摘要:
The invention provides a light irradiation apparatus that can adjust widening/narrowing of a light irradiation area and can guide almost whole of light emitted from an LED to the light irradiation area.The apparatus has an LED 11 and an optical unit 2 for making light for the LED 11 pass through itself and emit from its apical surface 21, and is equipped further with a supporting body 1A for holding the LED on the apical surface and a position adjustment mechanism for adjusting a relative position of the optical unit 2 to the LED 11 along an optical axis C direction. The apparatus is configured so that the potion adjustment mechanism make the optical unit 2 move relative to the LED 11 between a proximity position P1 at which a part or the whole of the supporting body 1A is housed in a base end recess 25 and a clearance position P2 at which substantially whole of the supporting body 1A comes out of the base end recess 25 so that the apical surface of the supporting body 1A and a base end face 22 of the optical unit 2 become substantially the same height.
摘要:
The light irradiation device is for inspecting a surface of an object W such as a product by irradiating the light on the object W, and has an arrangement wherein multiple microscopic EL elements 2, each of which comprises a transparent electrode layer 22 arranged at an object side, a non-transparent electrode layer 23 arranged at an opposite side to the object W and a luminous layer 21 that is arranged between the transparent electrode layer 22 and the non-transparent electrode layer 23 and that emits the light by imparting voltage, are laid out with a space S provided between each other, thereby further promoting more even illumination, downsizing and weight saving.
摘要:
The light irradiation device of this invention intends to further facilitate an assembling procedure and to stabilize the quality as a product.The light irradiation device comprises an LED 5, an optical unit 4 that makes an engagement with the LED 5 with their axial lines aligned with each other, a tubular first housing element 2 having an opening D at its rear end surface for inserting the optical unit 4 and the LED 5 into the inside of the first housing element 2, a deciduous inhibition member R that makes an engagement with a vicinity of the opening D of the first housing element 2 and that prevents the optical unit 4 that has been inserted into the first housing element 2 from dropping off, a second housing element 3 that blocks up the opening D by being mounted on a predetermined position of the first housing element 2 and that forms a housing CS together with the first housing element 2, and a projecting member 10 that is arranged on the second housing element 3 to project forward, and at the predetermined position, the projecting member 10 presses the rear surface of the LED 5 to engage the optical unit 4 and the LED 5, thereby to align their axial lines.
摘要:
In an insulating film formation method, a cycle A in which O3 at a low flow rate is supplied onto a substrate and then O3 supplied is allowed to react with Hf on the substrate in a non-equilibrium state to form a hafnium oxide film is carried out M times (M≧1), and a cycle B in which O3 at a high flow rate is supplied onto the substrate and then O3 supplied is allowed to react with Hf on the substrate in an equilibrium state to form a hafnium oxide film is carried out N times (N≧1). These insulating film formation cycles are defined as one sequence. This sequence is repeated until a desired thickness is obtained, thereby forming a target insulating film.
摘要:
A method for fabricating a semiconductor device includes the steps of: forming a semiconductor region of a first conductive type on a semiconductor wafer; forming a gate electrode on the semiconductor region; on the semiconductor region, forming a first insulating film over the whole surface including the upper surface of the gate electrode; by removing the formed first insulating film through etching from the top surface side, forming first sidewalls, covering the side surfaces of the gate electrode, from the first insulating film; and by implanting first impurity ions of a second conductive type to the semiconductor region by using an ion implantation device capable of processing a plurality of semiconductor wafers collectively, forming first impurity diffusion regions on both sides of the gate electrode in the semiconductor region. In the step of forming the first impurity diffusion regions, implantation of the first impurity ions are dividedly performed a plurality of times, and the semiconductor wafer is rotated in its wafer surface for each ion implantation.
摘要:
A semiconductor device includes a gate insulating film formed on a semiconductor substrate, and a gate electrode formed on the gate insulating film. Nitrogen is introduced into the gate insulating film, and the nitrogen concentration distribution thereof has a peak near the surface of the gate insulating film or near the center of the gate insulating film in the thickness direction. The peak value of nitrogen concentration in the gate insulating film is equal to or greater than 10 atm % and less than or equal to 40 atm %.
摘要:
An elevator group control system is provided which stably keeps cage's position in temporally equal interval condition over a long period of time. The present invention provides a system comprising: reference route generating means, which for each elevator, generates a reference route which the elevator should follow with respect to the time axis and position axis; and assignment means which selects an elevator for assignment to a generated hall call so as to make the actual trajectory of each elevator closer to its reference route. Since reference routes which guides the cage's trajectory into temporally equal interval condition are generated and car assignment is executed so as to make the respective cages follow their reference routes, it is possible to allow the cages to settle in temporally equal interval condition over a long period of time.
摘要:
Impurity ions are implanted into a semiconductor wafer of which a capacitor insulting film is formed on a principal face. In this impurity ion implantation step, the impurity ions are implanted into the semiconductor wafer in the form of a pulsed beam that repeats ON-OFF operation intermittently.
摘要:
Alight emitting diode unit comprises a light emitting element D1, a base 1 having a heat dissipating member 12 that dissipates heat generated by the light emitting element D1, and a first lens 2 comprising a reflecting element 214 that reflects light R2 traveling outside of a predetermined angle among the emitted light R emitted by the light emitting element D1 and a refracting element F that refracts light R1 traveling inside of the predetermined angle among the emitted light R, each of which is formed integrally, with the first lens 2 mounted integrally on the base 1, and the emitted light R emitted from the light emitting element D1 is made to travel generally toward the same direction by the reflecting element 214 and the refracting element F.
摘要:
A control device for controlling a continuously variable transmission (5) is disclosed. The control device has an oil pressure control unit (100) which supplies an oil pressure to a primary pulley (10) and secondary pulley (11) based on a command signal indicative of a target speed-reduction ratio, a sensor (26) which detects a rotation speed (Np1) of the primary pulley (26), and a controller (20) which transmits the command signal indicative of the target speed-reduction ratio to the oil pressure control unit (100). The controller is programmed to set the target speed-reduction ratio to a first speed-reduction ratio (R1); calculate a first predetermined rotation speed (N1) of the primary pulley at which the V-belt reaches a first limiting temperature (T1) at the first speed-reduction ratio (R1); calculate a first elapsed time after the detected rotation speed (Np1) of the primary pulley exceeds the first predetermined rotation speed (N1); maintain the first speed-reduction ratio (R1) when the first elapsed time is equal to or less than a first predetermined time; and set the target speed-reduction ratio to a second speed-reduction ratio (R2) smaller than the first speed-reduction ratio (R1) when the first elapsed time exceeds the first predetermined time. At the second speed-reduction ratio (R2), the temperature of the V-belt should become equal to or less than the first limiting temperature (T1) throughout the permitted rotation speed region of the primary pulley. Thus, starting acceleration performance of the continuously variable transmission is enhanced.