Abstract:
A memory system employs an addressing scheme to logically divide rows of memory cells into separate contiguous regions, one for data storage and another for error detection and correction (EDC) codes corresponding to that data. Data and corresponding EDC codes are stored in the same row of the same bank. Accessing data and corresponding EDC code in the same row of the same bank advantageously saves power and avoids bank conflicts. The addressing scheme partitions the memory without requiring the requesting processor to have an understanding of the memory partition.
Abstract:
Memory controllers, devices, modules, systems and associated methods are disclosed. In one embodiment, a memory module includes a pin interface for coupling to a bus. The bus has a first width. The module includes at least one storage class memory (SCM) component and at least one DRAM component. The memory module operates in a first mode that utilizes all of the first width, and in a second mode that utilizes less than all of the first width.
Abstract:
Memory devices, controllers and associated methods are disclosed. In one embodiment, a memory device is disclosed. The memory device includes storage cells that are each formed with a metal-oxide-semiconductor (MOS) transistor having a floating body. Data is stored as charge in the floating body. A transfer interface receives a read command to access data stored in a first group of the storage cells. Sensing circuitry detects the data stored in the first group of storage cells. The transfer interface selectively performs a writeback operation of the sensed data associated with the read command.
Abstract:
In a memory module having a buffer component, a plurality of data signaling paths and a plurality of memory dies each coupled to a respective one of the data signaling paths, the buffer component receives and stores a first configuration value that specifies a memory-die quantity N, where N is permitted to range from a first value corresponding to the quantity of the data signaling paths to at least one value less than the first value. The buffer component further receives a memory read command and enables, in accordance with the first configuration value, a quantity N of the memory dies to output read data in response to the memory read command.
Abstract:
Memory controllers, devices and associated methods are disclosed. In one embodiment, a memory controller includes write circuitry to transmit write data to a memory device, the write circuitry includes a write error detection correction (EDC) encoder to generate first error information associated with the write data. Data bus inversion (DBI) circuitry conditionally inverts data bits associated with each of the write data words based on threshold criteria. Read circuitry receives read data from the memory device. The read circuitry includes a read EDC encoder to generate second error information associated with the received read data. Logic evaluates the first and second error information and conditionally reverse-inverts at least a portion of the read data based on the decoding.
Abstract:
A buffer circuit is disclosed. The buffer circuit includes a command address (C/A) interface to receive an incoming activate (ACT) command and an incoming column address strobe (CAS) command. A first match circuit includes first storage to store failure row address information associated with the memory, and first compare logic. The first compare logic is responsive to the ACT command, to compare incoming row address information to the stored failure row address information. A second match circuit includes second storage to store failure column address information associated with the memory, and second compare logic. The second compare logic is responsive to the CAS command, to compare the incoming column address information to the stored failure column address information. Gating logic maintains a state of a matching row address identified by the first compare logic during the comparison carried out by the second compare logic.
Abstract:
A memory stack comprises at least two memory components. The memory components have a first data link interface and are to transmit signals on a data link coupled to the first data link interface at a first voltage level. A buffer component has a second data link interface coupled to the data link. The buffer component is to receive signals on the second data link interface at the first voltage level. A level shifting latch produces a second voltage level in response to receiving the signals at the second data link interface, where the second voltage level is higher than the first voltage level.
Abstract:
A status encoder generates a checksum that encodes a status condition together with the checksum of an associated message. A receiver determines an inverse transformation that when applied to the received status-encoded checksum recovers the parity information associated with the codeword. The status condition can then be recovered based on the selection of the inverse transformation that correctly recovers the parity information from the status-encoded checksum. Beneficially, the status condition can be encoded without requiring additional signal lines or lengthening the codeword relative to conventional error correction devices.
Abstract:
During system initialization, each data buffer device and/or memory device on a memory module is configured with a unique (at least to the module) device identification number. In order to access a single device (rather than multiple buffers and/or memory devices), a target identification number is written to all of the devices using a command bus connected to all of the data buffer devices or memory devices, respectively. The devices whose respective device identification numbers do not match the target identification number are configured to ignore future command bus transactions (at least until the debug mode is turned off.) The selected device that is configured with a device identification number matching the target identification number is configured to respond to command bus transactions.
Abstract:
Pixel circuits in an image sensor are sampled repetitively during an image frame period. At each sampling, a signal indicative of the photocharge integrated by a pixel circuit since last reset is compared to a threshold. If the integrated photocharge signal has not reached the threshold, the pixel circuit is permitted to continue integrating photocharge. If the integrated photocharge signal has reached the threshold, the pixel circuit is reset to remove integrated photocharge and photocharge integration for that pixel circuit is restarted. A corresponding pixel circuit value is recorded for the reset pixel circuit.