Abstract:
Methods and systems for the quantitative and qualitative determination of one or more exogenous substances within a material are described. A flow of fluorescence-exciting/ablative energy (e.g., laser pulse(s), preferably in the ultraviolet region (e.g. 193-nm)), is directed onto the material to ablate a thin layer (e.g. null0.3-nullm) of the material using photochemical decomposition. Simultaneously, the laser energy induces the fluorescence of the substance(s) of interest within the ablated layer of the material. The fluorescence emitted by the substance(s) of interest is then received by a device (e.g., a spectrometer), which measures the spectrum (i.e. intensity versus wavelength) of the received fluorescence. The fluorescence spectra are then transmitted to a spectral processing device (e.g., a microprocessor or computer) which is programmed or otherwise adapted to determine, on the basis of the fluorescence spectra, whether the substance(s) of interest is/are present in the material and/or the concentration at which the substance(s) of interest is/are present in the material. This process may be repeated for each layer of the material to determine the concentration gradient of the substance(s) of interest in the material.
Abstract:
An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus includes a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light illuminates the illumination region. Additionally, the apparatus includes an image collecting device adapted to selectively collect images of either a first signal when the illumination source is illuminating the illumination region, or a second signal absent illumination of the illumination region. The first signal has wavelengths effectively different from the wavelengths of the portion of the light emitted by the LEDs that illuminates the illumination region.
Abstract:
An method and device for inspecting for surface defects, internal defects, and surface-adhered foreign matter on semitransparent materials. An illuminating device transmits light, that is then collimated through a collimating lens unit, through an object to be inspected. The light then transmits through the object to be inspected an eventually is detected by a detector. Any defects in the object to be inspected will be detected.
Abstract:
An optical illuminator assembly for an analytical instrument, such as a clinical hematology or a flow cytometer instrument, including a laser diode having a diverging laser beam output, a collimating lens to collimate the diverging laser beam, a spatial filter operating on the collimated laser beam to spatially filter the beam, and a focussing lens to focus the spatially filtered beam into a flow cell containing particles suspended in a moving stream. A beam shaping aperture is preferably inserted between the spatial filter and the focussing lens to shape the laser beam. The spatial filter preferably includes an objective lens, a collimating lens, and a filter aperture interposed between the objective and imaging lenses. The filter aperture is preferably rectangular, having a height to width ratio in the range of 1:2 to 1:3 such that each dimension is on the order of tens of micrometers. The beam shaping aperture is preferably a rectangular aperture having a height to width ratio in a range of from 3:1 to 5:1 such that each dimension is on the order of hundreds of micrometers.
Abstract:
A surface plasmon resonance sensor is provided, which comprises: a substrate; an adaptation layer disposed on the substrate and comprising a dielectric material; and a metal layer disposed on the adaptation layer, wherein the metal layer has a grating structure comprising plural metal lines. Furthermore, a surface plasmon resonance sensing instrument comprising the same and a method for detecting an analyte using the same are also provided.
Abstract:
A method for determining a presence of at least one guest structure at a host structure. The method comprises a light-sensitive system receiving light from the host structure. The host structure hosts one or more optically active entities at at least one part of the host structure. The at least one part does not host the at least one guest structure. Furthermore, the optically active entities cause light emission from the at least one part. The method also comprises the light-sensitive system outputting a signal based on the received light a step of determining a light value based on the output signal. The light value indicates an amount of light from the host structure incident on the light-sensitive system. The method also comprises determining on the basis of the light value at least one of a quantity and a position of the at least one guest structure.
Abstract:
A spectroscopy system comprises a tunable laser including a gain chip, a collimating lens for collimating light from the gain chip, an end reflector, a focusing lens for focusing the collimated light on the end reflector, a thin film bandpass filter between the collimating lens and the focusing lens, and an angle control actuator for changing the angle of the thin film filter to the collimated light. The light from the laser is coupled into a sample cell providing a sample. An amplitude detector detects light from the tunable laser prior to passing into the sample cell and a sample detector detecting light from the tunable laser after passing through the sample cell. A processor controls the angle control actuator and monitors a time response of the sample detector and the amplitude detector to resolve an absorption spectra of the sample.
Abstract:
The present invention relates to an inspection apparatus and an inspection method which selectively adjust a numerical aperture of illuminating light in the form of collimated light when inspecting a target object, such as a wafer or the like, using a spectrum, thereby preventing a diffraction phenomenon caused by the illuminating light. The inspection apparatus may include: a camera unit disposed above a target object; an illumination unit configured to illuminate the target object with illuminating light; and a light detection unit configured to detect reflection light of the target object illuminated with the illuminating light, wherein the illumination unit comprises a numerical aperture adjustment device which has a first optical member having a first numerical aperture that is replaceable with a second optical member having a second numerical aperture different from the first numerical aperture so as to reduce a diffraction phenomenon caused by the illuminating light.
Abstract:
A turbidity sensor featuring a signal processor or processing module configured to: receive signaling containing information about light reflected off suspended matter in a liquid and sensed by a linear sensor array having rows and columns of optical elements; and determine corresponding signaling containing information about a concentration of turbidity of the liquid, based upon the signaling received.
Abstract:
One pixel unit including at least one light receiving element of a light receiving element array (photodiode array) and a light source have a one-to-one correspondence, and only when the light source emits light, the light beam is detected by at least one light receiving element (one pixel unit) corresponding to the light source. An illumination optical system includes a light guiding means for guiding to an inspection object by reducing an interval between optical axes of light beams emitted from a plurality of light sources in an arrangement direction of a plurality of the light sources.