REDUCING CONTACT RESISTANCE IN P-TYPE FIELD EFFECT TRANSISTORS
    45.
    发明申请
    REDUCING CONTACT RESISTANCE IN P-TYPE FIELD EFFECT TRANSISTORS 审中-公开
    降低P型场效应晶体管的接触电阻

    公开(公告)号:US20090140301A1

    公开(公告)日:2009-06-04

    申请号:US11947157

    申请日:2007-11-29

    IPC分类号: H01L29/94 H01L21/336

    摘要: Reducing contact resistance in p-type field effect transistors is generally described. In one example, an apparatus includes a first semiconductor substrate, a first noble metal film including palladium (Pd) coupled with the first semiconductor substrate, a second noble metal film including platinum (Pt) coupled with the first noble metal film, and a third metal film including an electrically conductive metal coupled with the second noble metal film, wherein the first, second, and third metal films form one or more contacts having reduced specific contact resistance between the first semiconductor substrate and the one or more contacts.

    摘要翻译: 通常描述在p型场效应晶体管中降低接触电阻。 在一个实例中,一种装置包括第一半导体衬底,包括与第一半导体衬底耦合的钯(Pd)的第一贵金属膜,包含与第一贵金属膜耦合的铂(Pt)的第二贵金属膜,以及第三贵金属膜 金属膜包括与第二贵金属膜耦合的导电金属,其中第一,第二和第三金属膜形成一个或多个具有降低的第一半导体衬底和一个或多个触点之间的比接触电阻的触点。