Electrical bypass structure for MEMS device
    1.
    发明授权
    Electrical bypass structure for MEMS device 有权
    MEMS器件的电气旁路结构

    公开(公告)号:US08878312B2

    公开(公告)日:2014-11-04

    申请号:US13195243

    申请日:2011-08-01

    IPC分类号: H01L29/84 B81C1/00

    摘要: An apparatus including a bypass structure for complementary metal-oxide-semiconductor (CMOS) and/or microelectromechanical system (MEMS) devices, and method for fabricating such apparatus, is disclosed. An exemplary apparatus includes a first substrate; a second substrate that includes a MEMS device; an insulator disposed between the first substrate and the second substrate; and an electrical bypass structure disposed in the insulator layer that contacts a portion of the first substrate, wherein the electrical bypass structure is electrically isolated from the MEMS device in the second substrate and any device included in the first substrate.

    摘要翻译: 公开了一种包括用于互补金属氧化物半导体(CMOS)和/或微机电系统(MEMS)器件)的旁路结构的装置及其制造方法。 示例性装置包括第一基板; 包括MEMS器件的第二衬底; 设置在所述第一基板和所述第二基板之间的绝缘体; 以及设置在所述绝缘体层中的电旁路结构,其接触所述第一衬底的一部分,其中所述电旁路结构与所述第二衬底中的所述MEMS器件和所述第一衬底中包括的任何器件电隔离。

    MRAM cells and circuit for programming the same
    4.
    发明授权
    MRAM cells and circuit for programming the same 有权
    MRAM单元和电路编程相同

    公开(公告)号:US08451655B2

    公开(公告)日:2013-05-28

    申请号:US13364955

    申请日:2012-02-02

    IPC分类号: G11C11/00

    CPC分类号: G11C11/1677 G11C11/1675

    摘要: A circuit includes magneto-resistive random access memory (MRAM) cell and a control circuit. The control circuit is electrically coupled to the MRAM cell, and includes a current source configured to provide a first writing pulse to write a value into the MRAM cell, and a read circuit configured to measure a status of the MRAM cell. The control circuit is further configured to verify whether a successful writing is achieved through the first writing pulse.

    摘要翻译: 电路包括磁阻随机存取存储器(MRAM)单元和控制电路。 控制电路电耦合到MRAM单元,并且包括被配置为提供第一写入脉冲以将值写入MRAM单元的电流源和被配置为测量MRAM单元的状态的读取电路。 控制电路还被配置为验证通过第一写入脉冲是否实现了成功写入。

    ELECTRICAL BYPASS STRUCTURE FOR MEMS DEVICE
    5.
    发明申请
    ELECTRICAL BYPASS STRUCTURE FOR MEMS DEVICE 有权
    用于MEMS器件的电子旁路结构

    公开(公告)号:US20120223613A1

    公开(公告)日:2012-09-06

    申请号:US13195243

    申请日:2011-08-01

    IPC分类号: H02N11/00 H05K3/36

    摘要: An apparatus including a bypass structure for complementary metal-oxide-semiconductor (CMOS) and/or microelectromechanical system (MEMS) devices, and method for fabricating such apparatus, is disclosed. An exemplary apparatus includes a first substrate; a second substrate that includes a MEMS device; an insulator disposed between the first substrate and the second substrate; and an electrical bypass structure disposed in the insulator layer that contacts a portion of the first substrate, wherein the electrical bypass structure is electrically isolated from the MEMS device in the second substrate and any device included in the first substrate.

    摘要翻译: 公开了一种包括用于互补金属氧化物半导体(CMOS)和/或微机电系统(MEMS)器件)的旁路结构的装置及其制造方法。 示例性装置包括第一基板; 包括MEMS器件的第二衬底; 设置在所述第一基板和所述第二基板之间的绝缘体; 以及设置在所述绝缘体层中的电旁路结构,其接触所述第一衬底的一部分,其中所述电旁路结构与所述第二衬底中的所述MEMS器件和所述第一衬底中包括的任何器件电隔离。

    MRAM Cells and Circuit for Programming the Same
    7.
    发明申请
    MRAM Cells and Circuit for Programming the Same 有权
    MRAM单元及其编程电路

    公开(公告)号:US20120127788A1

    公开(公告)日:2012-05-24

    申请号:US13364955

    申请日:2012-02-02

    IPC分类号: G11C11/16

    CPC分类号: G11C11/1677 G11C11/1675

    摘要: A circuit includes magneto-resistive random access memory (MRAM) cell and a control circuit. The control circuit is electrically coupled to the MRAM cell, and includes a current source configured to provide a first writing pulse to write a value into the MRAM cell, and a read circuit configured to measure a status of the MRAM cell. The control circuit is further configured to verify whether a successful writing is achieved through the first writing pulse.

    摘要翻译: 电路包括磁阻随机存取存储器(MRAM)单元和控制电路。 控制电路电耦合到MRAM单元,并且包括被配置为提供第一写入脉冲以将值写入MRAM单元的电流源和被配置为测量MRAM单元的状态的读取电路。 控制电路还被配置为验证通过第一写入脉冲是否实现了成功写入。