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    SILICON-CONTAINING LAYER DEPOSITION WITH SILICON COMPOUNDS
    71.
    发明申请
    SILICON-CONTAINING LAYER DEPOSITION WITH SILICON COMPOUNDS 有权
    含硅化合物的硅含量沉积

    公开(公告)号：US20080102218A1

    公开(公告)日：2008-05-01

    申请号：US11969139

    申请日：2008-01-03

    Applicant: Paul Comita ,  Lance Scudder ,  David Carlson

    Inventor： Paul Comita ,  Lance Scudder ,  David Carlson

    IPC: B05D3/00

    CPC classification number: C07F7/0896 ,  C01B33/04 ,  C01B33/107 ,  C07F7/12 ,  C23C16/24 ,  C23C16/30

    Abstract: Methods for depositing a silicon-containing film are described. The methods may include delivering a silicon compound to a surface or a substrate, and reacting the silicon compound to grow the silicon-containing film. The silicon compound may be one or more compounds having a formula selected from the group Si4X8, Si4X10, Si5X10, and Si5X12, where X is independently a hydrogen or halogen.

    Abstract translation: 描述了沉积含硅膜的方法。 所述方法可以包括将硅化合物递送到表面或基底，并使硅化合物反应生长含硅膜。 硅化合物可以是一种或多种具有选自下列化学式的化合物：Si 4 S 8 S 8，Si 4 X 10， / SUB，Si 5 X 10和Si 5 X 12，其中X独立地是氢或 卤素。

    CLUSTERING OF RECORDED PATIENT NEUROLOGICAL ACTIVITY TO DETERMINE LENGTH OF A NEUROLOGICAL EVENT
    72.
    发明申请
    CLUSTERING OF RECORDED PATIENT NEUROLOGICAL ACTIVITY TO DETERMINE LENGTH OF A NEUROLOGICAL EVENT 有权
    记录患者神经活动的聚集，以确定神经病学活动的长度

    公开(公告)号：US20080064934A1

    公开(公告)日：2008-03-13

    申请号：US11837987

    申请日：2007-08-13

    Applicant: Mark Frei ,  Ivan Osorio ,  Nina Graves ,  Scott Schaffner ,  Mark Rise ,  Jonathon Giftakis ,  David Carlson

    Inventor： Mark Frei ,  Ivan Osorio ,  Nina Graves ,  Scott Schaffner ,  Mark Rise ,  Jonathon Giftakis ,  David Carlson

    IPC: A61B5/00 ,  A61M5/00 ,  A61N1/36

    CPC classification number: A61M5/1723 ,  A61B5/04001 ,  A61B5/0476 ,  A61B5/4094 ,  A61B5/6843 ,  A61B5/721 ,  A61N1/36025 ,  A61N1/36064 ,  A61N1/36082 ,  A61N1/361

    Abstract: Apparatus and method detect a detection cluster that is associated with a neurological event, such as a seizure, of a nervous system disorder and update therapy parameters that are associated with a treatment therapy. The occurrence of the detection cluster is detected when the maximal ratio exceeds an intensity threshold. If the maximal ratio drops below the intensity threshold for a time interval that is less than a time threshold and subsequently rises above the intensity threshold, the subsequent time duration is considered as being associated with the detection cluster rather than being associated with a different detection cluster. Consequently, treatment of the nervous system disorder during the corresponding time period is in accordance with one detection cluster. Treatment therapy may be provided by providing electrical stimulation, drug infusion or a combination. Therapy parameters may be updated for each mth successive group of applications of the treatment therapy or for each nth detection cluster.

    Abstract translation: 装置和方法检测与神经系统疾病的神经系统事件（例如癫痫发作），与治疗疗法相关联的更新治疗参数相关联的检测簇。 当最大比例超过强度阈值时，检测到簇的出现。 如果最小比率在低于时间阈值的时间间隔下降到低于强度阈值，并且随后升高到强度阈值以上，则后续持续时间被认为与检测集群相关联，而不是与不同的检测集群相关联 。 因此，在相应时间段期间治疗神经系统疾病是根据一个检测群。 可以通过提供电刺激，药物输注或组合来提供治疗治疗。 治疗参数可以针对治疗疗法的每个连续的应用组或每个第n个检测簇进行更新。

    UV assisted low temperature epitaxial growth of silicon-containing films
    77.
    发明申请
    UV assisted low temperature epitaxial growth of silicon-containing films 审中-公开
    UV辅助低温外延生长的含硅膜

    公开(公告)号：US20070232031A1

    公开(公告)日：2007-10-04

    申请号：US11805428

    申请日：2007-05-22

    Applicant: Kaushal Singh ,  David Carlson ,  Manish Hemkar ,  Satheesh Kuppurao ,  Randhir Thakur

    Inventor： Kaushal Singh ,  David Carlson ,  Manish Hemkar ,  Satheesh Kuppurao ,  Randhir Thakur

    IPC: H01L21/20

    CPC classification number: H01L21/0262 ,  C23C16/482 ,  C30B25/105 ,  C30B29/06 ,  H01L21/02381 ,  H01L21/02532 ,  H01L21/02639 ,  H01L21/02661

    Abstract: A method of preparing a clean substrate surface for blanket or selective epitaxial deposition of silicon-containing and/or germanium-containing films. In addition, a method of growing the silicon-containing and/or germanium-containing films, where both the substrate cleaning method and the film growth method are carried out at a temperature below 750° C., and typically at a temperature from about 700° C. to about 500° C. The cleaning method and the film growth method employ the use of radiation having a wavelength ranging from about 310 nm to about 120 nm in the processing volume in which the silicon-containing film is grown. Use of this radiation in combination with particular partial pressure ranges for the reactive cleaning or film-forming component species enable the substrate cleaning and epitaxial film growth at temperatures below those previously known in the industry.

    Abstract translation: 一种制备用于覆盖或选择性外延沉积含硅和/或含锗膜的清洁衬底表面的方法。 此外，生长含硅和/或含锗膜的方法，其中基板清洗方法和膜生长方法都在低于750℃的温度下进行，通常在约700℃的温度下进行 ℃至约500℃。清洁方法和膜生长方法在其中生长含硅膜的处理体积中使用波长为约310nm至约120nm的辐射。 将该辐射与用于反应性清洁或成膜组分物质的特定分压范围的组合的使用使得能够在低于工业以前已知的温度下进行基材清洗和外延膜生长。

    Apparatus and method for monitoring and debugging query execution objects
    78.
    发明申请
    Apparatus and method for monitoring and debugging query execution objects 有权
    用于监视和调试查询执行对象的装置和方法

    公开(公告)号：US20070112737A1

    公开(公告)日：2007-05-17

    申请号：US11282030

    申请日：2005-11-17

    Applicant: David Carlson ,  Steven Hoeschen ,  Kevin Kathmann

    Inventor： David Carlson ,  Steven Hoeschen ,  Kevin Kathmann

    IPC: G06F17/30

    CPC classification number: G06F17/30289 ,  G06F3/048 ,  G06F17/30483

    Abstract: Nodes in a query execution data structure have monitor and dump methods defined. The monitor method enables the collection of information from the node. The dump method outputs the monitored information from each node. A monitor and debug mechanism of the preferred embodiments includes a graphical user interface that allows a user to graphically examine a query execution tree, to enable monitoring of the nodes on a node-by-node basis, and to view information dumped from the query execution data structure as the query is executed or after the query is executed. The result is a powerful tool that allows efficiently monitoring and debugging a query implemented in an object oriented query execution data structure.

    Abstract translation: 查询执行数据结构中的节点定义了监视和转储方法。 监视器方法可以从节点收集信息。 dump方法从每个节点输出监视的信息。 优选实施例的监视器和调试机制包括图形用户界面，其允许用户以图形方式检查查询执行树，以便逐节点地监视节点，以及查看从查询执行转发的信息 查询执行时或执行查询后的数据结构。 结果是一个强大的工具，可以有效地监视和调试在面向对象的查询执行数据结构中实现的查询。

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