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公开(公告)号:US4666858A
公开(公告)日:1987-05-19
申请号:US663114
申请日:1984-10-22
CPC分类号: C23C18/1683 , C23C18/38 , Y10T436/163333 , Y10T436/212 , Y10T436/255
摘要: The quantity of an anionic material in a sample is determined by adjusting the pH of the sample to place the material in nonionic extractable form, extracting out the material, spectrophotometrically measuring the extracted material, and comparing the measured value to a standard in order to determine the quantity of the anionic material.
摘要翻译: 样品中阴离子材料的量通过调节样品的pH值来确定,以将材料置于非离子可萃取形式,提取出材料,分光光度法测量提取的材料,并将测量值与标准进行比较,以确定 阴离子材料的数量。
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公开(公告)号:US4623554A
公开(公告)日:1986-11-18
申请号:US709955
申请日:1985-03-08
CPC分类号: C23C18/1683 , C23C18/1617 , C23C18/405
摘要: Method for controlling plating in an electroless plating process. The plating rate is continuously monitored. The plating rate is compared with a set point plating rate. A control voltage is derived proportional to the difference in plating rate and the desired plating rate, the integral of the difference, and the derivative of the difference. The control voltage is applied to a replenishment control for controlling the replenishment rate of a constituent chemical of the plating process.
摘要翻译: 在无电镀工艺中控制电镀的方法。 连续监测电镀速率。 将电镀速率与设定点电镀速率进行比较。 导出的控制电压与电镀速率和期望电镀速率的差值,差值的积分以及差分的导数成正比。 控制电压被施加到用于控制电镀处理的组成化学品的补充速率的补充控制。
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公开(公告)号:US20080026316A1
公开(公告)日:2008-01-31
申请号:US11492029
申请日:2006-07-25
IPC分类号: G03C1/00
CPC分类号: G03F7/06 , G03F7/164 , H05K3/0076 , H05K3/064 , Y10S430/106 , Y10S430/114 , Y10S430/127
摘要: A photoresist composition, e.g., a positive acting resist, for use in the formation of circuit patterns and the like on printed circuit boards and the like circuitized substrates, the photoresist composition including a quantity of silver therein in a sufficient amount to substantially prevent bacteria formation within said composition. A method of making the composition is also provided.
摘要翻译: 用于在印刷电路板等电路基板上形成电路图案等的光致抗蚀剂组合物,例如正性抗蚀剂,光致抗蚀剂组合物中含有足够量的银,以基本上防止细菌形成 在所述组合物内。 还提供了制备该组合物的方法。
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公开(公告)号:US07169313B2
公开(公告)日:2007-01-30
申请号:US11128272
申请日:2005-05-13
申请人: Norman A. Card , Robert D. Edwards , John J. Konrad , Roy H. Magnuson , Timothy L. Wells , Michael Wozniak
发明人: Norman A. Card , Robert D. Edwards , John J. Konrad , Roy H. Magnuson , Timothy L. Wells , Michael Wozniak
CPC分类号: H05K3/427 , H05K3/108 , H05K3/382 , H05K3/429 , H05K2203/0353 , H05K2203/1476 , Y10T29/49156 , Y10T29/49165
摘要: A method of plating a circuit pattern on a substrate to produce a circuitized substrate (e.g., a printed circuit board) in which a dual step metallurgy application process is used in combination with a dual step photo-resist removal process. Thru-holes are also possible, albeit not required.
摘要翻译: 将电路图案电镀在基板上以制造其中双步骤冶金施加工艺与双步骤光刻胶去除工艺结合使用的电路化基板(例如印刷电路板)的方法。 通孔也是可以的,尽管不是必需的。
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公开(公告)号:US06949397B2
公开(公告)日:2005-09-27
申请号:US10466516
申请日:2002-01-11
申请人: Michel Despont , Roy H. Magnuson , Ute Drechsler
发明人: Michel Despont , Roy H. Magnuson , Ute Drechsler
IPC分类号: B81B3/00 , B81C1/00 , C23F13/14 , H01L21/306 , H01L21/00
CPC分类号: H01L21/30604 , B81B2201/12 , B81B2203/0118 , B81C1/00801 , B81C2201/0107 , B81C2201/0114 , B81C2201/0133 , C23F13/14
摘要: A method for protecting a material of a microstructure comprising said material and a noble metal layer against undesired galvanic etching during manufacture comprises forming on the structure a sacrificial metal layer having a lower redox potential than said material, the sacrificial metal layer being electrically connected to said noble metal layer.
摘要翻译: 一种用于在制造过程中保护包含所述材料的微结构材料和贵金属层以防止不期望的电镀蚀刻的方法包括在所述结构上形成具有比所述材料更低的氧化还原电位的牺牲金属层,所述牺牲金属层电连接到所述 贵金属层。
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公开(公告)号:US06228246B1
公开(公告)日:2001-05-08
申请号:US09347581
申请日:1999-07-01
申请人: Madhav Datta , Raymond T. Galasco , Lawrence P. Lehman , Roy H. Magnuson , Robin A. Susko , Robert D. Topa
发明人: Madhav Datta , Raymond T. Galasco , Lawrence P. Lehman , Roy H. Magnuson , Robin A. Susko , Robert D. Topa
IPC分类号: C25F300
CPC分类号: H05K3/44 , C25F3/00 , H05K3/07 , H05K2201/0338 , H05K2201/0347 , H05K2203/0285 , H05K2203/0361
摘要: A method of removing a metal skin from a through-hole surface of a copper-Invar-copper (CIC) laminate without causing differential etchback of the laminate. The metal skin includes debris deposited on the through-hole surface as the through hole is being formed by laser or mechanical drilling of a substrate that includes the laminate as an inner plane. Removing the metal skin combines electrochemical polishing (ECP) with ultrasonics. ECP dissolves the metal skin in an acid solution, while ultrasonics agitates and circulates the acid solution to sweep the metal skin out of the through hole. ECP is activated when a pulse power supply is turned on and generates a periodic voltage pulse from a pulse power supply whose positive terminal is coupled to the laminate and whose negative terminal is coupled to a conductive cathode. After the metal skin is removed, the laminate is differentially etched such that the copper is etched at a faster rate than the Invar. To prevent the differential etching, a copper layer is formed on a surface of the substrate with an electrical resistance R1 between the copper layer and the positive terminal of the pulse power supply. Additionally, an electrical resistance R2 is formed between the laminate and the positive terminal of the pulse power supply. Adjustment of R1 and R2 controls the relative etch rates of the copper and the Invar.
摘要翻译: 从铜 - 堇青铜(CIC)层压板的通孔表面去除金属表皮而不会引起层压板的不均匀回蚀的方法。 金属皮肤包括沉积在通孔表面上的碎屑,因为通孔是通过激光或机械钻孔形成的,所述基底包括层压体作为内平面。 去除金属皮肤结合电化学抛光(ECP)与超声波。 ECP将金属皮肤溶解在酸性溶液中,同时超声波搅拌并循环酸溶液以将金属皮肤从通孔中扫出。 当脉冲电源接通时,ECP被激活,并从脉冲电源产生周期性的电压脉冲,该脉冲电源的正极端子耦合到层压板并且其负极端子连接到导电阴极。 在去除金属表皮之后,层压体被差异蚀刻,使得以比Invar更快的速度蚀刻铜。 为了防止差分蚀刻,在衬底的表面上在铜层和脉冲电源的正端之间具有电阻R1形成铜层。 此外,在层压体和脉冲电源的正极端之间形成电阻R2。 R1和R2的调整控制铜和殷钢的相对蚀刻速率。
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公开(公告)号:US07635552B2
公开(公告)日:2009-12-22
申请号:US11492029
申请日:2006-07-25
CPC分类号: G03F7/06 , G03F7/164 , H05K3/0076 , H05K3/064 , Y10S430/106 , Y10S430/114 , Y10S430/127
摘要: A photoresist composition, e.g., a positive acting resist, for use in the formation of circuit patterns and the like on printed circuit boards and the like circuitized substrates, the photoresist composition including a quantity of silver therein in a sufficient amount to substantially prevent bacteria formation within said composition. A method of making the composition is also provided.
摘要翻译: 用于在印刷电路板等电路基板上形成电路图案等的光致抗蚀剂组合物,例如正性抗蚀剂,光致抗蚀剂组合物中含有足够量的银,以基本上防止细菌形成 在所述组合物内。 还提供了制备该组合物的方法。
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公开(公告)号:US4904506A
公开(公告)日:1990-02-27
申请号:US4399
申请日:1987-01-20
申请人: Peter A. Burnett , Dae Y. Jung , Ronald A. Kaschak , Roy H. Magnuson , Robert G. Rickert , Stephen L. Tisdale
发明人: Peter A. Burnett , Dae Y. Jung , Ronald A. Kaschak , Roy H. Magnuson , Robert G. Rickert , Stephen L. Tisdale
摘要: Copper is deposited onto a substrate by plating a first layer of copper onto the substrate from an electroless plating bath and plating a second layer of copper onto the first layer of copper from a second and different electroless plating bath. The first and second plating baths differ from each other in at least the cyanide content. The process reduces plating void defects and reduces nodule formation.
摘要翻译: 通过从无电解镀浴将铜的第一层镀到衬底上并将铜从第二和不同的化学镀浴镀到第一层铜上,从而将铜沉积到衬底上。 至少氰化物含量第一和第二电镀槽彼此不同。 该方法减少电镀空隙缺陷并减少结节形成。
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公开(公告)号:US4684545A
公开(公告)日:1987-08-04
申请号:US827427
申请日:1986-02-10
申请人: Edmond O. Fey , Peter Haselbauer , Dae Y. Jung , Ronald A. Kaschak , Hans-Dieter Kilthau , Roy H. Magnuson , Robert J. Wagner
发明人: Edmond O. Fey , Peter Haselbauer , Dae Y. Jung , Ronald A. Kaschak , Hans-Dieter Kilthau , Roy H. Magnuson , Robert J. Wagner
CPC分类号: C23C18/40 , C23C18/1617 , C23C18/1683 , H05K3/187
摘要: Nodule formation in a continuous electroless copper plating system is minimized by independently controlling the dissolved oxygen contents on the plating solution in the bath and in the associated external piping. The level of dissolved oxygen in the plating tank is maintained at a value such that satisfactory plating takes place. At the point where the plating solution leaves the tank, additional oxygen gas is introduced into the solution so that the level of dissolved oxygen in the plating solution in the external piping is high enough to prevent any plating from taking place in the external piping and so that in the external piping the copper is etched or dissolved back into solution. At the end of the external piping, the dissolved oxygen level is reduced so that the dissolved oxygen level of the plating solution in the tank is maintained at the level where plating will take place.
摘要翻译: 通过独立地控制浴中的镀液和相关的外部管道中的溶解氧含量,使连续化学镀铜系统中的结节形成最小化。 电镀槽中的溶解氧水平保持在这样的值,使得发生令人满意的电镀。 在电镀溶液离开槽的位置,将另外的氧气引入溶液中,使得外部管道中的电镀溶液中的溶解氧水平足够高,以防止在外部管道中发生任何电镀,因此 在外部管道中,铜被蚀刻或溶解回溶液中。 在外部管道的末端,溶解氧水平降低,使得罐中的电镀液的溶解氧水平保持在电镀的水平。
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