Semiconductor device and method of manufacturing the same
    65.
    发明授权
    Semiconductor device and method of manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US08698231B2

    公开(公告)日:2014-04-15

    申请号:US13600190

    申请日:2012-08-30

    IPC分类号: H01L21/20 H01L29/78

    CPC分类号: H01L27/11582

    摘要: A semiconductor device includes vertical channel layers, a pipe channel layer coupling bottoms of the vertical channel layers, a pipe gate contacting a bottom surface and side surfaces of the pipe channel layer, and a dummy pipe gate formed of a non-conductive material and contacting a top surface of the pipe channel layer.

    摘要翻译: 半导体器件包括垂直沟道层,连接垂直沟道层的底部的管道沟道层,与底部表面接触的管道和管道沟道层的侧表面,以及由非导电材料形成的虚拟管栅极和接触 管道通道层的顶表面。

    Nonvolatile memory device and method of fabricating the same
    66.
    发明授权
    Nonvolatile memory device and method of fabricating the same 有权
    非易失性存储器件及其制造方法

    公开(公告)号:US08604537B2

    公开(公告)日:2013-12-10

    申请号:US12493820

    申请日:2009-06-29

    申请人: Ki-Hong Lee Kwon Hong

    发明人: Ki-Hong Lee Kwon Hong

    IPC分类号: H01L29/792

    摘要: There is provided a nonvolatile memory device having a tunnel dielectric layer formed over a substrate, the charge capturing layer formed over the tunnel dielectric layer and including a combination of at least one charge storage layer and at least one charge trap layer, a charge blocking layer formed over the charge capturing layer, and a gate electrode formed over the charge blocking layer.

    摘要翻译: 提供了一种非易失性存储器件,其具有在衬底上形成的隧道介电层,所述电荷俘获层形成在所述隧道介电层上并包括至少一个电荷存储层和至少一个电荷俘获层,电荷阻挡层 形成在电荷捕获层上,以及形成在电荷阻挡层上的栅电极。

    Method for fabricating vertical channel type nonvolatile memory device
    68.
    发明授权
    Method for fabricating vertical channel type nonvolatile memory device 有权
    垂直通道型非易失性存储器件的制造方法

    公开(公告)号:US08399323B2

    公开(公告)日:2013-03-19

    申请号:US13244247

    申请日:2011-09-23

    IPC分类号: H01L21/336

    摘要: A method for fabricating a vertical channel type nonvolatile memory device includes: stacking a plurality of interlayer insulating layers and a plurality of gate electrode conductive layers alternately over a substrate; etching the interlayer insulating layers and the gate electrode conductive layers to form a channel trench exposing the substrate; forming an undoped first channel layer over the resulting structure including the channel trench; doping the first channel layer with impurities through a plasma doping process; and filling the channel trench with a second channel layer.

    摘要翻译: 一种用于制造垂直通道型非易失性存储器件的方法,包括:在衬底上交替堆叠多个层间绝缘层和多个栅电极导电层; 蚀刻层间绝缘层和栅电极导电层以形成暴露衬底的沟槽; 在包括沟道沟槽的所得结构上形成未掺杂的第一沟道层; 通过等离子体掺杂工艺对具有杂质的第一沟道层进行掺杂; 以及用第二通道层填充沟槽。