Method and apparatus for forming crystallized semiconductor layer, and method for manufacturing semiconductor apparatus
    64.
    发明授权
    Method and apparatus for forming crystallized semiconductor layer, and method for manufacturing semiconductor apparatus 失效
    用于形成结晶半导体层的方法和装置,以及半导体装置的制造方法

    公开(公告)号:US06987035B2

    公开(公告)日:2006-01-17

    申请号:US10857941

    申请日:2004-06-02

    IPC分类号: H01L21/00

    摘要: A method for forming a crystallized semiconductor layer includes preparing a non-single-crystal semiconductor layer in which at least one crystal seed is formed, and irradiating with an energy ray the non-single-crystal semiconductor layer having the crystal seed formed therein to allow a crystal to laterally grow from the crystal seed in the non-single-crystal semiconductor layer, irradiation of the energy ray is carried out by positioning to at least a part of the crystal seed an area having a minimum intensity value of the energy ray, the energy ray having a confirmation that an area having a maximum intensity value of the energy ray is continuously reduced to the area having the minimum intensity value in an irradiated surface.

    摘要翻译: 一种形成结晶化半导体层的方法包括制备其中形成至少一个晶种的非单晶半导体层,并且用能量线照射其中形成晶种的非单晶半导体层以允许 在非单晶半导体层中从晶种横向生长的晶体,通过将至少一部分晶种定位到晶种的至少一部分,进行能量射线的最小强度值的区域的照射, 能量射线确认具有能量射线的最大强度值的区域连续地减少到照射表面中具有最小强度值的区域。

    Method and apparatus for fabricating a thin film and thin film transistor and method of fabricating same
    65.
    发明授权
    Method and apparatus for fabricating a thin film and thin film transistor and method of fabricating same 有权
    用于制造薄膜和薄膜晶体管的方法和装置及其制造方法

    公开(公告)号:US06913986B2

    公开(公告)日:2005-07-05

    申请号:US10240570

    申请日:2001-04-04

    摘要: A method of fabricating a thin film includes: forming, on a substrate, a thin film with film properties varying from region to region on the substrate, by selectively heating the substrate; and patterning the thin film in a predetermined pattern by etching the thin film to selectively remove only a portion of the thin film with specified film properties. The method reduces the fabrication process temperature and the number of fabrication steps, while inhibiting degradation in device performance.

    摘要翻译: 一种制造薄膜的方法包括:通过选择性地加热所述衬底,在衬底上形成膜性质在衬底上的区域之间变化的薄膜; 并通过蚀刻薄膜以预定图案形成薄膜,以选择性地仅去除具有特定膜特性的薄膜的一部分。 该方法降低了制造工艺温度和制造步骤的数量,同时抑制了器件性能的降低。

    Semiconductor thin film, semiconductor device employing the same, methods for manufacturing the same and device for manufacturing a semiconductor thin film
    67.
    发明授权
    Semiconductor thin film, semiconductor device employing the same, methods for manufacturing the same and device for manufacturing a semiconductor thin film 有权
    半导体薄膜,采用该半导体薄膜的半导体器件,其制造方法以及半导体薄膜的制造装置

    公开(公告)号:US06548380B1

    公开(公告)日:2003-04-15

    申请号:US09658667

    申请日:2000-09-08

    IPC分类号: H01L2120

    摘要: By applying ion or optical energy or catalytic effects at the time of depositing a crystalline silicon thin film, improvements in crystallinity of the crystalline silicon thin film in proximities of an interface of a substrate or smoothing of its surface may be achieved. With this arrangement, it is possible to achieve improvements in crystallinity of the crystalline silicon film that is formed in a low temperature condition through CVD method and to prevent concaves and convexes from being formed on its surface or to prevent oxidation of grain fields, and it is accordingly possible to provide a thin film transistor, a semiconductor device such as a solar cell and methods for manufacturing these that exhibit superior characteristics and reliability.

    摘要翻译: 通过在沉积晶体硅薄膜时施加离子或光能或催化作用,可以实现晶体硅薄膜在基底界面附近或其表面平滑度附近的结晶度的改善。 通过这种布置,可以通过CVD法在低温条件下形成的结晶硅膜的结晶度得到改善,并且防止在其表面上形成凹凸或防止晶粒的氧化,并且 因此可以提供薄膜晶体管,诸如太阳能电池的半导体器件及其制造方法,其具有优异的特性和可靠性。

    Method for manufacturing chalcopyrite film
    68.
    发明授权
    Method for manufacturing chalcopyrite film 失效
    制造黄铜矿膜的方法

    公开(公告)号:US5633033A

    公开(公告)日:1997-05-27

    申请号:US420183

    申请日:1995-04-11

    CPC分类号: H01L31/0322 Y02E10/541

    摘要: A method for manufacturing an ABC.sub.2 chalcopyrite film (wherein A represents Cu or Ag, B represents In, Ga or Al, C represents S, Se or Te) comprises; a first step of forming a film of a composition of ABC.sub.2 containing element A in excess; a second step of exposing the film formed in the first step to a flux or gas containing element B and C, or to a gas or flux containing element A, B and C but containing element B in excess; and monitoring an electrical or optical property of the film in order to determine an end point of the second step where the electrical or optical property of the film demonstrates a specific change.

    摘要翻译: 一种制备ABC2黄铜矿膜的方法(其中A表示Cu或Ag,B表示In,Ga或Al,C表示S,Se或Te)包括: 形成含有过量的元素A的ABC2的组合物的膜的第一工序; 将在第一步骤中形成的膜暴露于含有助熔剂或气体的元素B和C的第二步骤,或者将含有元素A,B和C但含有元素B的气体或助熔剂过量的第二步骤; 以及监测胶片的电气或光学性能,以便确定第二步骤的终点,其中胶片的电或光学特性表现出特定的变化。