公开(公告)号：US07772911B2

公开(公告)日：2010-08-10

申请号：US12208978

申请日：2008-09-11

申请人： Akira Ide ,  Yasuhiro Takai ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Satoru Akiyama ,  Hiroaki Nakaya

发明人： Akira Ide ,  Yasuhiro Takai ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Satoru Akiyama ,  Hiroaki Nakaya

IPC分类号： G06F1/04

CPC分类号： H03K5/135 ,  G11C7/04 ,  G11C7/1072 ,  G11C7/222 ,  G11C11/4076 ,  G11C19/00

摘要： Disclosed is a timing control circuit that receives a first clock having a period T1, a group of second clocks of L different phases spaced apart from each other at substantially equal intervals and selection signals m, n supplied thereto and generates a fine timing signal delayed from the rising edge of the first clock signal by a delay td of approximately td=m·T1+n·(T2/L). The timing control circuit includes a coarse delay circuit and a fine delay circuit. The coarse delay circuit includes a counter for counting a rising edge of the first clock signal after an activate signal is activated and generates a coarse timing signal whose amount of delay from the first clock signal is approximately m·T1. The fine delay circuit comprises L-number of multiphase clock control delay circuits disposed in parallel, delays by n·T2/L the timing of sampling of the coarse timing signal by respective clocks of the group of L-phase second clocks, and takes the OR among the resulting delayed pulses to thereby produce the fine timing signal.

摘要翻译： 公开了一种定时控制电路，其接收具有周期T1的第一时钟，以相等间隔彼此间隔开的L个不同相位的一组第二时钟，以及提供给其的选择信号m，n，并产生从 第一时钟信号的上升沿大约为td = m·T1 + n·（T2 / L）的延迟td。 定时控制电路包括粗延迟电路和精细延迟电路。 粗略延迟电路包括用于在激活信号被激活之后对第一时钟信号的上升沿进行计数的计数器，并产生其第一时钟信号的延迟量大约为m·T1的粗略定时信号。 精细延迟电路包括L个并联设置的多相时钟控制延迟电路，通过n·T2 / L延迟由L组第二时钟组的相应时钟对粗略定时信号进行采样的定时， 或者产生延迟脉冲，从而产生精细定时信号。

公开(公告)号：US07706208B2

公开(公告)日：2010-04-27

申请号：US12354549

申请日：2009-01-15

申请人： Riichiro Takemura ,  Tomonori Sekiguchi

发明人： Riichiro Takemura ,  Tomonori Sekiguchi

IPC分类号： G11C8/00

CPC分类号： G11C8/12 ,  G11C5/025 ,  G11C5/04 ,  G11C7/18 ,  G11C11/4097 ,  H01L25/0657 ,  H01L27/0207 ,  H01L27/10814 ,  H01L2224/4826 ,  H01L2924/13091 ,  H01L2924/00

摘要： If memory cell blocks are laid out in a conventional manner to create a memory chip with a capacity of an odd power of 2 by using memory cells whose aspect ratio is 1:2, the chip will take a 1:1 shape and become difficult to enclose in a package of a 1:2 shape. In addition, such conventional layout of memory cell blocks to form the 1:2 shape causes the area of a peripheral circuit region to be limited by the memory blocks, pads to be arranged collectively in the central section of the chip, and wiring to become dense during the enclosure of the chip in the package.In this invention, therefore, four memory blocks, BANK0, BANK1, BANK2, BANK3, BANK3, are constructed into an L shape and then these memory blocks are properly combined and arranged to construct a chip of nearly a 1:2 shape in terms of aspect ratio.

摘要翻译： 如果通过使用纵横比为1:2的存储单元，以常规方式布置存储单元块以创建具有2的奇数功率的容量的存储芯片，则芯片将采取1：1的形状并变得难以 以1：2的形状包装。 此外，存储单元块的这种传统布局形成1：2形状会导致外围电路区域的区域受到存储块的限制，焊盘将被集中布置在芯片的中心部分中，并且布线成为 密封在芯片封装中的封装。 因此，在本发明中，将四个存储块BANK0，BANK1，BANK2，BANK3，BANK3构造成L形，然后将这些存储块适当地组合并布置成构成近似1：2形状的芯片 长宽比。

公开(公告)号：US20090175064A1

公开(公告)日：2009-07-09

申请号：US12343086

申请日：2008-12-23

申请人： Yasutoshi Yamada ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Kazuhiko Kajigaya

发明人： Yasutoshi Yamada ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Kazuhiko Kajigaya

IPC分类号： G11C5/06 ,  G11C11/34 ,  G11C7/00

CPC分类号： G11C7/02 ,  G11C7/12 ,  G11C7/18 ,  G11C8/04 ,  G11C8/08 ,  G11C8/12 ,  G11C11/4094 ,  G11C11/4097

摘要： A semiconductor device includes a plurality of word lines, a plurality of bit lines, a plurality of memory cells provided at the intersections of the plurality of word lines and the plurality of bit lines and each of that includes a MIS transistor and a memory element, a decoder circuit for selecting a plurality of word lines, and a sense-amplifier circuit for determining information that is read from any of the plurality of memory cells to any of the plurality of bit lines, wherein a twist connector for switching the wiring order of the plurality of word lines is provided and level-stabilizing circuits, for supplying the potential level of a non-selected state to the plurality of word lines in the non-selected state are arranged in the area below the twist connector.

摘要翻译： 半导体器件包括多个字线，多个位线，设置在多个字线和多个位线的交点处的多个存储单元，其中每一个包括一个MIS晶体管和一个存储元件， 用于选择多个字线的解码器电路，以及用于确定从多个存储单元中的任何一个读取到多个位线中的任一个的信息的读出放大器电路，其中，用于切换多个字线的布线顺序的扭转连接器 提供多个字线，并且用于将未选择状态的电位电平提供给未选择状态的多个字线的电平稳定电路被布置在扭转连接器下方的区域中。

公开(公告)号：US20090146716A1

公开(公告)日：2009-06-11

申请号：US12314207

申请日：2008-12-05

申请人： Akira Ide ,  Yasuhiro Takai ,  Akira Kotabe ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Satoru Akiyama

发明人： Akira Ide ,  Yasuhiro Takai ,  Akira Kotabe ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Satoru Akiyama

IPC分类号： H03H11/26

CPC分类号： G11C11/4076 ,  G11C7/04 ,  G11C7/1072 ,  G11C7/222 ,  G11C19/00 ,  H03K5/131 ,  H03K5/14 ,  H03K2005/00058 ,  H03K2005/00241

摘要： A timing control circuit DLY1 receives clock signal CKa with period T1 and activation signal ACT and outputs fine timing signal FT with delay of m*T1+tda measured from the clock signal where m denotes a non-negative integer and tda denotes delay in the analog delay element. The timing control circuit DLY1 comprises a coarse delay circuit CD and a fine delay circuit FD. The coarse delay circuit CD comprises a counter for counting a rising edge of the clock signal CKa after receiving activation signal ACT and outputs coarse timing signal CT with delay of m*T1 measured from a rising edge of the clock signal CKa. The fine delay circuit FD comprises a plurality of analog delay elements and outputs fine delay timing signal FT with delay of tda measured from the coarse timing signal CT. Variation in delay of timing signal is reduced.

摘要翻译： 定时控制电路DLY1接收具有周期T1和激活信号ACT的时钟信号CKa，并从m表示非负整数的时钟信号输出延迟m * T1 + tda的精确定时信号FT，并且tda表示模拟 延迟元件 定时控制电路DLY1包括粗延迟电路CD和精细延迟电路FD。 粗延迟电路CD包括用于在接收到激活信号ACT之后对时钟信号CKa的上升沿进行计数的计数器，并输出从时钟信号CKa的上升沿测量的具有延迟m * T1的粗定时信号CT。 精细延迟电路FD包括多个模拟延迟元件，并输出从粗定时信号CT测得的具有延迟tda的精细延迟定时信号FT。 定时信号延迟的变化减小。

公开(公告)号：US20090059702A1

公开(公告)日：2009-03-05

申请号：US12285527

申请日：2008-10-08

申请人： Tomonori Sekiguchi ,  Shinichi Miyatake ,  Takeshi Sakata ,  Riichiro Takemura ,  Hiromasa Noda ,  Kazuhiko Kajigaya

发明人： Tomonori Sekiguchi ,  Shinichi Miyatake ,  Takeshi Sakata ,  Riichiro Takemura ,  Hiromasa Noda ,  Kazuhiko Kajigaya

IPC分类号： G11C7/06

CPC分类号： G11C7/062 ,  G11C5/063 ,  G11C7/065 ,  G11C7/08 ,  G11C7/1078 ,  G11C7/1096 ,  G11C7/12 ,  G11C7/18 ,  G11C8/08 ,  G11C11/4087 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4096 ,  G11C11/4097 ,  G11C29/1201 ,  G11C2207/002 ,  G11C2207/005 ,  H01L27/0207 ,  H01L27/10814 ,  H01L27/10882 ,  H01L27/10897

摘要： A direct sense amplifier of the present invention incorporates and isolates: an MOS transistor serving as a differential pair and having a gate connected to a bit line; and an MOS transistor controlled by a column select line wired between RLIO lines in a bit-line direction, and further connects a source of the MOS transistor serving as the differential pair to a common source line wired in the word-line direction. Since the direct sense amplifier only in a select map is activated by the column select line and the common source line during an read operation, power consumption is significantly reduced during the read operation. Also, since a parasitic capacitance of the MOS transistor serving as the differential pair is separated from the local IO line, a load capacity of the local IO line is reduced and the read operation is speeded up. In addition, during the read operation, a data pattern dependency of the load capacity of the local IO line is reduced and a post-manufacture test is easily made.

摘要翻译： 本发明的直接感测放大器结合并隔离：用作差分对并具有连接到位线的栅极的MOS晶体管; 以及通过在位线方向上的RLIO线之间布线的列选择线控制的MOS晶体管，并且还将用作差分对的MOS晶体管的源极连接到在字线方向上布线的公共源极线。 由于在读取操作期间，仅在选择映射中的直接读出放大器被列选择线和公共源极线激活，所以在读取操作期间功耗显着降低。 此外，由于用作差分对的MOS晶体管的寄生电容与本地IO线分离，所以本地IO线的负载容量减小，读取操作加快。 此外，在读取操作期间，本地IO线的负载能力的数据模式相关性降低，并且容易进行后期制造测试。

公开(公告)号：US07447091B2

公开(公告)日：2008-11-04

申请号：US11706409

申请日：2007-02-15

申请人： Tomonori Sekiguchi ,  Shinichi Miyatake ,  Takeshi Sakata ,  Riichiro Takemura ,  Hiromasa Noda ,  Kazuhiko Kajigaya

发明人： Tomonori Sekiguchi ,  Shinichi Miyatake ,  Takeshi Sakata ,  Riichiro Takemura ,  Hiromasa Noda ,  Kazuhiko Kajigaya

IPC分类号： G11C7/02

CPC分类号： G11C7/062 ,  G11C5/063 ,  G11C7/065 ,  G11C7/08 ,  G11C7/1078 ,  G11C7/1096 ,  G11C7/12 ,  G11C7/18 ,  G11C8/08 ,  G11C11/4087 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4096 ,  G11C11/4097 ,  G11C29/1201 ,  G11C2207/002 ,  G11C2207/005 ,  H01L27/0207 ,  H01L27/10814 ,  H01L27/10882 ,  H01L27/10897

摘要： A direct sense amplifier of the present invention incorporates and isolates: an MOS transistor serving as a differential pair and having a gate connected to a bit line; and an MOS transistor controlled by a column select line wired between RLIO lines in a bit-line direction, and further connects a source of the MOS transistor serving as the differential pair to a common source line wired in the word-line direction. Since the direct sense amplifier only in a select map is activated by the column select line and the common source line during an read operation, power consumption is significantly reduced during the read operation. Also, since a parasitic capacitance of the MOS transistor serving as the differential pair is separated from the local IO line, a load capacity of the local IO line is reduced and the read operation is speeded up. In addition, during the read operation, a data pattern dependency of the load capacity of the local IO line is reduced and a post-manufacture test is easily made.

摘要翻译： 本发明的直接感测放大器结合并隔离：用作差分对并具有连接到位线的栅极的MOS晶体管; 以及通过在位线方向上的RLIO线之间布线的列选择线控制的MOS晶体管，并且还将用作差分对的MOS晶体管的源极连接到在字线方向上布线的公共源极线。 由于在读取操作期间，仅在选择映射中的直接读出放大器被列选择线和公共源极线激活，所以在读取操作期间功耗显着降低。 此外，由于用作差分对的MOS晶体管的寄生电容与本地IO线分离，所以本地IO线的负载容量减小，读取操作加快。 此外，在读取操作期间，本地IO线的负载能力的数据模式相关性降低，并且容易进行后期制造测试。

公开(公告)号：US20080054262A1

公开(公告)日：2008-03-06

申请号：US11771779

申请日：2007-06-29

申请人： Hiroaki Nakaya ,  Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura

发明人： Hiroaki Nakaya ,  Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura

IPC分类号： H01L23/58

CPC分类号： G11C5/146 ,  G11C11/401 ,  G11C11/4074 ,  G11C29/02 ,  G11C29/026 ,  G11C29/028 ,  H01L2924/0002 ,  H01L2924/00

摘要： A substrate voltage control technique that prevents the operating speed from being decreased and suppresses a leakage current due to a lower threshold voltage with respect to a low voltage use. Since a center value of the threshold voltages is detected by plural replica MOS transistors, and a substrate voltage is controlled to control a center value of the threshold voltages, thereby making it possible to satisfy a lower limit of the operating speed and an upper limit of a leakage current of the entire chip. On the other hand, the substrate voltage is dynamically controlled during the operation of the chip, thereby making it possible to decrease the center value of the threshold voltages when the chip operates to improve the speed, and to increase the center value of the threshold voltages after the operation of the chip to reduce the leakage current of the entire chip.

摘要翻译： 一种防止工作速度降低的基板电压控制技术，并且相对于低电压使用而抑制由于阈值电压较低导致的漏电流。 由于通过多个复制MOS晶体管检测阈值电压的中心值，并且控制衬底电压以控制阈值电压的中心值，从而可以满足操作速度的下限和上限 整个芯片的漏电流。 另一方面，在芯片工作期间动态地控制衬底电压，从而可以在芯片工作时降低阈值电压的中心值以提高速度，并且增加阈值电压的中心值 芯片运行后降低整个芯片的漏电流。

公开(公告)号：US07289346B2

公开(公告)日：2007-10-30

申请号：US11349918

申请日：2006-02-09

申请人： Tomonori Sekiguchi ,  Riichiro Takemura ,  Kazuhiko Kajigaya ,  Katsutaka Kimura ,  Tsugio Takahashi

发明人： Tomonori Sekiguchi ,  Riichiro Takemura ,  Kazuhiko Kajigaya ,  Katsutaka Kimura ,  Tsugio Takahashi

IPC分类号： G11C5/06

CPC分类号： G11C7/02 ,  G11C5/06 ,  G11C5/063 ,  G11C8/08 ,  G11C8/14 ,  G11C11/408 ,  G11C11/4085 ,  G11C11/4096 ,  G11C11/4097 ,  H01L27/0207 ,  H01L27/10814 ,  H01L27/10882

摘要： In a large scale integrated DRAM in pursuit of micro fabrication, data line-word line coupling capacitances are unbalanced between paired data lines. An imbalance in data line-word line means generation of large noise when the data lines are subjected to amplification, which is highly likely invite deterioration of very small signals on the data lines and erroneous amplification of data.One or a few each of a plurality of word lines connected to a plurality of memory cells connected to one data line are alternately connected to subword driver arrays arranged on the opposing sides of a memory array.Positive and negative word line noise components cancel each other in the subword drivers when the data lines are subjected to amplification, so that the word line noise can be reduced. Therefore, signals read out by sense amplifiers can be prevented from deterioration thereby to increase the reliability of memory operation.

摘要翻译： 在追求微型制造的大规模集成DRAM中，数据线字线耦合电容在配对数据线之间不平衡。 数据线字线的不平衡意味着当数据线经受放大时产生大的噪声，这极有可能引起数据线上非常小的信号的恶化和数据的错误放大。 连接到连接到一个数据线的多个存储单元的多个字线中的一个或几个字线交替地连接到布置在存储器阵列的相对侧上的子字驱动器阵列。 当数据线被放大时，正和负字线噪声分量在子字驱动器中彼此抵消，从而可以减小字线噪声。 因此，可以防止由读出放大器读出的信号劣化，从而提高存储器操作的可靠性。

公开(公告)号：US20070211547A1

公开(公告)日：2007-09-13

申请号：US11797984

申请日：2007-05-09

申请人： Riichiro Takemura ,  Kiyoo Itoh ,  Tomonori Sekiguchi ,  Takeshi Sakata ,  Katsutaka Kimura

发明人： Riichiro Takemura ,  Kiyoo Itoh ,  Tomonori Sekiguchi ,  Takeshi Sakata ,  Katsutaka Kimura

IPC分类号： G11C7/06

CPC分类号： G11C7/065 ,  G11C5/025 ,  G11C5/14 ,  G11C7/06 ,  G11C7/08 ,  G11C11/406 ,  G11C11/4074 ,  G11C11/4091 ,  G11C2207/065 ,  H01L27/0207 ,  H01L27/10894

摘要： A sense amplifier capable of performing high-speed data sense operation with lower power consumption using a minuscule signal from a memory cell even in a case where a memory array voltage is reduced. A plurality of drive switches for over-driving are distributively arranged in a sense amplifier area, and a plurality of drive switches for restore operation are concentratively disposed at one end of a row of the sense amplifiers. A potential for over-driving is supplied using a meshed power line circuit. Through the use of the drive switches for over-driving, initial sense operation can be performed on data line pairs with a voltage having an amplitude larger than a data-line amplitude, allowing implementation of high-speed sense operation. The distributed arrangement of the drive switched for over-driving makes it possible to dispersively supply current in sense operation, thereby reducing a difference in sense voltage with respect to far and near positions of the sense amplifiers.

摘要翻译： 一种读出放大器即使在存储器阵列电压降低的情况下，也能够使用来自存储单元的微小信号，以较低的功耗进行高速数据检测操作。 用于过驱动的多个驱动开关被分布地布置在感测放大器区域中，并且用于恢复操作的多个驱动开关被集中地布置在一行的读出放大器的一端。 使用网状电力线电路提供过驱动的可能性。 通过使用用于过驱动的驱动开关，可以利用具有大于数据线幅度的电压的数据线对执行初始感测操作，从而实现高速感测操作。 驱动器的分布布置使得用于过驱动的驱动器能够在感测操作中分散地提供电流，从而减小感测放大器的远和近位置的感测电压的差异。

公开(公告)号：US07200061B2

公开(公告)日：2007-04-03

申请号：US10534049

申请日：2002-11-08

申请人： Tomonori Sekiguchi ,  Shinichi Miyatake ,  Takeshi Sakata ,  Riichiro Takemura ,  Hiromasa Noda ,  Kazuhiko Kajigaya

发明人： Tomonori Sekiguchi ,  Shinichi Miyatake ,  Takeshi Sakata ,  Riichiro Takemura ,  Hiromasa Noda ,  Kazuhiko Kajigaya

IPC分类号： G11C7/02

CPC分类号： G11C7/062 ,  G11C5/063 ,  G11C7/065 ,  G11C7/08 ,  G11C7/1078 ,  G11C7/1096 ,  G11C7/12 ,  G11C7/18 ,  G11C8/08 ,  G11C11/4087 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4096 ,  G11C11/4097 ,  G11C29/1201 ,  G11C2207/002 ,  G11C2207/005 ,  H01L27/0207 ,  H01L27/10814 ,  H01L27/10882 ,  H01L27/10897

摘要： A direct sense amplifier of the present invention incorporates and isolates: an MOS transistor serving as a differential pair and having a gate connected to a bit line; and an MOS transistor controlled by a column select line wired between RLIO lines in a bit-line direction, and further connects a source of the MOS transistor serving as the differential pair to a common source line wired in the word-line direction. Since the direct sense amplifier only in a select map is activated by the column select line and the common source line during an read operation, power consumption is significantly reduced during the read operation. Also, since a parasitic capacitance of the MOS transistor serving as the differential pair is separated from the local IO line, a load capacity of the local IO line is reduced and the read operation is speeded up. In addition, during the read operation, a data pattern dependency of the load capacity of the local IO line is reduced and a post-manufacture test is easily made.