MAGNETIC MEMORY
    81.
    发明申请

    公开(公告)号:US20210159397A1

    公开(公告)日:2021-05-27

    申请号:US17165309

    申请日:2021-02-02

    Abstract: A magnetic memory including a plurality of magnetoresistance effect elements that hold information, each including a first ferromagnetic metal layer with a fixed magnetization direction, a second ferromagnetic metal layer with a varying magnetization direction, and a non-magnetic layer sandwiched between the first and second ferromagnetic metal layers; a plurality of first control elements that control reading of the information, wherein each of the plurality of first ferromagnetic metal layers is connected to a first control element; a plurality of spin-orbit torque wiring lines that extend in a second direction intersecting with a first direction which is a stacking direction of the magnetoresistance effect elements, wherein each of the second ferromagnetic metal layers is joined to one spin-orbit torque wiring line; a plurality of second control elements that control electric current flowing through the spin-orbit torque wiring lines.

    MAGNETORESISTIVE EFFECT ELEMENT AND MAGNETIC MEMORY

    公开(公告)号:US20210151667A1

    公开(公告)日:2021-05-20

    申请号:US16952274

    申请日:2020-11-19

    Abstract: A magnetoresistive effect element includes a magnetization fixed layer, a magnetization free layer, and a non-magnetic spacer layer that is stacked between the magnetization fixed layer and the magnetization free layer. The magnetization free layer includes a first free layer and a second free layer that are formed of a ferromagnetic material, and a magnetic coupling layer that is stacked between the first free layer and the second free layer. The first free layer and the second free layer are magnetically coupled to each other by exchange coupling via the magnetic coupling layer such that magnetization directions of the first free layer and the second free layer are antiparallel to each other. The magnetic coupling layer is a non-magnetic layer that includes Ir and at least one of the following elements: Fe, Co and Ni.

    MULTIPLY AND ACCUMULATE CALCULATION DEVICE, NEUROMORPHIC DEVICE, AND METHOD FOR USING MULTIPLY AND ACCUMULATE CALCULATION DEVICE

    公开(公告)号:US20200334015A1

    公开(公告)日:2020-10-22

    申请号:US16759529

    申请日:2019-02-27

    Abstract: A multiply and accumulate calculation device includes a multiple calculation unit and a accumulate calculation unit. The multiple calculation unit includes a plurality of multiple calculation elements, which are variable resistance elements, and at least one reference element. The accumulate calculation unit includes an output detector configured to detect a total value of at least outputs from the plurality of multiple calculation elements. Each of the plurality of multiple calculation elements is a magnetoresistance effect element including a magnetized free layer having a magnetic domain wall, a magnetization fixed layer in which a magnetization direction is fixed, and a nonmagnetic layer sandwiched between the magnetized free layer and the magnetized fixed layer. The reference element is a reference magnetoresistance effect element having a magnetization free layer that does not have the magnetic domain wall.

    MAGNETORESISTANCE EFFECT ELEMENT
    85.
    发明申请

    公开(公告)号:US20200161539A1

    公开(公告)日:2020-05-21

    申请号:US16748884

    申请日:2020-01-22

    Inventor: Tomoyuki SASAKI

    Abstract: A magnetoresistance effect element is provided in which a MR ratio is not likely to decrease even at a high bias voltage. A magnetoresistance effect element according to an aspect of the present invention includes: a first ferromagnetic metal layer; a second ferromagnetic metal layer; a tunnel barrier layer that is provided between the first ferromagnetic metal layer and the second ferromagnetic metal layer, in which the tunnel barrier layer is formed of a non-magnetic oxide having a cubic crystal structure represented by a compositional formula A1-xA′xO, where A represents a divalent cation, and A′ represents a trivalent cation, and the number of A ions is more than the number ofA′ ions in a primitive lattice of the crystal structure.

    MAGNETORESISTIVE EFFECT ELEMENT, MAGNETIC MEMORY, MAGNETIZATION ROTATION METHOD, AND SPIN CURRENT MAGNETIZATION ROTATIONAL ELEMENT

    公开(公告)号:US20200083439A1

    公开(公告)日:2020-03-12

    申请号:US16671567

    申请日:2019-11-01

    Inventor: Tomoyuki SASAKI

    Abstract: This spin current magnetization rotational type magnetoresistive element includes a magnetoresistive effect element having a first ferromagnetic metal layer having a fixed magnetization orientation, a second ferromagnetic metal layer having a variable magnetization orientation, and a non-magnetic layer sandwiched between the first ferromagnetic metal layer and the second ferromagnetic metal layer, and spin-orbit torque wiring which extends in a direction that intersects the stacking direction of the magnetoresistive effect element, and is connected to the second ferromagnetic metal layer, wherein the electric current that flows through the magnetoresistive effect element and the electric current that flows through the spin-orbit torque wiring merge or are distributed in the portion where the magnetoresistive effect element and the spin-orbit torque wiring are connected.

    MAGNETORESISTANCE EFFECT ELEMENT
    88.
    发明申请

    公开(公告)号:US20200035913A1

    公开(公告)日:2020-01-30

    申请号:US16504388

    申请日:2019-07-08

    Abstract: A magnetoresistance effect element includes a first ferromagnetic layer, a second ferromagnetic layer, and a tunnel barrier layer that is interposed between the first ferromagnetic layer and the second ferromagnetic layer. The tunnel barrier layer is a stacked body including one or more high-barrier-height layers and one or more low-barrier-height layers, the one or more high-barrier-height layers having a relatively high barrier height with respect to the one or more low-barrier-height layers and the one or more low-barrier-height layers having a relatively low barrier height with respect to the one or more high-barrier-height layers. A minimum difference of barrier height between the one or more high-barrier-height layers and the one or more low-barrier-height layers is equal to or higher than 0.5 eV.

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