Abstract:
In an A/D converter, a ramp unit generates a reference signal that increases or decreases over time. A comparison unit starts a comparison process of comparing an analog signal to the reference signal at a timing related to input of the analog signal and ends the comparison process at a timing at which the reference signal satisfies a predetermined condition with respect to the analog signal. A VCO includes a plurality of delay units having the same configuration and starts a transition process at a timing related to the start of the comparison process. A count unit counts a clock from the VCO. A low-order latch unit latches a low-order logic state, which is a logic state of the plurality of delay units, at a first timing related to the end of the comparison process. A high-order latch unit latches a high-order logic state.
Abstract:
Disclosed is a solid-state imaging device capable of calculating the difference in charge obtained by photoelectric conversion, and capable of a high level of integration. A solid-state imaging device is provided with an AD converter which is provided with: a first comparator which outputs a signal corresponding to a first analog signal of a first pixel by comparing said first analog signal with a reference voltage supplied from the reference voltage generation unit which generates a reference voltage which gradually changes; a second comparator which outputs a signal corresponding to a second analog signal of a second pixel by comparing said second analog signal with the reference voltage supplied by the reference voltage generation unit; a difference circuit which finds the difference between the signal corresponding to said first analog signal and the signal corresponding to said second analog signal and outputs a difference signal; and a counter circuit which counts the number of pulses in a pulse sequence corresponding to the aforementioned difference signal and converts said difference signal into a digital signal.
Abstract:
A circuit configured to output a ramp signal having a potential varying depending on time includes a voltage supply unit configured to supply a plurality of voltages having different amplitudes, a current supply unit, an integration circuit configured to output the ramp signal, and a capacitive element. The voltage supply unit is connected to one terminal of the capacitive element. The integration circuit and the current supply unit are connected to another terminal of the capacitive element.
Abstract:
Methods for reading a data location coupled to an electrical conductor. A counter receives a signal from an analog-to-digital converter coupled to the electrical conductor. The counter produces two or more counts, and in some embodiments, the counts are based in part on a variable reference voltage. An interfuser may be coupled to an output of the counter. The interfuser receives the two or more counts from the counter and reads data conveyed by the data location based on the two or more counts.
Abstract:
A method of analog to digital voltage conversion including: generating a quadratic signal based on an analog time varying reference signal; generating a ramp signal based on the quadratic signal; and converting an analog input voltage to a digital output value based on a time duration determined by a comparison of the analog input voltage with the ramp signal.
Abstract:
The charge-to-digital timer apparatus and method disclosed herein estimates the elapsed time between two signals, e.g., a start signal and a stop signal. To that end, at least a capacitive load is charged with a known current to generate a load voltage. Subsequently, a first voltage is ramped in a plurality of discrete voltage steps associated with a plurality of known capacitances until the ramped voltage satisfies a predetermined criterion relative to a second voltage. The elapsed time is determined from the discrete voltage steps, one of the first and second voltages, the known current, and the known capacitive load.
Abstract:
A solid-state imaging device and an imaging apparatus are provided. The solid-state imaging device performs an AD conversion in a column parallel for an analog pixel signal outputted from each of pixels disposed in a two-dimensional matrix shape. The solid-state imaging device includes: an AD conversion unit including a plurality of pixel signal accumulating units; a first switching unit for disconnecting parallel connection of a second pixel signal accumulating unit other than a first pixel signal accumulating unit which is one of the plurality of pixel signal accumulating units; and a second switching unit for connecting the second pixel signal accumulating unit to a pixel signal line of a second pixel adjacent to the first pixel in a row direction, when parallel connection of the second pixel signal accumulating unit is disconnected by the first switching unit.
Abstract:
In an A/D conversion circuit and an imaging device, an upper counter acquires a first upper count value by performing counting using one output signal, which constitutes a first lower phase signal output from a delay circuit, as a count clock. After values of bits constituting the first upper count value are inverted, the upper counter acquires a second upper count value by performing counting using one output signal, which constitutes a second lower phase signal output from the delay circuit, as a count clock, and further performing counting based on an upper count clock output from a lower counter. A modification unit modifies a logic state of a count clock to a predetermined state when the count clock of the upper counter is switched.
Abstract:
An ADC includes an analog signal input port for receiving analog signals, a reference voltage generation circuit for producing a reference voltage, a controllable switch, a control unit including a counter, an integral circuit, and a comparison circuit. The control unit outputs an on or off signal to turn on or turn off the controllable switch, the counter starts to count when the control unit outputs the off signal. The integral circuit executes an integral action to integrate the reference voltage and output a voltage enhanced gradually when the controllable switch is turned off. The comparison circuit outputs an interrupt signal to cause the counter to stop counting when comparing the voltage output by the integral circuit is higher than the voltage of the analog signals. The control unit determines a digital value corresponding to the analog signals according to a count value of counted by the counter.
Abstract:
In a double data rate (DDR) counter and counting method used in, for example, an analog-to-digital conversion in, for example, a CMOS image sensor and method, a first stage of the counter generates a least significant bit (LSB) of the value in the counter. The counter includes at least one second stage for generating another bit of the value in the counter. An input clock signal is applied to a data input of the first stage and a clock input of the second stage.