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    DEVICES AND METHODS FOR MEASURING LIGHT
    57.
    发明申请
    DEVICES AND METHODS FOR MEASURING LIGHT 审中-公开
    用于测量光的装置和方法

    公开(公告)号：US20170067777A1

    公开(公告)日：2017-03-09

    申请号：US15093184

    申请日：2016-04-07

    申请人： BlueLight Analytics, Inc.

    发明人： Daniel LABRIE ,  Ivan KOSTYLEV ,  Chris FELIX

    IPC分类号： G01J1/04 ,  G01J1/02

    CPC分类号： G01J1/0474 ,  A61C19/003 ,  G01J1/0204 ,  G01J1/0219 ,  G01J1/0271 ,  G01J1/0425 ,  G01J1/0488 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0254 ,  G01J3/0256 ,  G01J3/0264 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01M11/0235 ,  G01N21/55 ,  G02B5/02 ,  G02B5/021 ,  G02B5/0284

    摘要： The invention features devices and methods for collecting and measuring light from external light sources. In general, the devices of the invention feature a light diffusing element, e.g., as a component of a light collector, connected by a light conducting conduit, e.g., a fiber optic cable, to a light measuring device, e.g., a spectrometer. This light diffusing element allows, e.g., for substantially uniform light diffusion across its surface and thus accurate measurements, while permitting the total footprint of the device to remain relatively small and portable. This light diffusing element also allows flexibility in scaling of the device to permit use in a wide range of applications.

    摘要翻译： 本发明的特征在于用于收集和测量来自外部光源的光的装置和方法。 通常，本发明的装置的特征在于光漫射元件，例如作为光收集器的部件，通过诸如光纤电缆的导光导管连接到诸如光谱仪的光测量装置。 该光漫射元件允许例如在其表面上实质上均匀的光扩散，从而允许精确的测量，同时允许设备的总占地面积保持相对较小和便携。 该光散射元件还允许设备的缩放的灵活性，以允许在广泛的应用中使用。

    SYSTEM AND METHOD FOR CALIBRATING IMAGING MEASUREMENTS TAKEN FROM AERIAL VEHICLES
    58.
    发明申请
    SYSTEM AND METHOD FOR CALIBRATING IMAGING MEASUREMENTS TAKEN FROM AERIAL VEHICLES 有权
    用于校准来自航空器的成像测量的系统和方法

    公开(公告)号：US20170010155A1

    公开(公告)日：2017-01-12

    申请号：US15275194

    申请日：2016-09-23

    申请人： SlantRange, Inc.

    发明人： Michael Ritter ,  Michael Milton

    IPC分类号： G01J3/02 ,  G01J3/28

    CPC分类号： G01J3/0297 ,  G01J1/0433 ,  G01J1/0474 ,  G01J1/4204 ,  G01J1/44 ,  G01J3/2823 ,  G01J2003/2826

    摘要： Systems and methods are provided for calibrating spectral measurements taken of one or more targets from an aerial vehicle. Multiple photo sensors may be configured to obtain spectral measurements of one or more ambient light sources. The obtained spectral measurements of the one or more ambient light sources may be used to calibrate the obtained spectral measurements of the target.

    摘要翻译： 提供了用于校准来自空中飞行器的一个或多个目标的光谱测量的系统和方法。 多个光电传感器可被配置为获得一个或多个环境光源的光谱测量。 所获得的一个或多个环境光源的光谱测量可用于校准所获得的目标光谱测量值。

    MEASUREMENT OF THE LIGHT RADIATION OF LIGHT-EMITTING DIODES
    59.
    发明申请
    MEASUREMENT OF THE LIGHT RADIATION OF LIGHT-EMITTING DIODES 有权
    发光二极管的光辐射测量

    公开(公告)号：US20150204718A1

    公开(公告)日：2015-07-23

    申请号：US14423695

    申请日：2013-08-22

    申请人： OSRAM Opto Semiconductors GmbH

    发明人： Simeon Katz ,  Holger Specht ,  Alexander Linkov ,  Christopher Koelper

    IPC分类号： G01J1/04 ,  G01M11/00 ,  G01J1/42

    CPC分类号： G01J1/0425 ,  G01J1/0474 ,  G01J1/42 ,  G01J2001/4252 ,  G01M11/30

    摘要： The invention relates to a method for measuring a light radiation (300) emitted by a light-emitting diode (210). In the method, an end (121) of an optical fibre (120) which is connected to a measuring device (130) is irradiated with the light radiation (300), which is emitted by the light-emitting diode (210), through an optical device (140), so that a portion of the light radiation (300) is coupled into the optical fibre (120) and is guided to the measuring device (130). The optical device (140) causes the light radiation (300) passing through the optical device (140) to be emitted in diffuse form in the direction of the end (121) of the optical fibre (120). The invention also relates to an apparatus (100) for measuring a light radiation (300) emitted by a light-emitting diode (210).

    摘要翻译： 本发明涉及一种用于测量由发光二极管（210）发射的光辐射（300）的方法。 在该方法中，连接到测量装置（130）的光纤（120）的端部（121）被由发光二极管（210）发射的光辐射（300）照射通过 光学装置（140），使得光辐射（300）的一部分耦合到光纤（120）中并被引导到测量装置（130）。 光学装置（140）使通过光学装置（140）的光辐射沿着光纤（120）的端部（121）的方向以漫射形式发射。 本发明还涉及一种用于测量由发光二极管（210）发射的光辐射（300）的装置（100）。

    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
    60.
    发明申请
    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号：US20150146200A1

    公开(公告)日：2015-05-28

    申请号：US14396908

    申请日：2013-04-24

    申请人： Hitachi High-Technologies Corporation

    发明人： Toshifumi Honda ,  Yuta Urano ,  Takahiro Jingu ,  Akira Hamamatsu

    IPC分类号： G01N21/95 ,  G01J1/04

    CPC分类号： G01N21/8806 ,  G01J1/0474 ,  G01J1/44 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/12

    摘要： To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    摘要翻译： 为了检测无限小的缺陷，高度精确地测量检测器的尺寸，检测检查装置被配置为包括：照射单元，其照射样品表面上的线性区域中的光; 检测单元，其检测来自所述线性区域的光; 以及信号处理单元，其处理通过检测光而获得的信号并检测缺陷。 检测单元包括：光学组件，其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件，其具有阵列传感器，其中检测像素被二维地定位，其检测沿与所述一个方向正交的方向成像的沿所述一个方向漫射的光，并将每个所述检测像素的输出信号相加， 光漫射的方向，并输出。