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公开(公告)号:US10134461B2
公开(公告)日:2018-11-20
申请号:US14707893
申请日:2015-05-08
Applicant: Micron Technology, Inc.
Inventor: Debra M. Bell , Jeff A. McClain , Brian P. Callaway
IPC: G11C11/406 , G11C7/10
Abstract: Apparatuses and methods for selective row refreshes are disclosed herein. An example apparatus may include a refresh control circuit. The refresh control circuit may be configured to receive a target address associated with a target plurality of memory cells from an address bus. The refresh control circuit may further be configured to provide a proximate address to the address bus responsive, at least in part, to determining that a number of refresh operations have occurred. In some examples, a plurality of memory cells associated with the proximate address may be a plurality of memory cells adjacent the target plurality of memory cells.
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公开(公告)号:US10037785B2
公开(公告)日:2018-07-31
申请号:US15205885
申请日:2016-07-08
Applicant: Micron Technology, Inc.
Inventor: Joshua E. Alzheimer , Debra M. Bell
CPC classification number: G11C7/06 , G11C7/065 , G11C7/1006 , G11C7/22 , G11C11/4076 , G11C11/4091
Abstract: Examples include apparatuses and methods related to scan chain operation in sensing circuitry. A number of embodiments include an apparatus comprising an array of memory cells coupled to sensing circuitry having a sense amplifier and a compute component, the sensing circuitry to receive a scan vector and perform a scan chain operation on the scan vector.
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43.
公开(公告)号:US08913448B2
公开(公告)日:2014-12-16
申请号:US13660768
申请日:2012-10-25
Applicant: Micron Technology, Inc.
Inventor: Robert Tamlyn , Debra M. Bell , Michael Roth , Eric A. Becker , Tyrel Z. Jensen
IPC: G11C7/00
CPC classification number: G11C29/028 , G11C7/1066 , G11C7/109 , G11C7/1093 , G11C7/222 , G11C29/022 , G11C29/023 , G11C2207/105
Abstract: Apparatuses and methods for capturing data in a memory are disclosed herein. An apparatus may include a command path and a data capture logic. The command path may be configured to receive a command signal and to delay the command signal with a delay based, at least in part, on a plurality of propagation delays. The data capture logic may be coupled to the command path and configured to receive the delayed command signal and a data strobe signal. The data capture logic may further be configured to capture data according to the data strobe signal responsive, at least in part, to receipt of the delayed command signal.
Abstract translation: 本文公开了用于在存储器中捕获数据的装置和方法。 装置可以包括命令路径和数据捕获逻辑。 命令路径可以被配置为接收命令信号并且至少部分地基于多个传播延迟延迟基于延迟的命令信号。 数据捕获逻辑可以耦合到命令路径并且被配置为接收延迟的命令信号和数据选通信号。 数据采集逻辑还可以被配置为至少部分地响应于接收延迟的命令信号而根据数据选通信号捕获数据。
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公开(公告)号:US11676052B2
公开(公告)日:2023-06-13
申请号:US16849819
申请日:2020-04-15
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Debra M. Bell , James S. Rehmeyer , Brett K. Dodds , Anthony D. Veches , Libo Wang , Di Wu
Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods for an internet of things (IoT) system to include edge devices that perform at least some functions without communicating with a cloud computing system. An edge device may include a memory with on-memory pattern matching capabilities. The edge device may perform pattern matching operations on data collected by the edge device or sensors in communication with the edge device. Based on results of the pattern matching operations, the edge device may perform various functions, such as transmitting data to the cloud computing system, activating an alarm, and/or changing a frequency at which data is transmitted.
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公开(公告)号:US11664084B2
公开(公告)日:2023-05-30
申请号:US17391830
申请日:2021-08-02
Applicant: Micron Technology, Inc.
Inventor: Anthony D. Veches , Randall J. Rooney , Debra M. Bell
CPC classification number: G11C29/42 , G06F11/0754 , G06F11/106 , G11C29/14 , G11C29/18 , G11C29/4401
Abstract: Methods, devices, and systems related to memory device on-die ECC data are described. In an example, a scrub operation can be performed on data in order to determine which rows of memory cells in an array include a particular number of errors. The particular number of errors can be a number of errors that exceed a threshold number of errors. An address of the determined rows with the particular number of errors can be stored in memory cells of the array for later access. The address of the determined rows can be accessed to perform a user-initiated repair operation, a self-repair operation, a refresh operation, and/or to alter timing of access of the cells or alter voltage of the cells.
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公开(公告)号:US20230031842A1
公开(公告)日:2023-02-02
申请号:US17391830
申请日:2021-08-02
Applicant: Micron Technology, Inc.
Inventor: Anthony D. Veches , Randall J. Rooney , Debra M. Bell
Abstract: Methods, devices, and systems related to memory device on-die ECC data are described. In an example, a scrub operation can be performed on data in order to determine which rows of memory cells in an array include a particular number of errors. The particular number of errors can be a number of errors that exceed a threshold number of errors. An address of the determined rows with the particular number of errors can be stored in memory cells of the array for later access. The address of the determined rows can be accessed to perform a user-initiated repair operation, a self-repair operation, a refresh operation, and/or to alter timing of access of the cells or alter voltage of the cells.
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公开(公告)号:US20230029003A1
公开(公告)日:2023-01-26
申请号:US17949836
申请日:2022-09-21
Applicant: Micron Technology, Inc.
Inventor: Vaughn N. Johnson , Debra M. Bell , Miles S. Wiscombe , Brian T. Pecha , Kyle Alexander
IPC: G11C11/406 , G11C11/408 , G11C11/4076
Abstract: Memory devices and systems with programmable refresh order and stagger times are disclosed herein. In one embodiment, a memory device includes a first memory bank group and a second memory bank group. The memory device is configured, in response to a refresh command, to perform a first refresh operation on the first memory bank group at a first time and a second refresh operation on the second memory bank group at a second time after the first time. The memory device is further configured to perform, in response to a read or write command, a read or write operation on the first memory bank group, the second memory bank group, or both the first and second memory bank groups after beginning the first refresh operation and before completing the second refresh operation.
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公开(公告)号:US20220404892A1
公开(公告)日:2022-12-22
申请号:US17892629
申请日:2022-08-22
Applicant: Micron Technology, Inc.
Inventor: Debra M. Bell , Roya Baghi , Erica M. Gove , Zahra Hosseinimakarem , Cheryl M. O'Donnell
IPC: G06F1/3234 , G11C16/26 , G11C11/56
Abstract: Systems, apparatuses, and methods related to using memory device sensors are described. Some memory system or device types include sensors embedded in their circuitry. For instance, a device can be coupled to a memory device with an embedded sensor. The memory device can transmit the data generated by the embedded sensor using a sensor output coupled to the device. The memory device may generate, based at least in part on a characteristic of a memory device, a signal from a sensor embedded in the memory device and transmit the signal generated by the sensor from the memory device to another device coupled to the memory device.
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公开(公告)号:US11532358B2
公开(公告)日:2022-12-20
申请号:US16553821
申请日:2019-08-28
Applicant: Micron Technology, Inc.
Inventor: Anthony D. Veches , Debra M. Bell , James S. Rehmeyer , Robert Bunnell , Nathaniel J. Meier
IPC: G11C11/40 , G11C14/00 , G11C17/18 , G11C11/4072 , G11C11/4096 , G11C17/16
Abstract: Memory devices and systems with automatic background precondition upon powerup, and associated methods, are disclosed herein. In one embodiment, a memory device includes a memory array having a plurality of memory cells and a fuse array configured to store precondition data. The precondition data can identify a portion of the memory array, specify a predetermined precondition state, or a combination thereof. When the memory device powers on, the memory device can be configured to automatically retrieve the precondition data from the fuse array and/or to write memory cells in the portion of the memory array to the predetermined precondition state before executing an access command.
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公开(公告)号:US11488651B2
公开(公告)日:2022-11-01
申请号:US17135403
申请日:2020-12-28
Applicant: Micron Technology, Inc.
Inventor: James S. Rehmeyer , Debra M. Bell , George B. Raad , Brian P. Callaway , Joshua E. Alzheimer
IPC: G11C11/406 , G11C11/403 , G11C11/408
Abstract: A memory device may include a phase driver circuit that may output a first voltage for refreshing a plurality of memory cells. The memory device may also include a plurality of word line driver circuits that may receive the first voltage via the phase driver circuit, such that each word line driver circuit of the plurality of word line driver circuits may provide the first voltage to a respective word line associated with a respective portion of the plurality of memory cells. In addition, each word line driver circuit may refresh the respective portion of the plurality of memory cells based on a respective word line enable signal provided to a first switch of the respective word line driver circuit.
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