摘要:
Systems and methods for determining adjustable wafer acceptance criteria based on chip characteristics. The method includes measuring a density of at least one chip. The method further includes computing a difference in density between the density of the at least one chip and a density of at least one kerf structure. The method further includes calculating an offset value to modify a Wafer Acceptance Criteria (WAC) to match the density difference between the at least one chip and the at least one kerf structure. The method further includes applying the offset value to the WAC for a wafer level measurement in order to increase chip yield performance.
摘要:
Structures and methods for implementing alternating power gating in integrated circuits. A semiconductor structure includes a power gated circuit including a group of power gate switches and an alternating enable generator that generates enabling signals. Each respective one of the power gate switches is enabled by a respective one of the enabling signals. The alternating generator generates the enabling signals such that a first enabled power gate switch is alternated amongst the group of power gate switches.
摘要:
Systems and methods for determining adjustable wafer acceptance criteria based on chip characteristics. The method includes measuring a density of at least one chip. The method further includes computing a difference in density between the density of the at least one chip and a density of at least one kerf structure. The method further includes calculating an offset value to modify a Wafer Acceptance Criteria (WAC) to match the density difference between the at least one chip and the at least one kerf structure. The method further includes applying the offset value to the WAC for a wafer level measurement in order to increase chip yield performance.
摘要:
An apparatus for protecting an integrated circuit from electrostatic discharge (ESD) includes an RC trigger device configured between a pair of power rails, a first control path coupled to the RC trigger device, and a second control path coupled to the RC trigger device. A power clamp is configured between the power rails for discharging current from an ESD event, the power clamp having an input coupled to outputs of the first and second control paths, the power clamp independently controllable by the first and second control paths. The first and second control paths are further configured to prevent the power clamp from reactivating following an initial deactivation of the power clamp.
摘要:
Disclosed are embodiments of memory circuit having two discrete memory devices with two discrete memory arrays that store essentially identical data banks. The first device is a conventional memory adapted to perform all maintenance operations that require read functions (i.e., all update and refresh operations). The second device is a DRAM-based CAM device adapted to perform parallel search and overwrite operations only. Performance of overwrite operations by the second device occurs in conjunction with performance of maintenance operations by the first device so that corresponding memory cells in the two devices store essentially identical data values. Since the data banks in the memory devices are essentially identical and since maintenance and parallel search operations are not performed by the same device, the parallel search operations can be performed without interruption. Also disclosed are embodiments of an associated design structure and method.
摘要:
A method of and service for optimizing an integrated circuit design to improve manufacturing yield. The invention uses manufacturing data and algorithms to identify areas with high probability of failures, i.e. critical areas. The invention further changes the layout of the circuit design to reduce critical area thereby reducing the probability of a fault occurring during manufacturing. Methods of identifying critical area include common run, geometry mapping, and Voronoi diagrams. Optimization includes but is not limited to incremental movement and adjustment of shape dimensions until optimization objectives are achieved and critical area is reduced.
摘要:
An integrated circuit that includes at least one tunneling device voltage detection circuit for generating a trigger flag signal. The tunneling device voltage detection circuit includes first and second voltage dividers receiving a supply voltage and having corresponding respective first and second internal node output voltages. The first and second voltage dividers are configured so the first output voltage is linear relative to the supply voltage and so that the second output voltage is nonlinear relative to the supply voltage. As the supply voltage ramps up, the profiles of the first and second output voltage cross at a particular voltage. An operational amplifier circuit senses when the first and second output voltages become equal and, in response thereto, outputs a trigger signal that indicates that the supply voltage has reached a certain level.
摘要:
A variable digital delay line with an insertion delay as low as a single delay element yet capable of providing a large programmable delay with a small simple control mechanism. A loop connects an input to an output through selectable first delay elements such as 2:1 muxes and selectable second delay elements such as pairs of inverters by way of a plurality of intermediate nodes having a tap. A plurality of sneak paths are available wherein the loop by passes a remainder of first delay elements and/or second delay elements by way of the taps at the intermediate nodes.
摘要:
A delay line, in accordance with the invention, includes a plurality of delay elements connecting an input and an output, the delay elements for causing a delay to be introduced to a signal passing through the delay elements. A voltage device is included for regulating power to the plurality of delay elements, the voltage device being adjustable to provide at least one predetermined voltage to the delay elements such that the delay in the delay elements is modified according to the predetermined voltage(s). The delay line may be employed in a delay locked loop, a clock circuit or other circuits.
摘要:
A circuit and method are provided wherein a receiver receives an input train of pulses. The circuit includes a delay-locked-loop coupled to an output of the receiver. The delay-locked-loop includes a pulse generator responsive to received input train of pulses produced at the output of the receiver for producing first pulses in response to the leading edges of the received input train of pulses and second pulses in response to the trailing edges of received input train of pulses. The leading edge of the first pulse has the same edge type as the leading edge of the second pulse (i.e., the leading edge of the first pulse and the leading edge of the second pulse are either both rising edge types or both falling edges types). The first pulses and the second pulses are combined into a composite input signal comprising the first and second pulses with the leading edge of the first pulse maintaining the same edge type. The delay-locked-loop also includes a variable delay line fed by the composite input signal for producing a composite output train of pulses comprising both the first train of pulses and the second train of pulses after a selected time delay provided by the delay line. The delay-locked-loop is responsive to one of the first train of pulses and the second train of pulses in the composite output train of pulses for selecting the time delay of the variable delay line so as to produce the composite output train of pulses with a predetermined phase relationship to the input train of pulses.