APPARATUS FOR DETERMINING A STATE OF A RECHARGEABLE BATTERY OR OF A BATTERY, A RECHARGEABLE BATTERY OR A BATTERY, AND A METHOD FOR DETERMINING A STATE OF A RECHARGEABLE BATTERY OR OF A BATTERY
    63.
    发明申请
    APPARATUS FOR DETERMINING A STATE OF A RECHARGEABLE BATTERY OR OF A BATTERY, A RECHARGEABLE BATTERY OR A BATTERY, AND A METHOD FOR DETERMINING A STATE OF A RECHARGEABLE BATTERY OR OF A BATTERY 有权
    用于确定可充电电池状态或电池,可充电电池或电池的装置,以及用于确定可充电电池状态或电池状态的方法

    公开(公告)号:US20150004451A1

    公开(公告)日:2015-01-01

    申请号:US14311489

    申请日:2014-06-23

    CPC classification number: H01M10/48 G01R31/3689 H01M6/505 H01M10/488

    Abstract: An apparatus for determining a state of a rechargeable battery or of a battery has a sensor device and an evaluation device. The sensor device brings about an interaction between an optical signal and a part of the rechargeable battery or of the battery, which part indicates optically acquirable information about a state of the rechargeable battery or of the battery, and detects an optical signal caused by the interaction. The sensor device furthermore provides a detection signal having information about the detected optical signal. The evaluation device determines information about a state of the rechargeable battery or of the battery on the basis of the information of the detection signal. Furthermore, the evaluation device provides a state signal having the information about the determined state.

    Abstract translation: 用于确定可再充电电池或电池的状态的装置具有传感器装置和评估装置。 该传感器装置引起光信号与可再充电电池或电池的一部分之间的相互作用,该部分指示关于可再充电电池或电池的状态的光学上可获取的信息,并检测由相互作用引起的光信号 。 传感器装置还提供具有关于检测到的光信号的信息的检测信号。 评估装置基于检测信号的信息来确定关于可再充电电池或电池的状态的信息。 此外,评估装置提供具有关于所确定的状态的信息的状态信号。

    Mirror systems
    65.
    发明授权

    公开(公告)号:US12228728B2

    公开(公告)日:2025-02-18

    申请号:US17659749

    申请日:2022-04-19

    Abstract: One example implementation of a mirror system comprises a carrier, and a first chip package arranged on a surface of the carrier and comprising a first MEMS mirror. Furthermore, the mirror system comprises a second chip package arranged on the surface of the carrier and comprising a second MEMS mirror. The mirror system furthermore comprises a reflective element arranged over the surface of the carrier and above the first chip package and the second chip package in such a way that a radiation that is incident in the mirror system and is reflected by the first MEMS mirror in the direction of the reflective element is reflected by the reflective element in the direction of the second MEMS mirror.

    Integration of a sensor system in a casing

    公开(公告)号:US12157145B2

    公开(公告)日:2024-12-03

    申请号:US17865504

    申请日:2022-07-15

    Abstract: A sensor system for attachment to a casing includes at least one sensor element, where the sensor element is configured for detecting an environment property of an environment which, with the sensor system attached to the casing, is situated on the opposite side of the casing with respect to the sensor system. The sensor system also includes an encapsulation layer, where the sensor element is embedded in the encapsulation layer, and where the encapsulation layer has a contact surface for attaching the sensor system to the casing.

    Semiconductor package with predictive safety guard

    公开(公告)号:US11275110B2

    公开(公告)日:2022-03-15

    申请号:US16849868

    申请日:2020-04-15

    Abstract: The disclosure describes techniques for detecting failures or performance degradation of a device including an integrated circuit (IC) components in the field by including additional contacts, i.e. terminals, along with functional contacts of the circuit used for connecting the circuit to a system in which the circuit is a part. These additional contacts may be internal external to the package surface and may be used to measure dynamic changing electrical characteristics over time e.g. voltage, current, capacity, temperature and impedance. These electrical characteristics may be representative of one or more failure modes and may be treated as indicator for device state-of-health (SOH).

    SEMICONDUCTOR PACKAGE WITH PREDICTIVE SAFETY GUARD

    公开(公告)号:US20210325454A1

    公开(公告)日:2021-10-21

    申请号:US16849868

    申请日:2020-04-15

    Abstract: The disclosure describes techniques for detecting failures or performance degradation of a device including an integrated circuit (IC) components in the field by including additional contacts, i.e. terminals, along with functional contacts of the circuit used for connecting the circuit to a system in which the circuit is a part. These additional contacts may be internal external to the package surface and may be used to measure dynamic changing electrical characteristics over time e.g. voltage, current, capacity, temperature and impedance. These electrical characteristics may be representative of one or more failure modes and may be treated as indicator for device state-of-health (SOH).

    Side-biased current sensor with improved dynamic range

    公开(公告)号:US10852363B2

    公开(公告)日:2020-12-01

    申请号:US15864313

    申请日:2018-01-08

    Abstract: A semiconductor package may include a sensor chip to measure an amount of electrical current in a current medium. The sensor chip may include a first magnetic sensing element and a second magnetic sensing element. The semiconductor package may include a magnet that produces a magnetic field. The magnet may be arranged asymmetrically with respect to the first magnetic sensing element and the second magnetic sensing element such that a strength of the magnetic field at the first magnetic sensing element is different from a strength of the magnetic field at the second magnetic sensing element.

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