Abstract:
A method includes selecting a word line for programming in an array of analog memory cells that are arranged in rows associated with respective word lines and columns associated with respective bit lines. Word-line voltages, which program the memory cells in the selected word line, are applied to the respective word lines. Bit-line voltages, which cause one or more additional memory cells outside the selected word line to be programmed as a result of programming the selected word line, are applied to the respective bit lines. Using the applied word-line and bit-line voltages, data is stored in the memory cells in the selected word line and the additional memory cells are simultaneously programmed.
Abstract:
A method for data storage includes, in a first programming phase, storing first data in a group of analog memory cells by programming the memory cells in the group to a set of initial programming levels. In a second programming phase that is subsequent to the first programming phase, second data is stored in the group by: identifying the memory cells in the group that were programmed in the first programming phase to respective levels in a predefined partial subset of the initial programming levels; and programming only the identified memory cells with the second data, so as to set at least some of the identified memory cells to one or more additional programming levels that are different from the initial programming levels.
Abstract:
A method includes, in an array of analog memory cells that are arranged in rows associated with respective word lines, reading a first group of the memory cells in a selected word line, including one or more memory cells that store a status of at least one word line in the array other than the selected word line. A readout configuration for a second group of the memory cells is set responsively to the read status. The second group of the memory cells is read using the readout configuration.
Abstract:
A method includes selecting a word line for programming in an array of analog memory cells that are arranged in rows associated with respective word lines and columns associated with respective bit lines. Word-line voltages, which program the memory cells in the selected word line, are applied to the respective word lines. Bit-line voltages, which cause one or more additional memory cells outside the selected word line to be programmed as a result of programming the selected word line, are applied to the respective bit lines. Using the applied word-line and bit-line voltages, data is stored in the memory cells in the selected word line and the additional memory cells are simultaneously programmed.
Abstract:
A method for operating a memory (28) includes storing data in a group of analog memory cells (32) of the memory as respective first voltage levels. After storing the data, second voltage levels are read from the respective analog memory cells. The second voltage levels are affected by cross-coupling interference causing the second voltage levels to differ from the respective first voltage levels. Cross-coupling coefficients, which quantify the cross-coupling interference among the analog memory cells, are estimated by processing the second voltage levels. The data stored in the group of analog memory cells is reconstructed from the read second voltage levels using the estimated cross-coupling coefficients.
Abstract:
A method for operating a memory (28) that includes a plurality of analog memory cells (32) includes storing data in the memory by writing first storage values to the cells. Second storage values are read from the cells, and a Cumulative Distribution Function (CDF) of the second storage values is estimated. The estimated CDF is processed so as to compute one or more thresholds. A memory access operation is performed on the cells using the one or more thresholds.
Abstract:
A controller includes an interface and storage circuitry. The interface communicates with a memory that includes memory cells that store data in multiple programming levels, and that are organized in Word Lines (WLs). Each WL connects to one or more cell-groups of the memory cells. The memory cells in some cell-groups suffer from an impairment that has a different severity for reading data units of different bit-significance values. The storage circuitry assigns multiple parity groups to data units stored in cell-groups belonging to consecutive WLs, so that a same parity group is assigned to data units of different bit-significance values in neighboring groups of Nwl consecutive WLs. Upon detecting a failure to access a data unit of a given parity group, due to the impairment, the storage circuitry recovers the data unit using other data units assigned to the given parity group, and that are stored in other cell-groups.
Abstract:
The subject technology receives an input data set including rows of values for features of the input data set, each row including a different combination of values for the features. The subject technology classifies one or more rows of values as an anomaly based on anomaly scores determined for each of the rows of values. The subject technology determines a subset of the different features that affect the anomaly scores of the one or more rows classified as the anomaly. The subject technology determines a root cause for at least one of the rows classified as the anomaly based on values of the subset of the different features for the at least one of the rows. The subject technology provides an indication of the root cause to a device to enable the device to perform an action when encountering conditions corresponding to the root cause at a subsequent time.
Abstract:
A storage system includes an interface and storage circuitry. The interface is configured to communicate with a plurality of memory cells coupled to multiple Bit Lines (BLs). The memory cells are programmed and read in sub-groups of multiple BLs, and the sub-groups correspond to respective addresses. The storage circuitry is configured to generate a sequence of addresses for reading memory cells that together store a data part and a pattern part containing a predefined pattern, via multiple respective sub-groups, to detect that the data part read from the memory cells is erroneous due to a fault that occurred in the sequence of addresses by identifying a mismatch between the pattern part read from the memory cells and the predefined pattern, and, in response to detecting the fault, to take a corrective measure to recover an error-free version of the data part.
Abstract:
A method for data storage includes receiving in a memory device data for storage in a group of memory cells. The data is stored in the group by performing a Program and Verify (P&V) process, which applies to the memory cells in the group a sequence of programming pulses and compares respective analog values of the memory cells in the group to respective verification thresholds. Immediately following successful completion of the P&V process, a mismatch between the stored data and the received data is detected in the memory device. An error in storage of the data is reported responsively to the mismatch.