Fluid filtration for substrate processing chamber
    77.
    发明授权
    Fluid filtration for substrate processing chamber 失效
    衬底处理室的流体过滤

    公开(公告)号:US08382885B2

    公开(公告)日:2013-02-26

    申请号:US12914822

    申请日:2010-10-28

    IPC分类号: B01D53/02

    摘要: A filter for filtering a fluid in a substrate processing apparatus comprises first and second stages that are connected to one another. A delivery system provides a vaporized liquid to the filter. The first stage of the filter comprises a basic compound, and the second stage of the filter comprises a desiccant. A second filter comprises a permeation filter with permeable membrane to filter the fluid. Methods of filtering the fluid to reduce formation of undesirable process residues using the filter(s) are also described.

    摘要翻译: 用于过滤衬底处理设备中的流体的过滤器包括彼此连接的第一和第二阶段。 输送系统向过滤器提供蒸发的液体。 过滤器的第一阶段包括碱性化合物,并且过滤器的第二阶段包括干燥剂。 第二过滤器包括具有可渗透膜的渗透过滤器以过滤流体。 还描述了使用过滤器过滤流体以减少不期望的工艺残余物的形成的方法。

    Method and apparatus for reducing charge density on a dielectric coated substrate after exposure to a large area electron beam
    79.
    发明授权
    Method and apparatus for reducing charge density on a dielectric coated substrate after exposure to a large area electron beam 失效
    用于在暴露于大面积电子束之后降低电介质涂覆的基底上的电荷密度的方法和装置

    公开(公告)号:US07425716B2

    公开(公告)日:2008-09-16

    申请号:US11414649

    申请日:2006-04-27

    IPC分类号: H02H23/00

    CPC分类号: H01J37/317 H01J2237/0041

    摘要: Embodiments in accordance with the present invention relate to a number of techniques, which may be applied alone or in combination, to reduce charge damage of substrates exposed to electron beam radiation. In one embodiment, charge damage is reduced by establishing a robust electrical connection between the exposed substrate and ground. In another embodiment, charge damage is reduced by modifying the sequence of steps for activating and deactivating the electron beam source to reduce the accumulation of charge on the substrate. In still another embodiment, a plasma is struck in the chamber containing the e-beam treated substrate, thereby removing accumulated charge from the substrate. In a further embodiment of the present invention, the voltage of the anode of the e-beam source is reduced in magnitude to account for differences in electron conversion efficiency exhibited by different cathode materials.

    摘要翻译: 根据本发明的实施例涉及可以单独或组合应用的多种技术,以减少暴露于电子束辐射的衬底的电荷损伤。 在一个实施例中,通过在暴露的基板和地之间建立牢固的电连接来减小电荷损伤。 在另一个实施例中,通过修改用于激活和去激活电子束源的步骤顺序来减少电荷损伤,以减少电荷在衬底上的累积。 在另一个实施例中,在包含电子束处理的衬底的室中撞击等离子体,从而从衬底去除积聚的电荷。 在本发明的另一个实施例中,电子束源的阳极的电压的大小被减小以考虑到由不同的阴极材料表现的电子转换效率的差异。