Coating installation
    1.
    发明申请
    Coating installation 审中-公开
    涂装安装

    公开(公告)号:US20050145487A1

    公开(公告)日:2005-07-07

    申请号:US10511389

    申请日:2003-04-11

    IPC分类号: C25B9/00 H01J37/34

    CPC分类号: H01J37/34 H01J37/3447

    摘要: The invention relates to a coating installation comprising a recipient (1) which is divided into a cathode side (3) and a substrate side (4) by means of a screen (2). The cathode side (3) and the substrate side (4) respectively have a direct extraction outlet (10, 16) and a gas admission (8, 14). The gas admission (8) on the cathode side (3) is connected to a process gas source (9) and the gas admission (14) for the substrate side (4) is connected to a reactive gas source (15).

    摘要翻译: 本发明涉及一种涂层装置,其包括借助于屏幕(2)被分为阴极侧(3)和基板侧(4)的接收器(1)。 阴极侧(3)和基板侧(4)分别具有直接提取出口(10,16)和气体入口(8,14)。 阴极侧(3)上的气体进入(8)连接到处理气体源(9),并且用于基板侧(4)的气体进入(14)连接到反应气体源(15)。

    Method and device for magnetron sputtering
    3.
    发明申请
    Method and device for magnetron sputtering 失效
    磁控溅射的方法和装置

    公开(公告)号:US20070158177A1

    公开(公告)日:2007-07-12

    申请号:US10583124

    申请日:2004-11-29

    IPC分类号: C23C14/00 C23C14/32

    摘要: The invention relates to a magnetron coating system, comprising a first coating source, an auxiliary substrate, a magnetron and means for determining the area density of the auxiliary substrate. The auxiliary substrate is thereby arranged between the first coating source and the area that is provided to receive the substrate to be coated, and forms a cathode for the magnetron. The invention further relates to a method for depositing thin layers, in which a layer is deposited on an auxiliary substrate by means of a first coating source and this auxiliary substrate is used as a cathode for coating a substrate by means of a magnetron and the area density of the auxiliary substrate is determined.

    摘要翻译: 本发明涉及一种磁控管涂覆系统,包括第一涂层源,辅助衬底,磁控管以及用于确定辅助衬底的面积密度的装置。 因此,辅助基板被布置在第一涂覆源和被设置为接收待涂覆的基板的区域之间,并且形成用于磁控管的阴极。 本发明还涉及一种用于沉积薄层的方法,其中通过第一涂层源将层沉积在辅助衬底上,并且该辅助衬底用作通过磁控管涂覆衬底的阴极和区域 确定辅助基板的密度。

    Method for regulating sputtering processes
    5.
    发明授权
    Method for regulating sputtering processes 失效
    溅射工艺调节方法

    公开(公告)号:US06797128B1

    公开(公告)日:2004-09-28

    申请号:US10148099

    申请日:2002-07-29

    IPC分类号: C23C1434

    CPC分类号: H01J37/32935 C23C14/0042

    摘要: The invention relates to a method for regulating MF or HF sputtering processes, a harmonic analysis of the electrical discharge parameters being implemented and the MF or HF output and/or the reactive gas flow being regulated on the basis of the analysis results.

    摘要翻译: 本发明涉及一种用于调节MF或HF溅射工艺的方法,正在实施的放电参数的谐波分析和MF或HF输出和/或基于分析结果调节的反应气流。

    Glass product
    6.
    发明授权
    Glass product 有权
    玻璃制品

    公开(公告)号:US08557390B2

    公开(公告)日:2013-10-15

    申请号:US12997231

    申请日:2009-06-09

    IPC分类号: B32B17/06

    摘要: The present invention relates to a glass product, comprising a glass substrate with a transparent and conductive indium tin oxide layer having a covering layer, which forms a redox barrier for the indium tin oxide layer, wherein the indium tin oxide layer is obtained by pulsed, highly ionizing high-power magnetron sputtering (HPPMS) in which—the pulses of the magnetron have a peak power density greater than 1.5 kW/cm2,—the pulses of the magnetron have a time duration that is ≦200 μs, and—the mean current flow density rise upon ignition of the plasma within a time interval that is ≦0.025 ms is at least 106 Λ(ms cm2), and the indium tin oxide layer has a crystalline structure, in such a way that the (222)-reflection of an X-ray diffraction spectrum after the production of the indium tin oxide layer is shifted relative to the powder spectrum of indium tin oxide by a maximum of 1 degree, preferably by 0.3 degrees to 0.5 degrees, in the direction of compressive stress and is shifted after heat treatment by a maximum of 1 degree, preferably by 0.2 degrees to 0.4 degrees, in the direction of the powder spectrum.

    摘要翻译: 玻璃制品技术领域本发明涉及一种玻璃制品,其包括具有透明导电性铟锡氧化物层的玻璃基板,其具有覆盖层,其形成用于氧化铟锡层的氧化还原屏障,其中所述氧化铟锡层通过脉冲, 高电离大功率磁控溅射(HPPMS),其中磁控管的脉冲具有大于1.5kW / cm 2的峰值功率密度,磁控管的脉冲持续时间为200微米,平均值为 在0.025ms的时间间隔内等离子体点燃时的电流流动密度上升至少为106λ(mscm 2),并且氧化铟锡层具有晶体结构,使得(222) - 反射 在氧化铟锡层的制造之后的X射线衍射光谱相对于氧化铟锡的粉末光谱在压缩应力方向上偏移最多为1度,优选为0.3度至0.5度,并且为 转移了 在粉末光谱的方向上进行最多1度,优选0.2度至0.4度的热处理。

    MAGNETRON COATING MODULE AND MAGNETRON COATING METHOD
    8.
    发明申请
    MAGNETRON COATING MODULE AND MAGNETRON COATING METHOD 审中-公开
    MAGNETRON涂层模块和MAGNETRON涂层方法

    公开(公告)号:US20120097529A1

    公开(公告)日:2012-04-26

    申请号:US13138810

    申请日:2010-03-25

    IPC分类号: C23C14/35

    摘要: The invention relates to a new basic technology for magnetron sputtering of ceramic layers, in particular for optical applications. The new concept enables the construction of magnetron sputtering sources which, in comparison with the known methods, such as reactive DC-, MF- or RF magnetron sputtering or the magnetron sputtering of ceramic targets, enables significantly improved precision in the deposition of ceramic layers at an exactly defined rate and homogeneity and also with very good reproducibility.

    摘要翻译: 本发明涉及用于陶瓷层的磁控溅射的新的基本技术,特别是用于光学应用。 新概念使得能够构建磁控溅射源,与已知方法相比,诸如反应型DC-,MF-或RF磁控溅射或陶瓷靶的磁控溅射,可以显着提高陶瓷层沉积精度 精确定义的速率和均匀性,并具有非常好的重现性。

    GLASS PRODUCT
    9.
    发明申请
    GLASS PRODUCT 有权
    玻璃制品

    公开(公告)号:US20110223415A1

    公开(公告)日:2011-09-15

    申请号:US12997231

    申请日:2009-06-09

    IPC分类号: B32B5/00 B32B17/06 B32B9/04

    摘要: The present invention relates to a glass product, comprising a glass substrate with a transparent and conductive indium tin oxide layer having a covering layer, which forms a redox barrier for the indium tin oxide layer, wherein the indium tin oxide layer is obtained by pulsed, highly ionizing high-power magnetron sputtering (HPPMS) in which—the pulses of the magnetron have a peak power density greater than 1.5 kW/cm2, —the pulses of the magnetron have a time duration that is ≦200 μs, and—the mean current flow density rise upon ignition of the plasma within a time interval that is ≦0.025 ms is at least 106 Λ(ms cm2), and the indium tin oxide layer has a crystalline structure, in such a way that the (222)-reflection of an X-ray diffraction spectrum after the production of the indium tin oxide layer is shifted relative to the powder spectrum of indium tin oxide by a maximum of 1 degree, preferably by 0.3 degrees to 0.5 degrees, in the direction of compressive stress and is shifted after heat treatment by a maximum of 1 degree, preferably by 0.2 degrees to 0.4 degrees, in the direction of the powder spectrum.

    摘要翻译: 玻璃制品技术领域本发明涉及一种玻璃制品,其包括具有透明导电性铟锡氧化物层的玻璃基板,其具有覆盖层,其形成用于氧化铟锡层的氧化还原屏障,其中所述氧化铟锡层通过脉冲, 高电离大功率磁控溅射(HPPMS),其中磁控管的脉冲具有大于1.5kW / cm 2的峰值功率密度,磁控管的脉冲具有的时间长度为200微秒,而 - 在等离子体点火之后的平均电流流动密度上升为0.025ms至少为106Λ(mscm 2),并且氧化铟锡层具有晶体结构,使得(222) 在制造铟锡氧化物层之后的X射线衍射光谱的反射相对于氧化铟锡的粉末光谱在压缩应力方向上偏移最多1度,优选0.3度至0.5度 和我 在粉末光谱的方向上热处理后最多移动1度,优选0.2度至0.4度。