公开(公告)号：US09441948B2

公开(公告)日：2016-09-13

申请号：US11502330

申请日：2006-08-09

Applicant: Benjamin J. Vakoc ,  Seok-Hyun Yun ,  Guillermo J. Tearney ,  Brett Eugene Bouma

Inventor： Benjamin J. Vakoc ,  Seok-Hyun Yun ,  Guillermo J. Tearney ,  Brett Eugene Bouma

IPC: G01B9/02 ,  G01N21/21 ,  G01N21/47 ,  A61B5/00 ,  G01J3/45 ,  G01J9/02 ,  G01N21/27

CPC classification number: G01B9/02044 ,  A61B5/0059 ,  A61B5/0066 ,  G01B9/02004 ,  G01B9/02072 ,  G01B9/02081 ,  G01B9/02091 ,  G01B2290/45 ,  G01B2290/70 ,  G01J3/45 ,  G01J2009/0265 ,  G01N21/21 ,  G01N21/274 ,  G01N21/4795

Abstract: Apparatus, method and storage medium which can provide at least one first electro-magnetic radiation to a sample and at least one second electromagnetic radiation to a reference, such that the first and/or second electromagnetic radiations have a spectrum which changes over time. In addition, a first polarization component of at least one third radiation associated with the first radiation can be combined with a second polarization component of at least one fourth radiation associated with the second radiation with one another. The first and second polarizations may be specifically controlled to be at least approximately orthogonal to one another.

Abstract translation: 可以向样品提供至少一个第一电磁辐射和至少一个第二电磁辐射至参考物的装置，方法和存储介质，使得第一和/或第二电磁辐射具有随时间变化的光谱。 此外，与第一辐射相关联的至少一个第三辐射的第一偏振分量可以与与第二辐射相关联的至少一个第四辐射的第二偏振分量彼此组合。 可以将第一和第二偏振特别地控制为至少大致彼此正交。

公开(公告)号：US09429474B2

公开(公告)日：2016-08-30

申请号：US14047681

申请日：2013-10-07

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Diaa A. M. Khalil ,  Bassam A. Saadany

IPC: G01J3/45 ,  G01J3/02 ,  G01J3/26 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/0218 ,  G01J3/0256 ,  G01J3/26 ,  G01J3/4535 ,  G01J2003/4538

Abstract: A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.

Abstract translation: 具有改进的分辨率的光谱仪包括频谱调制器，其在频谱域中具有周期性响应以调制宽带源频谱并导致干涉图中的一个或多个移位的脉冲串。

公开(公告)号：US20160245698A1

公开(公告)日：2016-08-25

申请号：US15027501

申请日：2014-10-16

Applicant: THE ARIZONA BOARD OF REGENTS on behalf of THE UNIVERSITY OF ARIZONA

Inventor： Stanley Pau ,  Amit Ashok

IPC: G01J3/28 ,  G01J3/36 ,  G01J3/45

CPC classification number: G01J3/2823 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/45 ,  G01J3/513 ,  G01J2003/2806 ,  G01J2003/2826

Abstract: Multispectral imaging systems are disclosed. An exemplary multispectral imager includes a narrow-band absorptive filter array and a sensor array comprising a plurality of pixels. The narrow-band absorptive filter array has a plurality of filter elements, each filter element being associated with a pixel of the sensor array. The filter elements are organized into groups of N filter elements, where N is greater than three. Each filter element absorbs one narrow band and transmits N−1 narrow bands. The group of N filter elements absorbs all N narrow bands.

Abstract translation: 公开了多光谱成像系统。 示例性的多光谱成像器包括窄带吸收滤光器阵列和包括多个像素的传感器阵列。 窄带吸收滤光器阵列具有多个滤光元件，每个滤光元件与传感器阵列的像素相关联。 滤波器元件被组织成N个滤波器元件的组，其中N大于3。 每个滤光元件吸收一个窄带并传输N-1个窄带。 N个滤光元件组吸收所有N个窄带。

公开(公告)号：US20160245696A1

公开(公告)日：2016-08-25

申请号：US15031780

申请日：2014-10-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Katsumi SHIBAYAMA ,  Takashi KASAHARA ,  Masaki HIROSE ,  Toshimitsu KAWAI

IPC: G01J3/26 ,  G01J3/45

CPC classification number: G01J3/26 ,  G01J3/0286 ,  G01J3/45 ,  G01J5/04 ,  G01J5/20 ,  G02B26/001

Abstract: A spectral sensor 1A includes a Fabry-Perot interference filter 10 which has a light transmission region 11; a light detector 3 which detects light having transmitted the light transmission region 11; spacers 4A and 4B which support the Fabry-Perot interference filter 10 in a surrounding region of the light transmission region 11; and a die bond resin 5 which adheres the Fabry-Perot interference filter 10 and the spacers 4A and 4B to each other. The die bond resin 5 has one opening A2 communicating with an inner side of the surrounding region and an outer side of the surrounding region, when viewed from a light transmission direction in the light transmission region 11.

Abstract translation: 光谱传感器1A包括具有透光区域11的法布里 - 珀罗干涉滤光器10; 光检测器3，其检测透射光透射区域11的光; 在光透射区域11的周围区域中支撑法布里 - 珀罗干涉滤光器10的间隔件4A和4B; 以及将法布里 - 珀罗干涉滤光器10和隔离物4A和4B彼此粘合的芯片接合树脂5。 当在光透射区域11中从透光方向观察时，裸片接合树脂5具有与周围区域的内侧连通的一个开口A2和周围区域的外侧。

公开(公告)号：US09395173B2

公开(公告)日：2016-07-19

申请号：US14521440

申请日：2014-10-22

Applicant: NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： Ming-Hsing Shen ,  Wei-Chung Wang ,  Chi-Hung Huang ,  Jyh-Rou Sze ,  Chun-Li Chang

IPC: G01B9/02 ,  G01J3/45 ,  G01J3/447

CPC classification number: G01B9/02042 ,  G01B9/02044 ,  G01B9/0209 ,  G01J3/447 ,  G01J3/45 ,  G02B21/0024

Abstract: The conventional white-light interferometer, confocal microscope, and ellipsometer are integrated as one device set in a functional sense, and the geometrical parameters conventionally measured may be deduced on the integrated device. Thus, the advantages and efficacies of equipment cost saving, on-line measuring, rapid monitoring, reduced manufacturing time, and reduced possibility of object damage during the manufacturing process may be secured, compared with the prior art.

Abstract translation: 传统的白光干涉仪，共聚焦显微镜和椭偏仪被集成为功能意义上的一个装置，并且可以在集成装置上推导传统测量的几何参数。 因此，与现有技术相比，可以确保设备成本节省，在线测量，快速监测，缩短制造时间以及减少制造过程中物体损坏可能性的优点和功效。

公开(公告)号：US09389161B2

公开(公告)日：2016-07-12

申请号：US14639258

申请日：2015-03-05

Applicant: ExxonMobil Chemical Patents Inc.

Inventor： Jay L. Reimers

IPC: G01N21/35 ,  G01J3/44 ,  G01J3/45 ,  G01N15/02

CPC classification number: G01N15/0205 ,  G01J3/45 ,  G01N21/35

Abstract: This invention relates to a method for the determination of the average particle size or particle size distribution of a material in a gas phase reactor comprising: 1) analyzing the average particle size and particle size distribution of a baseline composition using the method described in ASTM D1921; 2) analyzing the average particle size and particle size distribution of said baseline composition using an FT-NIR analysis technique; 3) preparing a calibration matrix by comparing results from said reference analytical technique to the results from said FT-NIR analysis technique; 4) analyzing the material using an FT-NIR technique; and 5) identifying and quantifying the type and content of particles present in the material by comparing spectral data obtained from said FT-NIR technique of the material to said calibration matrix.This invention also relates to a process for determining polymer properties in a polymerization reactor system using such techniques.

Abstract translation: 本发明涉及用于确定气相反应器中材料的平均粒度或粒度分布的方法，包括：1）使用ASTM D1921中描述的方法分析基准组合物的平均粒度和粒度分布 ; 2）使用FT-NIR分析技术分析所述基线组合物的平均粒度和粒度分布; 3）通过比较所述参考分析技术的结果与所述FT-NIR分析技术的结果来制备校准矩阵; 4）使用FT-NIR技术分析材料; 以及5）通过将从所述材料的所述FT-NIR技术获得的光谱数据与所述校准矩阵进行比较来识别和定量存在于所述材料中的颗粒的类型和含量。 本发明还涉及使用这种技术在聚合反应器系统中测定聚合物性质的方法。

公开(公告)号：US09383258B2

公开(公告)日：2016-07-05

申请号：US14702470

申请日：2015-05-01

Applicant: VERIFOOD, LTD.

Inventor： Damian Goldring ,  Dror Sharon ,  Guy Brodetzki ,  Amit Ruf ,  Menahem Kaplan ,  Sagee Rosen ,  Omer Keilaf ,  Uri Kinrot ,  Kai Engelhardt ,  Ittai Nir

IPC: G01J3/28 ,  G01J3/10 ,  G01J3/45

CPC classification number: G01J3/108 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/12 ,  G01J3/26 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/45 ,  G01J5/0265 ,  G01J5/10 ,  G01J2003/1226 ,  G01J2003/123 ,  G01J2003/1239 ,  G01N21/255 ,  G01N33/02

Abstract: A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.

Abstract translation: 光谱仪包括多个隔离光通道，其包括多个隔离光路。 孤立的光路减少光路之间的串扰，并允许光谱仪具有降低的分辨率的长度。 在许多实施例中，隔离的光路包括隔离的平行光路，其允许基本上减小器件的长度。 在许多实施例中，每个隔离的光路从滤光器阵列的滤光片延伸穿过透镜阵列的透镜，通过支撑阵列的通道延伸到传感器阵列的区域。 传感器阵列的每个区域包括多个传感器元件，其中传感器元件的位置基于在该位置处接收的光的角度接收的光的波长，透镜的焦距和透镜的中心波长 过滤。

公开(公告)号：US09335213B2

公开(公告)日：2016-05-10

申请号：US14417968

申请日：2013-08-01

Applicant: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE

Inventor： Gargi Sharma ,  Kanwarpal Singh ,  Roberto Morandotti ,  Tsuneyuki Ozaki

IPC: G01J3/45 ,  G01J11/00 ,  G01J3/10 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/108 ,  G01J3/453 ,  G01J11/00

Abstract: A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (π/2).

Abstract translation: 一种基于频域干涉测量的方法和系统，用于检测强烈的THz电场，允许使用厚晶体进行光谱目的，以便对增加的光谱分辨率进行长时间扫描，并克服当前可用高度的过度旋转的限制 功率太赫兹源。 使用这种方法和系统，相位差约为8898＆pgr; 可以测量，比通过电光采样（＆pgr / 2）测量的相位差高18000倍。

公开(公告)号：US20160123870A1

公开(公告)日：2016-05-05

申请号：US14895946

申请日：2013-06-04

Applicant: FOSS ANALYTICAL A/S

Inventor： Per Waaben HANSEN

IPC: G01N21/35 ,  G01N21/27

CPC classification number: G01N21/35 ,  G01J3/0291 ,  G01J3/42 ,  G01J3/45 ,  G01N21/274 ,  G01N2021/3595 ,  G01N2201/061 ,  G01N2201/12746

Abstract: A method of determining a pathlength deviation of a sample (610), the method comprising: exposing the sample (610) to electromagnetic radiation at a plurality of wavenumbers, determining electromagnetic absorption in the sample (610) at the plurality of wavenumbers, determining a first wavenumber associated with a first absorption level of an absorption band and a second wavenumber associated with a second absorption level of the absorption band, wherein the second wavenumber is different from the first wavenumber, determining a difference between the first wavenumber and the second wavenumber, and determining the pathlength deviation based on the difference.

Abstract translation: 一种确定样品（610）的路径长度偏差的方法，所述方法包括：将样品（610）暴露于多个波数处的电磁辐射，确定多个波数处的样品（610）中的电磁吸收，确定 第一波数与吸收带的第一吸收水平和与吸收带的第二吸收水平相关联的第二波数相关联，其中第二波数不同于第一波数，确定第一波数和第二波数之间的差， 以及基于所述差异确定所述路径长度偏差。

公开(公告)号：US20160123808A1

公开(公告)日：2016-05-05

申请号：US14527796

申请日：2014-10-30

Applicant: Infineon Technologies AG

Inventor： Christian Obermueller

IPC: G01J3/02 ,  G01J3/45

CPC classification number: G01J3/0259 ,  G01J3/0227 ,  G01J3/26 ,  G01J3/45 ,  G02B13/001 ,  G02B26/001

Abstract: In various embodiments a spectrometer is provided. The spectrometer may include a first mirror unit which is semitransparent for electromagnetic radiation of at least one wavelength or wavelength range; and a second minor unit having a first area and a second area facing the first minor unit, wherein at least a part of the first area and the second area are spaced apart from the first minor unit, wherein the first area is at least partially reflective for the electromagnetic radiation of at least one wavelength or wavelength range, wherein the second area includes at least a part of a photodetector, and wherein the photodetector is configured to detect the electromagnetic radiation of at least one wavelength or wavelength range.

Abstract translation: 在各种实施例中，提供了光谱仪。 光谱仪可以包括对于至少一个波长或波长范围的电磁辐射是半透明的第一反射镜单元; 以及具有面向所述第一次要单元的第一区域和第二区域的第二次要单元，其中所述第一区域和所述第二区域的至少一部分与所述第一次要单元间隔开，其中所述第一区域至少部分地是反射的 对于至少一个波长或波长范围的电磁辐射，其中所述第二区域包括光电检测器的至少一部分，并且其中所述光电检测器被配置为检测至少一个波长或波长范围的电磁辐射。