摘要:
A delay-locked loop (DLL) which receives a reference clock signal and outputs an output clock signal is provided. The DLL includes a phase detector, a delay chain, an anti-false lock (AFL) circuit, and a loop filter. The phase detector outputs a first comparison signal according to a phase comparison between the reference clock signal and the output clock signal. The delay chain generates a plurality of strobe clock signals and the output clock signal by delaying the reference clock signal for different intervals. The AFL circuit outputs a second comparison signal according to a phase comparison between the reference clock signal and the strobe clock signals. The loop filter controls the delay time of the output clock signal according to the first and the second comparison signals in order to lock the delay time of the output clock signal at a preset value.
摘要:
Methods and apparatus to preventing mold feeder jams in a system to package integrated circuits. An example method includes detecting if a mold compound tablet has a first alignment on a path and removing the mold compound tablet from the path if the mold compound tablet has a second alignment different from the first alignment.
摘要:
A method for forming a multi-level semiconductor device to eliminate conductive interconnect protrusions following a WAT test, the method including forming a first metallization layer; carrying out a wafer acceptance testing (WAT) process; and, then carrying out a chemical mechanical polish (CMP) on the metallization layer.
摘要:
A fiber container receiving optical fibers has a body, a space defined in the body, a reel disposed inside the body, wherein a groove is defined around the periphery of the reel. The optical fibers are twisted around the reel and received in the groove. Furthermore, the fiber container is able to apply to the active/passive optical communication device, such as an erbium doped fiber amplifier (EDFA) or a dense wavelength division multiplexer (DWDM).
摘要:
A method of forming a resistor is described which achieves improved resistor stability and voltage coefficient of resistance. A resistor is formed from a conducting material such as doped silicon or polysilicon. The resistor has a rectangular first, second, third, fourth, and fifth resistor elements. A layer of protective dielectric is formed over the first, second, and third resistor elements leaving the fourth and fifth resistor elements exposed. The conducting material in the exposed fourth and fifth resistor elements is then changed to a silicide to form low resistance contacts between the second and fourth resistor elements and between the second and fourth resistor elements. The second and third resistor elements are wider than the first resistor element and provide a low resistance contacts to the first resistor element. This provides a low voltage coefficient of resistance and thermal process stability for the resistor.
摘要:
A first metal plug is formed in the first layer of dielectric. A freestanding second metal plug is created that aligns with and makes contact with the first metal plug, extending the first metal plug. The second metal plug is surrounded by an opening that has been created in layers of etch stop and dielectric. A layer of capacitor dielectric is deposited over the exposed surfaces of the first and second metal plugs and the inside surfaces of the opening that surrounds the second plug. A layer of metal is created over the capacitor dielectric inside the opening in the layers of etch stop and dielectric.
摘要:
A three-dimensional integrated circuit (3DIC) including a top chip having at least one active device and an interposer having conductive routing layers and vias. The 3DIC further includes a plurality of conductive connectors configured to electrically connect the top chip and the interposer. The 3DIC further includes a conductive line over at least one of the top chip or the interposer. The conductive line traces a perimeter of top chip or interposer parallel to an outer edge of the top chip or interposer. The conductive line is configured to electrically connect the conductive connectors. The 3DIC further includes at least one testing element over at least one of the top chip or the interposer. The testing element is configured to electrically connect to the plurality of conductive connectors.
摘要:
A semiconductor memory storage device includes first and second doped regions of a first type disposed in a semiconductor substrate. The first and second doped regions of the first type being laterally spaced from one another. A gate dielectric extends over the semiconductor substrate between the first and second doped regions, and a floating gate is disposed on the gate dielectric. An ultraviolet (UV) light blocking material is vertically disposed above the floating gate and has a size that covers the floating gate such that the floating gate remains electrically charged after the semiconductor memory storage device is exposed to UV light.
摘要:
A three-dimensional integrated circuit (3DIC) including a top chip having at least one active device and an interposer having conductive routing layers and vias. The 3DIC further includes a plurality of conductive connectors configured to electrically connect the top chip and the interposer. The 3DIC further includes a conductive line over at least one of the top chip or the interposer. The conductive line traces a perimeter of top chip or interposer parallel to an outer edge of the top chip or interposer. The conductive line is configured to electrically connect the conductive connectors. The 3DIC further includes at least one testing element over at least one of the top chip or the interposer. The testing element is configured to electrically connect to the plurality of conductive connectors.
摘要:
A passive interposer apparatus with a shielded through silicon via (TSV) configuration is disclosed. The apparatus includes a p-doped substrate, wherein at least an upper portion of the p-doped substrate is heavily p-doped. An interlayer dielectric layer (ILD) is disposed over the upper portion of the p-doped substrate. A plurality of through silicon vias (TSVs) are formed through the ILD and the p-doped substrate. A plurality of shielding lines disposed between the TSVs electrically couple respective second metal contact pads to the upper portion of the p-doped substrate.