals with a phase shift of a multiple of 90° in response to an input clock signal. The data transfer is synchronized with at least one of the reproduced clock signals. In the devices of disabled PLLs, the data transfer is synchronized with the input clock signal. The enabled PLL and disabled PLL cause the devices to be the source and the common synchronous clocking, respectively. The devices can be grouped. The devices of one group can be structured by multiple chip packages.
Abstract:
A dynamic random access memory (DRAM) device has an array of DRAM cells of rows by columns. Each DRAM cell of the array is coupled with a wordline of a corresponding row and a bitline of a corresponding column. An entry into and an exit from the self-refresh mode are detected by a mode detector and a self-refresh mode signal is provided. An oscillation circuit generates in response to the self-refresh mode signal generates a basic time period. A first frequency divider/time period multiplier changes the basic time period in accordance with a process variation factor relating to the DRAM device. A second frequency divider/time period multiplier further changes the changed time period in accordance with a temperature change factor relating to the DRAM device. In the self-refresh mode, data stored in the DRAM cells is refreshed. In accordance with the two factors, the DRAM devices perform and achieve reliable self-refresh for variable DRAM cell retention time.