公开(公告)号：US08081249B2

公开(公告)日：2011-12-20

申请号：US12232994

申请日：2008-09-26

Applicant: Peter P. Altice, Jr. ,  Jeffrey A. McKee

Inventor： Peter P. Altice, Jr. ,  Jeffrey A. McKee

IPC: H04N3/14 ,  H04N5/335 ,  G01B9/04 ,  G02B21/00 ,  H01L31/00 ,  H01L27/146

CPC classification number: H01L27/148 ,  H04N5/363 ,  H04N5/37457

Abstract: A CMOS imaging system with increased charge storage of pixels yet decreased physical size, kTC noise and active area. A storage node is connected to the transfer gate and provides a storage node for a pixel, allowing for kTC noise reduction prior to readout. The pixel may be operated with the shutter gate on during the integration period to increase the amount of time for charge storage by a pixel.

Abstract translation: 具有增加像素电荷存储的CMOS成像系统，同时减小了物理尺寸，kTC噪声和有效面积。 存储节点连接到传输门并提供用于像素的存储节点，从而允许在读出之前降低kTC噪声。 可以在积分周期期间使快门门导通来操作像素，以增加像素对电荷存储的时间量。

公开(公告)号：US07586072B2

公开(公告)日：2009-09-08

申请号：US11819686

申请日：2007-06-28

Applicant: Yosuke Kusaka

Inventor： Yosuke Kusaka

IPC: G02B7/04 ,  G01B9/04

CPC classification number: G03B13/32 ,  H04N5/23212 ,  H04N9/045 ,  H04N2209/045

Abstract: A correlation operation method includes: first processing executed to match a signal level of an AC component contained in a first signal data string made up with a plurality of sets of first signal data with a signal level of an AC component contained in a second signal data string made up with a plurality of sets of second signal data; and correlation degree calculation processing executed to calculate a correlation degree indicating a degree of correlation between the first signal data string and the second signal data string having undergone the first processing.

Abstract translation: 相关操作方法包括：执行第一处理，以将包含在由多组第一信号数据组成的第一信号数据串中的AC分量的信号电平与包含在第二信号数据中的AC分量的信号电平相匹配 串组成多组第二信号数据; 并执行相关度计算处理，以计算表示第一信号数据串和经过第一处理的第二信号数据串之间的相关程度的相关度。

公开(公告)号：US20090168054A1

公开(公告)日：2009-07-02

申请号：US12085761

申请日：2006-12-26

Applicant: Tae-Sun Choi

Inventor： Tae-Sun Choi

IPC: G01B9/04

CPC classification number: G01B11/2513

Abstract: Provided are a three-dimensional image measuring method and apparatus for an LCD color filter automatic grinder. It is possible to measure a three-dimensional image of an LCD color filter, even though textures for recovering the three-dimensional image are insufficient, by irradiating illumination passed through a patterned filter to the LCD color filter. In addition, it is possible to measure a three-dimensional image of an LCD color filter by obtaining a plurality of image sequences along an optical axis of a camera composed of CCD or CIS. Illumination is irradiated to an LCD color filter to be measured through a patterned filter.

Abstract translation: 提供了一种用于LCD彩色滤光片自动研磨机的三维图像测量方法和装置。 即使通过图案化的滤光器照射照射到LCD滤色器，即使用于恢复三维图像的纹理不足，也可以测量LCD彩色滤光片的三维图像。 此外，可以通过沿着由CCD或CIS组成的照相机的光轴获得多个图像序列来测量LCD滤色器的三维图像。 将照明照射到要通过图案化过滤器测量的LCD彩色滤光片。

公开(公告)号：US07405762B2

公开(公告)日：2008-07-29

申请号：US10768633

申请日：2004-01-30

Applicant: Osamu Nonaka ,  Minoru Hara

Inventor： Osamu Nonaka ,  Minoru Hara

IPC: G03B13/00 ,  G03B3/00 ,  G03B13/18 ,  G03B13/32 ,  G03B7/099 ,  G03B3/10 ,  G03B13/34 ,  H04N5/232 ,  G02B7/04 ,  G02B21/00 ,  G02B7/28 ,  G01B9/04

CPC classification number: H04N5/23212 ,  G02B7/32

Abstract: A camera having an electronic image pickup element and a distance-measuring circuit that uses light signals obtained from light images of a plurality of distance-measuring areas set in a photographing screen to select a main subject and measure the distance to the subject. The camera has a focusing component, operating when the position of the main subject cannot be identified by the distance-measuring circuit, to divide the photographing screen into a plurality of areas to identify an area in which the main subject is present on the basis of a luminance distribution obtained from the areas other than those overlapping the distance-measuring areas. The focusing component focuses a photographing lens on the position of the highest contrast signal while scanning the lens position of the photographing lens.

Abstract translation: 一种具有电子摄像元件和距离测量电路的相机，其使用从设置在拍摄画面中的多个距离测量区域的光图像获得的光信号来选择主要被摄体并测量到被摄体的距离。 照相机具有聚焦组件，当距离测量电路不能识别主要被摄体的位置时，将拍摄屏幕划分成多个区域，以基于主要被摄体的区域来识别主要被摄体的区域 从与距离测量区域重叠的区域以外的区域获得的亮度分布。 在扫描拍摄镜头的镜头位置时，聚焦组件将拍摄镜头聚焦在最高对比度信号的位置上。

公开(公告)号：US20050280830A1

公开(公告)日：2005-12-22

申请号：US11136866

申请日：2005-05-25

Applicant: Christian Rembe

Inventor： Christian Rembe

IPC: G01B9/02 ,  G01B9/04 ,  G01B11/02 ,  G02B21/00

CPC classification number: G02B21/006 ,  G02B21/0056 ,  G02B21/245

Abstract: An apparatus for optical measurement of an object, especially for measuring movement, is provided, which includes an interferometer for measuring movements along the measurement beam of the interferometer, as well as a confocal auto-focus microscope. The interferometer is coupled in the beam path of the confocal auto-focus microscope, such that the measurement beam of the interferometer is simultaneously the focusing beam of the microscope. Here, it is guaranteed that the interferometric movement measurement is always performed at the focal point of the microscope that is used. This enables automatic correction of the Guoy effect for objectives with high numerical aperture. In addition, for the use of a scanning confocal auto-focus microscope, data sets of test objects can also be measured, which comprise their vibrational behavior, height profile, and optionally also their in-plane movement behavior.

Abstract translation: 提供了一种用于物体的光学测量的装置，特别是用于测量运动的装置，其包括用于测量沿着干涉仪的测量光束的运动的干涉仪以及共聚焦自动对焦显微镜。 干涉仪耦合在共焦自动对焦显微镜的光束路径中，使得干涉仪的测量光束同时是显微镜的聚焦光束。 这里，确保干涉测量运动测量始终在使用的显微镜​​的焦点处进行。 这使得能够自动校正具有高数值孔径的物镜的国际效应。 此外，对于使用扫描共聚焦自动对焦显微镜，也可以测量测试对象的数据集，其包括它们的振动特性，高度分布以及可选的其平面内移动行为。

公开(公告)号：US06937351B1

公开(公告)日：2005-08-30

申请号：US10287326

申请日：2002-11-04

Applicant: Kevin Weaver ,  Zachary Joshua Gemmill ,  Steven Jacobson

Inventor： Kevin Weaver ,  Zachary Joshua Gemmill ,  Steven Jacobson

IPC: G01B9/04 ,  G01B11/06

CPC classification number: G01B9/04

Abstract: The thickness of a semiconductor wafer is non-destructively measured using infrared (IR) microscopy. The wafer is placed on a stage. A distance between the stage and a detector is then varied so that a first image of the wafer is focused on the detector. When focused, a first separation distance is measured. The distance between the stage and the detector is again varied so that a second image is focused on the detector. When again focused, a second separation distance is measured. The difference between the first and second separation distances is then determined and multiplied by the refractive index of light in silicon.

Abstract translation: 使用红外（IR）显微镜对半导体晶片的厚度进行非破坏性测量。 将晶片放置在台上。 然后改变台与检测器之间的距离，使得晶片的第一图像聚焦在检测器上。 当聚焦时，测量第一分离距离。 级和检测器之间的距离再次变化，使得第二图像聚焦在检测器上。 当再次聚焦时，测量第二分隔距离。 然后确定第一和第二分离距离之间的差并乘以硅中的光的折射率。

公开(公告)号：US20050122577A1

公开(公告)日：2005-06-09

申请号：US11015076

申请日：2004-12-16

Applicant: Hirohisa Fujimoto ,  Akihiro Kitahara ,  Nobuhiro Kita ,  Hideo Watanabe

Inventor： Hirohisa Fujimoto ,  Akihiro Kitahara ,  Nobuhiro Kita ,  Hideo Watanabe

IPC: G01B9/04 ,  G02B21/00 ,  G02B21/06

CPC classification number: G02B21/006 ,  G01B9/04 ,  G02B21/008

Abstract: The present invention relates to a confocal microscope and a measuring method by the confocal microscope in which one or a plurality of measuring units to detect a movement amount are disposed facing a Z-stage having a sample laid thereon, the measuring unit detects a relative position between a condensing position of an objective lens and the sample, a maximum value of a change curved line indicated by light intensity information, and a relative position giving this value are estimated based on obtained relative position information, and a plurality of pieces of light intensity information including the maximum light intensity value of the light intensity, and a confocal image is produced using the estimated maximum value of the light intensity and the relative position as reflection luminance information and height information.

Abstract translation: 本发明涉及共聚焦显微镜和通过共聚焦显微镜的测量方法，其中一个或多个检测移动量的测量单元被布置为面向铺设有样品的Z级，测量单元检测相对位置 在物镜的聚光位置和样品之间，基于获得的相对位置信息来估计给出该值的由光强度信息指示的改变曲线的最大值和相对位置，并且多个光强度 使用光强度的估计最大值和相对位置作为反射亮度信息和高度信息来产生包括光强度的最大光强度值和共焦图像的信息。

公开(公告)号：US20050073691A1

公开(公告)日：2005-04-07

申请号：US10418424

申请日：2003-04-18

Applicant: Valentin Gelikonov ,  Grigory Gelikonov ,  Natalia Gladkova ,  Natalia Shahova ,  Felix Feldchtein ,  Alexander Sergeev

Inventor： Valentin Gelikonov ,  Grigory Gelikonov ,  Natalia Gladkova ,  Natalia Shahova ,  Felix Feldchtein ,  Alexander Sergeev

IPC: G01N21/17 ,  A61B1/005 ,  A61B5/00 ,  A61B6/08 ,  A61B10/00 ,  G01B9/02 ,  G01B9/04 ,  G02B26/10

CPC classification number: A61B5/6852 ,  A61B1/00096 ,  A61B1/00172 ,  A61B1/00177 ,  A61B1/00183 ,  A61B1/005 ,  A61B5/0066 ,  G01B9/02002 ,  G01B9/0205 ,  G01B9/02091 ,  G01B9/04 ,  G01B2290/65 ,  G02B26/10

Abstract: In a method for in vivo diagnostics of a biological tissue covered with epithelium an image of the biological tissue is acquired with the aid of a beam in the visible or near IR range directed towards a biological tissue by visualizing the intensity of optical radiation backscattered by the biological tissue. The basal membrane of said biological tissue, which separates the epithelium from an underlying stroma, is identified in the acquired image and diagnostics is performed on basis of the form of the basal membrane. For diagnostics of biological tissue lining the surface of cavities and internal organs of a patient a miniature optical fiber probe is inserted into the patient's cavity. The probe may be placed at a distal end of an endoscope instrumental channel. Acquired images show that a biological tissue covered with healthy epithelium has a smooth basal membrane, which separates stratified squamous epithelium from underlying connective tissue, while pathological regions of biological tissue are characterized by a change in the shape of the basal membrane, or violation of its integrity, or its absolute destruction. Using low coherent optical radiation for implementing the developed method ensures high spatial in-depth resolution.

Abstract translation: 在用上皮覆盖的生物组织进行体内诊断的方法中，借助于可见或接近IR范围内的束，通过可视化由背景散射的光辐射的强度获得生物组织的图像， 生物组织。 在所获取的图像中鉴定所述生物组织的基底膜，其将上皮与潜在基质分离，并且基于基底膜的形式进行诊断。 为了诊断患者空腔和内脏器官表面的生物组织，将微型光纤探针插入病人的腔内。 探针可以放置在内窥镜器械通道的远端。 获得的图像显示，用健康上皮覆盖的生物组织具有平滑的基底膜，其将分层的鳞状上皮与下层结缔组织分开，而生物组织的病理区域的特征在于基底膜形状的变化，或违反其 诚信或绝对破坏。 使用低相干光辐射实现开发的方法确保高空间深度分辨率。

公开(公告)号：US06873423B2

公开(公告)日：2005-03-29

申请号：US10622545

申请日：2003-07-21

Applicant: Yi-Shih Huang

Inventor： Yi-Shih Huang

IPC: G01B9/04 ,  G01B11/02 ,  G01B11/06

CPC classification number: G01B9/04 ,  G01B11/02

Abstract: A length measure apparatus and the method for measuring transform an image from a lens set into a digital contrast image via a central processing unit. The CPU has multiple standard lines that are previously set therein. Multiple movement controllers control a movement of a selected standard line from the CPU relative to the digital contrast image. A movement value is output when the selected standard line flushes with a profile of the contrast image. The measure value is shown on a monitor when the CPU contrasts the movement of the selected standard line.

Abstract translation: 一种长度测量装置和用于测量经由中央处理单元将图像从透镜组变换成数字对比图像的方法。 CPU具有先前设置的多条标准线。 多个移动控制器控制所选标准线从CPU相对于数字对比度图像的移动。 当所选择的标准线用对比度图像的轮廓冲洗时，输出运动值。 当CPU对比所选标准线的移动时，测量值显示在监视器上。

公开(公告)号：US6121604A

公开(公告)日：2000-09-19

申请号：US64480

申请日：1998-04-22

Applicant: Takashi Hiraga ,  Tetsuo Moriya ,  Akihiro Mito ,  Masamichi Fujihira ,  Hiroshi Muramatsu ,  Noritaka Yamamoto

Inventor： Takashi Hiraga ,  Tetsuo Moriya ,  Akihiro Mito ,  Masamichi Fujihira ,  Hiroshi Muramatsu ,  Noritaka Yamamoto

IPC: G01B11/30 ,  G01B9/04 ,  G01N37/00 ,  G01Q60/06 ,  G01Q60/22 ,  G01Q60/32 ,  G12B21/06

CPC classification number: G01Q60/22 ,  B82Y20/00 ,  B82Y35/00 ,  G01B9/04 ,  G01Q70/02 ,  Y10S977/862

Abstract: An optical probe is used in a near-field effect microscope for performing topographical observation and physical property measurement on a surface of a sample. The optical probe comprises an optical resonator having an optical fiber having at least one microscopic projection composed of a dielectric material disposed at an end portion of the optical fiber for transmitting light.

Abstract translation: 在近场效应显微镜中使用光学探针进行样品表面的地形观察和物理性质测量。 光学探头包括具有光纤的光学谐振器，该光纤具有至少一个微观突起，该微观突起由设置在光纤的端部处的用于透射光的电介质材料组成。