Apparatuses and methods for changing an intensity distribution of light within an illumination field without distorting the telecentricity of the light
    53.
    发明授权
    Apparatuses and methods for changing an intensity distribution of light within an illumination field without distorting the telecentricity of the light 有权
    用于改变照明场中的光的强度分布而不会使光的远心变形的方法

    公开(公告)号:US07633599B2

    公开(公告)日:2009-12-15

    申请号:US11523695

    申请日:2006-09-20

    IPC分类号: G03B27/72 G03B27/42

    CPC分类号: G03F7/70558 G03F7/70066

    摘要: An apparatus for changing an intensity distribution of a light within an illumination field includes a structure configured to be positioned within the illumination field so that a first portion of the light within the illumination field impinges upon the structure, where the structure is translucent or opaque to a wavelength of the light. The apparatus also includes an actuator configured to cause a movement of a first portion of the structure so that a second portion of the light within the illumination field impinges upon the structure. The light within the illumination field is produced by a source configured so that a pupil fill of a beam of the light is uncontrolled, but the beam of the light downstream of the structure is substantially telecentric before and after the movement of the first portion of the structure. Related methods are also presented.

    摘要翻译: 用于改变照明场中的光的强度分布的装置包括被配置为定位在照明场内的结构,使得照明场内的光的第一部分照射在结构上,其中结构是半透明的或不透明的 光的波长。 该装置还包括致动器,该致动器被配置为引起结构的第一部分的移动,使得照明场内的光的第二部分撞击该结构。 照明场内的光由源构成,使得光束的光瞳填充不受控制,但是结构的下游光的光束在第一部分的移动之前和之后基本上是远心的 结构体。 还提出了相关方法。

    Lithographic apparatus and device manufacturing method
    54.
    发明申请
    Lithographic apparatus and device manufacturing method 失效
    平版印刷设备和器件制造方法

    公开(公告)号:US20070188723A1

    公开(公告)日:2007-08-16

    申请号:US11353232

    申请日:2006-02-14

    IPC分类号: G03B27/42

    摘要: The mask in a lithographic apparatus is clamped on a first side using a first clamping device and on a second side, different from the first side, using a second clamping device. The clamping forces are preferably applied using thin membranes. The first clamp clamps the substrate in directions parallel to the plane of the patterning device, perpendicular to the plane of the patterning device and rotationally. The second clamping device clamps the patterning device only in directions parallel to the plane of the substrate.

    摘要翻译: 光刻设备中的掩模使用第一夹紧装置夹紧在第一侧上,并使用第二夹紧装置夹紧在不同于第一侧的第二侧上。 夹紧力优选使用薄膜施加。 第一夹具将基板平行于图案形成装置的平面垂直于图案形成装置的平面并旋转夹紧基板。 第二夹紧装置仅在平行于基板的平面的方向上夹持图案形成装置。

    Electromagnetic actuator, method of manufacturing a part of an electromagnetic actuator, and lithographic apparatus comprising an electromagnetic actuator
    55.
    发明申请
    Electromagnetic actuator, method of manufacturing a part of an electromagnetic actuator, and lithographic apparatus comprising an electromagnetic actuator 失效
    电磁致动器,制造电磁致动器的一部分的方法,以及包括电磁致动器的光刻设备

    公开(公告)号:US20070096566A1

    公开(公告)日:2007-05-03

    申请号:US11262962

    申请日:2005-11-01

    IPC分类号: H02K41/00

    摘要: A lithographic apparatus has a patterning support constructed to support a patterning device and a substrate support constructed to support a substrate. At least one of the patterning support and the substrate support is moved by an electromagnetic actuator. The actuator has a first part and a second part that are movable relative to each other. The first part has a coil structure, and the second part including a plurality of permanent magnets interacting with the coil structure. The second part is provided with a cooling structure arranged adjacent the permanent magnets. Cooling ducts are arranged between adjacent permanent magnets, or on a side of the permanent magnets facing the coil structure.

    摘要翻译: 光刻设备具有构造成支撑图案形成装置和构造成支撑衬底的衬底支撑件的图形化支撑件。 图案形成支撑件和基板支撑件中的至少一个由电磁致动器移动。 致动器具有可相对于彼此移动的第一部分和第二部分。 第一部分具有线圈结构,并且第二部分包括与线圈结构相互作用的多个永磁体。 第二部分设置有与永磁体相邻布置的冷却结构。 冷却管道布置在相邻的永磁体之间,或者在面向线圈结构的永磁体的一侧。

    Position measurement unit, measurement system and lithographic apparatus comprising such position measurement unit
    56.
    发明申请
    Position measurement unit, measurement system and lithographic apparatus comprising such position measurement unit 有权
    位置测量单元,测量系统和包括该位置测量单元的光刻设备

    公开(公告)号:US20070058172A1

    公开(公告)日:2007-03-15

    申请号:US11226460

    申请日:2005-09-15

    IPC分类号: G01B9/02

    摘要: A measurement unit to determine a position in a first and second dimension includes a diffraction type encoder and an interferometer. The diffraction type encoder determines by means of a diffraction on a first and a second diffraction grating the position in the first dimension of the second grating with respect to the first grating, The interferometer determines the position in the second dimension of a mirror. The measurement unit includes a combined optical unit to transfer an encoder measurement beam as well as an interferometer measurement beam. Further, the measurement unit may include a combined light source for the encoder as well as the interferometer. One of the first and second diffraction gratings may further show some degree of zero order reflection to provide the mirror of the interferometer.

    摘要翻译: 用于确定第一和第二维度中的位置的测量单元包括衍射型编码器和干涉仪。 衍射型编码器通过第一和第二衍射光栅上的衍射来确定第二光栅相对于第一光栅的第一维度中的位置。干涉仪确定反射镜的第二维度中的位置。 测量单元包括用于传送编码器测量光束以及干涉仪测量光束的组合光学单元。 此外,测量单元可以包括用于编码器的组合光源以及干涉仪。 第一和第二衍射光栅中的一个可进一步示出一些零级反射以提供干涉仪的反射镜。