Nitride semiconductor laser and epitaxial substrate
    61.
    发明授权
    Nitride semiconductor laser and epitaxial substrate 有权
    氮化物半导体激光器和外延衬底

    公开(公告)号:US08718110B2

    公开(公告)日:2014-05-06

    申请号:US13366636

    申请日:2012-02-06

    IPC分类号: H01S5/00

    摘要: A nitride semiconductor laser includes an electrically conductive support substrate with a primary surface of a gallium nitride based semiconductor, an active layer provided above the primary surface, and a p-type cladding region provided above the primary surface. The primary surface is inclined relative to a reference plane perpendicular to a reference axis extending in a direction of the c-axis of the gallium nitride based semiconductor. The p-type cladding region includes first and second p-type Group III nitride semiconductor layers. The first p-type semiconductor layer comprises an InAlGaN layer including built-in anisotropic strain. The second p-type semiconductor layer comprises semiconductor different from material of the InAlGaN layer. The first nitride semiconductor layer is provided between the second p-type semiconductor layer and the active layer. The second p-type semiconductor layer has a resistivity lower than that of the first p-type semiconductor layer.

    摘要翻译: 氮化物半导体激光器包括具有氮化镓基半导体的主表面的导电支撑衬底,设置在主表面上方的有源层和设置在主表面上的p型覆层区域。 主表面相对于垂直于在氮化镓基半导体的c轴方向上延伸的参考轴的参考平面倾斜。 p型包层区域包括第一和第二p型III族氮化物半导体层。 第一p型半导体层包括包括内置各向异性应变的InAlGaN层。 第二p型半导体层包括与InAlGaN层的材料不同的半导体。 第一氮化物半导体层设置在第二p型半导体层和有源层之间。 第二p型半导体层的电阻率低于第一p型半导体层的电阻率。

    III-nitride semiconductor laser, and method for fabricating III-nitride semiconductor laser
    62.
    发明授权
    III-nitride semiconductor laser, and method for fabricating III-nitride semiconductor laser 有权
    III族氮化物半导体激光器和III族氮化物半导体激光器的制造方法

    公开(公告)号:US08548021B2

    公开(公告)日:2013-10-01

    申请号:US13211858

    申请日:2011-08-17

    IPC分类号: H01S5/00

    摘要: Provided is a III-nitride semiconductor laser allowing for provision of a low threshold with use of a semipolar plane. A primary surface 13a of a semiconductor substrate 13 is inclined at an angle of inclination AOFF in the range of not less than 50 degrees and not more than 70 degrees toward the a-axis direction of GaN with respect to a reference plane perpendicular to a reference axis Cx along the c-axis direction of GaN. A first cladding layer 15, an active layer 17, and a second cladding layer 19 are provided on the primary surface 13a of the semiconductor substrate 13. The well layers 23a of the active layer 17 comprise InGaN. A polarization degree P in the LED mode of emission from the active layer of the semiconductor laser that reaches lasing is not less than −1 and not more than 0.1. The polarization degree P of the III-nitride semiconductor laser is defined by P=(I1−I2)/(I1+I2), using an electric field component I1 in the X1 direction and an electric field component I2 in the X2 direction of light in the LED mode.

    摘要翻译: 提供了允许使用半极性平面提供低阈值的III族氮化物半导体激光器。 半导体基板13的主表面13a相对于垂直于参考的参考平面朝向a轴方向的不小于50度且不超过70度的范围内以倾斜角AOFF倾斜 沿着C轴方向的C x轴。 在半导体衬底13的主表面13a上设置第一覆层15,有源层17和第二覆层19.有源层17的阱层23a包括InGaN。 来自激光器的半导体激光器的有源层的发光LED的偏振度P不小于-1且不大于0.1。 III族氮化物半导体激光器的偏振度P通过使用X1方向的电场分量I1和X2方向的电场分量I2由P =(I1-I2)/(I1 + I2)定义 在LED模式下。

    Group III nitride semiconductor laser diode, and method for producing group III nitride semiconductor laser diode
    65.
    发明授权
    Group III nitride semiconductor laser diode, and method for producing group III nitride semiconductor laser diode 失效
    III族氮化物半导体激光二极管,以及III族氮化物半导体激光二极管的制造方法

    公开(公告)号:US08483251B2

    公开(公告)日:2013-07-09

    申请号:US13294378

    申请日:2011-11-11

    IPC分类号: H01S5/00

    摘要: Provided is a Group III nitride semiconductor laser diode with a cladding layer capable of providing high optical confinement and carrier confinement. An n-type Al0.08Ga0.92N cladding layer is grown so as to be lattice-relaxed on a (20-21)-plane GaN substrate. A GaN optical guiding layer is grown so as to be lattice-relaxed on the n-type cladding layer. An active layer, a GaN optical guiding layer, an Al0.12Ga0.88N electron blocking layer, and a GaN optical guiding layer are grown so as not to be lattice-relaxed on the optical guiding layer. A p-type Al0.08Ga0.92N cladding layer is grown so as to be lattice-relaxed on the optical guiding layer. A p-type GaN contact layer is grown so as not to be lattice-relaxed on the p-type cladding layer, to produce a semiconductor laser. Dislocation densities at junctions are larger than those at the other junctions.

    摘要翻译: 提供了具有能够提供高的光学限制和载流子限制的包层的III族氮化物半导体激光二极管。 生长n型Al0.08Ga0.92N包覆层,使其在(20-21)面GaN衬底上晶格弛豫。 在n型包覆层上生长GaN光引导层以使其晶格弛豫。 生长活性层,GaN光引导层,Al0.12Ga0.88N电子阻挡层和GaN光引导层,使得在导光层上不会格子弛豫。 生长p型Al0.08Ga0.92N覆层,使其在光导层上格子弛豫。 生长p型GaN接触层,以便在p型覆层上不会发生晶格弛豫,以产生半导体激光器。 交界处的位错密度大于其他路口的位错密度。

    GaN-based semiconductor light emitting device and the method for making the same
    66.
    发明授权
    GaN-based semiconductor light emitting device and the method for making the same 失效
    GaN系半导体发光元件及其制造方法

    公开(公告)号:US08476615B2

    公开(公告)日:2013-07-02

    申请号:US13295840

    申请日:2011-11-14

    IPC分类号: H01L29/06

    摘要: A GaN-based semiconductor light emitting device 11a includes a substrate 13 composed of a GaN-based semiconductor having a primary surface 13a tilting from the c-plane toward the m-axis at a tilt angle α of more than or equal to 63 degrees and less than 80 degrees, a GaN-based semiconductor epitaxial region 15, an active layer 17, an electron blocking layer 27, and a contact layer 29. The active layer 17 is composed of a GaN-based semiconductor containing indium. The substrate 13 has a dislocation density of 1×107 cm−2 or less. In the GaN-based semiconductor light emitting device 11a provided with the active layer containing indium, a decrease in quantum efficiency under high current injection can be moderated.

    摘要翻译: GaN基半导体发光器件11a包括由GaN基半导体构成的衬底13,该GaN基半导体具有从c面朝向m轴倾斜角度α大于或等于63度的主表面13a;以及 低于80度的GaN基半导体外延区域15,有源层17,电子阻挡层27和接触层29.有源层17由包含铟的GaN基半导体构成。 基板13的位错密度为1×10 7 cm -2以下。 在具有含有铟的有源层的GaN系半导体发光元件11a中,能够缓和高电流注入时的量子效率的降低。

    Semiconductor optical device
    67.
    发明授权
    Semiconductor optical device 失效
    半导体光学器件

    公开(公告)号:US08445925B2

    公开(公告)日:2013-05-21

    申请号:US13434230

    申请日:2012-03-29

    IPC分类号: H01L33/00 H01L29/201

    摘要: A semiconductor optical device includes: a group III nitride semiconductor substrate having a primary surface of a first orientation; a first group III nitride semiconductor laminate including a first active layer disposed on a first region of the primary surface; a group III nitride semiconductor thin film having a surface, which has a second orientation different from the first orientation, disposed on a second region, the second region being different from the first region; a junction layer provided between the second region and the group III nitride semiconductor thin film; and a second group III nitride semiconductor laminate including a second active layer and disposed on the surface of the group III nitride semiconductor thin film. The first and second active layers include first and second well layers containing In, respectively, and the emission wavelengths of the first and second well layers are different from each other.

    摘要翻译: 半导体光学器件包括:具有第一取向的主表面的III族氮化物半导体衬底; 包括设置在所述主表面的第一区域上的第一有源层的第一III族氮化物半导体层叠体; 具有设置在第二区域上的具有与所述第一取向不同的第二取向的表面的III族氮化物半导体薄膜,所述第二区域与所述第一区域不同; 设置在第二区域和III族氮化物半导体薄膜之间的结层; 以及包括第二有源层并且设置在III族氮化物半导体薄膜的表面上的第二III族氮化物半导体层叠体。 第一和第二有源层包括分别包含In的第一阱层和第二阱层,并且第一阱层和第二阱层的发射波长彼此不同。