公开(公告)号：US20060125510A1

公开(公告)日：2006-06-15

申请号：US11290932

申请日：2005-11-29

Applicant: Matthias Brunner ,  Young Ko

Inventor： Matthias Brunner ,  Young Ko

IPC: G01R31/00

CPC classification number: G09G3/006 ,  G01R31/2853 ,  G01R31/302 ,  G09G3/3648

Abstract: A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more signal lines having the short, locating one or more defective pixels disposed between the two or more signal lines having the short, and identifying the defective pixels as the location of the short.

Abstract translation: 一种用于识别具有多个薄膜晶体管和与该薄膜晶体管相关联的多个像素的衬底上的两条或更多条信号线之间的短路位置的方法和装置。 该方法包括定位两条或更多条信号线，该信号线具有设置在具有短路的两条或多条信号线之间的一个或多个缺陷像素，并且识别缺陷像素作为短路的位置。

公开(公告)号：US20060076211A1

公开(公告)日：2006-04-13

申请号：US11241335

申请日：2005-09-30

Applicant: Matthias Brunner ,  Joachim Lindner

Inventor： Matthias Brunner ,  Joachim Lindner

IPC: F16D23/12

CPC classification number: F16D23/12 ,  F16D2023/141

Abstract: A clutch lever arrangement for a clutch, especially for a commercial motor vehicle clutch, having a clutch lever pivotably supported on a bearing point on a stationary component. The lever has a force-application section for introducing an actuating force by way of an actuating element and a force-transmission section for transmitting the actuating force to a clutch-release bearing, which is mounted with freedom to slide axially back and forth in the pivot plane of the clutch lever. To reduce undesirable vibrations of the clutch lever, the lever is guided in its pivot plane by a guide means.

Abstract translation: 一种用于离合器的离合器杆装置，特别是用于商用汽车离合器，其具有可枢转地支撑在固定部件上的支承点上的离合器杆。 杠杆具有用于通过致动元件引导致动力的力施加部分和用于将致动力传递到离合器释放轴承的力传递部分，该离合器释放轴承安装成可自由地沿轴向前后滑动 离合器杆的枢转平面。 为了减少离合器杆的不期望的振动，杠杆通过引导装置在其枢转平面中被引导。

公开(公告)号：US20050179452A1

公开(公告)日：2005-08-18

申请号：US10903216

申请日：2004-07-30

Applicant: Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

Inventor： Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

IPC: G01R31/302 ,  G01R31/26 ,  G01R31/305 ,  G02F1/13 ,  G09G3/00 ,  H01L21/687

CPC classification number: G01R1/07364 ,  G01R31/2893 ,  G01R31/305 ,  G09G3/006

Abstract: An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection mechanism that allows for ready relocation of the prober bar to the frame at selected points along the frame, and a plurality of electrical contact pins along the prober bar for placing selected electronic devices in electrical communication with a system controller during testing. In one embodiment, the prober is be used to test devices such as thin film transistors on a glass substrate. Typically, the glass substrate is square, and the frame is also square. In this way, “x” and “y” axes are defined by the frame. The electrical pins may be movable along the axial length of the prober bars, or may be selectively pushed down to contact selected contact pads on the substrate.

Abstract translation: 提供了一种用于电子设备测试系统的改进的探测器。 探测器是“可配置的”，这意味着它可以适用于不同的设备布局和基板尺寸。 探测器通常包括框架，至少一个具有第一端和第二端的探测杆，框架连接机构，其允许在沿着框架的选定点准备将探测杆重新定位到框架，以及多个电触点 沿着探测杆的引脚，用于在测试期间将选定的电子设备与系统控制器电连通。 在一个实施例中，探测器用于测试诸如玻璃基板上的薄膜晶体管的器件。 通常，玻璃基板是正方形的，框架也是正方形的。 以这种方式，“x”和“y”轴由框架定义。 电引脚可以沿着探针杆的轴向长度移动，或者可以选择性地向下推动以接触衬底上的所选择的接触垫。

公开(公告)号：US06845856B2

公开(公告)日：2005-01-25

申请号：US10449954

申请日：2003-05-30

Applicant: Herbert Voit ,  Matthias Brunner

Inventor： Herbert Voit ,  Matthias Brunner

IPC: F16D13/75 ,  F16D23/14

CPC classification number: F16D23/146 ,  F16D13/755

Abstract: A release mechanism for actuating a friction clutch is concentric to a center axis of a guide sleeve mounted in turn on a transmission shaft. The release mechanism includes a clutch release bearing and a device for compensating for the tilt of the center axis of the friction clutch with respect to the center axis of the guide sleeve and/or for the wobbling eccentricity of the release spring. The clutch release bearing includes an inner ring, an outer ring, and an adjusting sleeve. One of the inner ring or outer ring communicates with a release spring of the friction clutch. The device for compensating for the tilt of the center axis of the friction clutch with respect to the center axis of the guide sleeve and/or for the wobbling eccentricity of the release spring includes a release ring and a load ring. The release ring is in contact with a finger of the release spring of the friction clutch and includes a spherical surface having a center on the axis of the transmission shaft. A load ring cooperates with the spherical surface of the release ring and communicates with the adjusting sleeve for placing the one of the inner ring and outer ring in communication with the release spring. Preferably the release ring is curved and the load ring is a circular cross-sectioned wire to reduce wear.

Abstract translation: 用于致动摩擦离合器的释放机构与安装在传动轴上的引导套筒的中心轴线同心。 释放机构包括离合器分离轴承和用于补偿摩擦离合器的中心轴线相对于导向套筒的中心轴线的倾斜和/或用于释放弹簧的摆动偏心的装置。 离合器分离轴承包括内圈，外圈和调节套。 内环或外环中的一个与摩擦离合器的释放弹簧连通。 用于补偿摩擦离合器的中心轴线相对于导向套筒的中心轴线倾斜的装置和/或用于释放弹簧的摆动偏心的装置包括释放环和负载环。 释放环与摩擦离合器的释放弹簧的手指接触，并且包括在传动轴的轴线上具有中心的球面。 负载环与释放环的球面配合，并与调节套相连，用于将内圈和外圈中的一个与释放弹簧连通。 优选地，释放环是弯曲的，并且负载环是圆形横截面的线以减少磨损。

公开(公告)号：US5834773A

公开(公告)日：1998-11-10

申请号：US659337

申请日：1996-06-06

Applicant: Matthias Brunner ,  Hans-Peter Feuerbaum ,  Jurgen Frosien

Inventor： Matthias Brunner ,  Hans-Peter Feuerbaum ,  Jurgen Frosien

IPC: G01R31/26 ,  B81C99/00 ,  G01M11/00 ,  G01R31/302 ,  G01R31/305 ,  G09G3/00 ,  H01J9/42 ,  H01L21/66 ,  H01L29/66 ,  H01S5/00 ,  G01R31/265

CPC classification number: G09G3/006 ,  G01R31/305

Abstract: The invention relates to a method as well as to apparatus for testing the function of microstructure elements, wherein the microstructure element is driven for testing the emission and/or mechanical properties and the corpuscles emitted or reflected by it are detected and evaluated.

Abstract translation: 本发明涉及一种方法以及用于测试微结构元件功能的装置，其中驱动微结构元件以测试发射和/或机械性质，并且检测和评估由其发射或反射的小体。

公开(公告)号：US5371459A

公开(公告)日：1994-12-06

申请号：US123261

申请日：1993-09-20

Applicant: Matthias Brunner ,  Reinhold Schmitt

Inventor： Matthias Brunner ,  Reinhold Schmitt

IPC: G01R31/02 ,  G01R31/302 ,  G01R31/305 ,  G01R31/308 ,  G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09F9/35 ,  G09G3/18 ,  G01R31/00

CPC classification number: G01R31/305 ,  G01R31/302 ,  G01R31/308 ,  G02F2001/136254

Abstract: Method for particle beam testing of substrates for liquid crystal displays (LCD). This is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.

Abstract translation: 液晶显示器（LCD）基板的粒子束测试方法。 这涉及以下方法：其中，给定用于液晶显示器的衬底（SUB1），电势或电流分别以粒子束（S1，S2和S4）的形式设定，和/或电位通过检测 在基板（SUB1）的开关元件（T）的不同开关状态下的二次电子（S5）。 因此，即使例如辅助平面电极不存在用于形成电容器，也可以测试基板（SUB1）的几何完整性和电功能性。 该方法的一个重要优点是，即使在进一步处理之前，有缺陷的基板可以被修复或者可以被分离，因此可以降低成本。

公开(公告)号：US4748407A

公开(公告)日：1988-05-31

申请号：US16696

申请日：1987-01-28

Applicant: Matthias Brunner ,  Reinhold Schmitt ,  Dieter Winkler

Inventor： Matthias Brunner ,  Reinhold Schmitt ,  Dieter Winkler

IPC: H01L21/66 ,  G01N23/225 ,  G01Q30/02 ,  G01R31/26 ,  G01R31/302 ,  G01R31/305 ,  H01J37/28 ,  H01J49/44 ,  G01R31/28

CPC classification number: G01R31/305

Abstract: To measure high frequency signal curves at nodes and interconnections of integrated circuits and achieve a good chronological resolution in accordance with the sampling method, extremely short primary electron pulses are used. For such extremely short pulse widths obtainable with beam blanking systems, only individual statistically appearing secondary electrons are registered per pulse, these electrons generating current pulses having different amplitudes and different time behaviors at the output of an energy analyzer. It is proposed that the number of current pulses occurring at the output of the energy analyzer within a prescribed time interval be identified and the quotient, or ratio, thereof, be kept constant with the assistance of a feedback circuit for connection to the voltage of a retarding field electrode. The feedback circuit includes a pulse counter, a digital-to-analog converter, and a spectrometer drive.

Abstract translation: 为了测量集成电路的节点和互连的高频信号曲线，并根据采样方法实现良好的时间分辨率，使用极短的一次电子脉冲。 对于通过光束消隐系统可获得的这种极短的脉冲宽度，每个脉冲仅记录每个统计学显示的二次电子，这些电子在能量分析仪的输出处产生具有不同幅度和不同时间行为的电流脉冲。 提出在规定的时间间隔内在能量分析器的输出处出现的电流脉冲数被识别，并且在一个反馈电路的辅助下，商或其比率被保持恒定，以连接到 延迟场电极。 反馈电路包括脉冲计数器，数模转换器和光谱仪驱动器。

公开(公告)号：US20160369303A1

公开(公告)日：2016-12-22

申请号：US14901585

申请日：2014-06-27

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: C12P5/02 ,  C12M1/00 ,  C12M1/06 ,  C12M1/107

CPC classification number: C12P5/023 ,  C12M21/04 ,  C12M23/58 ,  C12M25/14 ,  C12M27/02 ,  C12M29/06 ,  C12M29/24 ,  Y02E50/343

Abstract: The invention relates to means and methods for the biomethanation of H2 and CO2. In particular, the invention relates to devices for producing methane by means of methanogenic microorganisms by converting H2 and CO2, wherein the devices comprise at least one reactor, an aqueous medium, which is provided in the at least one reactor, wherein the methanogenic microorganisms are contained in the aqueous medium, a feeding apparatus, which is designed to introduce H2 and CO2 into the at least one reactor, wherein H2 and CO2 form a gaseous mixture therein, and a reaction-increasing device, which is designed to enlarge the contact surface between the aqueous medium having the methanogenic microorganisms and the gaseous mixture. The invention further relates to methods for producing methane in a reactor device by means of methanogenic microorganisms.

Abstract translation: 本发明涉及H2和CO2的生物降解的方法和方法。 特别地，本发明涉及通过转化H 2和CO 2通过产甲烷微生物生产甲烷的装置，其中装置包括至少一个反应器，在至少一个反应器中提供的水性介质，其中产甲烷微生物是 包含在水性介质中的进料装置，其被设计成将H 2和CO 2引入到至少一个反应器中，其中H 2和CO 2在其中形成气态混合物;以及反应增加装置，其被设计成扩大接触表面 在具有产甲烷微生物的水性介质和气体混合物之间。 本发明还涉及通过产甲烷微生物在反应器装置中生产甲烷的方法。

公开(公告)号：US09366696B2

公开(公告)日：2016-06-14

申请号：US14352043

申请日：2011-10-19

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: G01R31/20 ,  G01R1/02 ,  G09G3/00 ,  G01R31/01

CPC classification number: G01R1/02 ,  G01R31/01 ,  G09G3/006

Abstract: An apparatus for testing of a plurality of electronic devices on a flexible substrate is described. The apparatus includes at least two rollers configured for guiding the flexible substrate into a testing area along transport direction, at least one prober configured for electrically contacting one or more of the electronic devices, at least one probing support configured for supporting a portion of the flexible substrate during electrical contact with the at least one prober, and a test device for functional testing of one or more of the electronic devices.

Abstract translation: 描述了一种用于在柔性基板上测试多个电子装置的装置。 所述设备包括至少两个辊，所述至少两个辊构造成用于将柔性基板沿传送方向引导到测试区域中，至少一个构造成用于电接触一个或多个电子设备的探测器，至少一个探测支撑件， 与所述至少一个探测器电接触的基板，以及用于一个或多个所述电子设备的功能测试的测试装置。

公开(公告)号：US20120113559A1

公开(公告)日：2012-05-10

申请号：US13288743

申请日：2011-11-03

Applicant: Hung T. Nguyen ,  George Tzeng ,  Daniel I. Handjojo ,  Paul Bocian ,  Matthias Brunner ,  Bernhard G. Mueller

Inventor： Hung T. Nguyen ,  George Tzeng ,  Daniel I. Handjojo ,  Paul Bocian ,  Matthias Brunner ,  Bernhard G. Mueller

IPC: H05F3/00

CPC classification number: H01L21/67748 ,  H01L21/6831 ,  H01L22/14 ,  H01L2924/0002 ,  H01L2924/00

Abstract: Embodiments of the invention relate to methods and apparatus for minimizing electrostatic discharge in processing and testing systems utilizing large area substrates in the production of flat panel displays, solar panels, and the like. In one embodiment, an apparatus is described. The apparatus includes a testing chamber, a substrate support disposed in the testing chamber, the substrate support having a substrate support surface, a structure disposed in the testing chamber, the structure having a length that spans a width of the substrate support surface, the structure being linearly movable relative to the substrate support, and a brush device having a plurality of conductive bristles coupled to the structure and spaced a distance away from the substrate support surface of the substrate support, the brush device electrically coupling the support surface to ground through the structure.

Abstract translation: 本发明的实施例涉及在平板显示器，太阳能电池板等的生产中利用大面积基板的处理和测试系统中的静电放电最小化的方法和装置。 在一个实施例中，描述了一种装置。 该装置包括测试室，设置在测试室中的衬底支撑件，衬底支撑件具有衬底支撑表面，设置在测试室中的结构，该结构具有跨过衬底支撑表面的宽度的长度，该结构 相对于衬底支撑件可线性移动;以及刷子装置，其具有耦合到该结构并且离开衬底支撑件的衬底支撑表面间隔一定距离的多个导电刷毛，刷装置通过 结构体。