SEMICONDUCTOR STRUCTURE WITH IMPROVED CAPACITANCE OF BIT LINE
    1.
    发明申请
    SEMICONDUCTOR STRUCTURE WITH IMPROVED CAPACITANCE OF BIT LINE 有权
    具有改进位线电容的半导体结构

    公开(公告)号:US20140054535A1

    公开(公告)日:2014-02-27

    申请号:US13594353

    申请日:2012-08-24

    IPC分类号: H01L47/00

    摘要: A semiconductor structure with improved capacitance of bit lines includes a substrate, a stacked memory structure, a plurality of bit lines, a first stair contact structure, a first group of transistor structures and a first conductive line. The first stair contact structure is formed on the substrate and includes conductive planes and insulating planes stacked alternately. The conductive planes are separated from each other by the insulating planes for connecting the bit lines to the stacked memory structure by stairs. The first group of transistor structures is formed in a first bulk area where the bit lines pass through and then connect to the conductive planes. The first group of transistor structures has a first gate around the first bulk area. The first conductive line is connected to the first gate to control the voltage applied to the first gate.

    摘要翻译: 具有改善的位线电容的半导体结构包括衬底,堆叠存储器结构,多个位线,第一阶梯接触结构,第一组晶体管结构和第一导电线。 第一阶梯接触结构形成在基板上,并且包括交替堆叠的导电平面和绝缘面。 导电平面通过用于通过楼梯将位线连接到堆叠的存储器结构的绝缘平面彼此分离。 第一组晶体管结构形成在第一体积区域中,其中位线通过,然后连接到导电平面。 第一组晶体管结构在第一体积区域周围具有第一栅极。 第一导线连接到第一栅极以控制施加到第一栅极的电压。

    Integrated Circuit Capacitor and Method
    2.
    发明申请
    Integrated Circuit Capacitor and Method 有权
    集成电路电容器和方法

    公开(公告)号:US20130277799A1

    公开(公告)日:2013-10-24

    申请号:US13451428

    申请日:2012-04-19

    IPC分类号: H01L29/92 H01L21/02

    CPC分类号: H01L28/91

    摘要: An example of a capacitor includes a series of ridges and trenches and an interconnect region on the integrated circuit substrate. The series of ridges and trenches and the interconnect region have a capacitor foundation surface with a serpentine cross-sectional shape on the series of ridges and trenches. Electrical conductors are electrically connected to the electrode layers from the interconnect region for access to the electrode layers of the capacitor assembly.

    摘要翻译: 电容器的示例包括集成电路基板上的一系列脊和沟槽和互连区域。 一系列脊和沟槽和互连区域具有在一系列脊和沟槽上具有蛇形横截面形状的电容器基座表面。 电导体从互连区域电连接到电极层,用于进入电容器组件的电极层。

    Self-aligned structure and method for confining a melting point in a resistor random access memory
    4.
    发明授权
    Self-aligned structure and method for confining a melting point in a resistor random access memory 有权
    用于将熔点限制在电阻随机存取存储器中的自对准结构和方法

    公开(公告)号:US08243494B2

    公开(公告)日:2012-08-14

    申请号:US12235773

    申请日:2008-09-23

    IPC分类号: G11C16/02 H01L29/417

    摘要: A process in the manufacturing of a resistor random access memory with a confined melting area for switching a phase change in the programmable resistive memory. The process initially formed a pillar comprising a substrate body, a first conductive material overlying the substrate body, a programmable resistive memory material overlying the first conductive material, a high selective material overlying the programmable resistive memory material, and a silicon nitride material overlying the high selective material. The high selective material in the pillar is isotropically etched on both sides of the high selective material to create a void on each side of the high selective material with a reduced length. A programmable resistive memory material is deposited in a confined area previously occupied by the reduced length of the poly, and the programmable resistive memory material is deposited into an area previously occupied by the silicon nitride material.

    摘要翻译: 制造具有用于切换可编程电阻存储器中的相位变化的限定熔化区域的电阻器随机存取存储器的过程。 该工艺最初形成了一个支柱,该支柱包括衬底主体,覆盖衬底主体的第一导电材料,覆盖第一导电材料的可编程电阻性存储器材料,覆盖在可编程电阻性存储器材料上的高选择性材料, 选择性材料。 柱中的高选择性材料在高选择性材料的两侧进行各向同性蚀刻,以在长度较小的高选择性材料的每侧产生空隙。 可编程电阻式存储器材料沉积在先前由多晶硅长度减小的限制区域中,并且可编程电阻式存储器材料沉积到先前由氮化硅材料占据的区域中。

    Resistor random access memory cell device
    5.
    发明授权
    Resistor random access memory cell device 有权
    电阻随机存取存储单元器件

    公开(公告)号:US08178405B2

    公开(公告)日:2012-05-15

    申请号:US12755897

    申请日:2010-04-07

    IPC分类号: H01L21/8242

    摘要: A memory cell device has a bottom electrode and a top electrode, a plug of memory material in contact with the bottom electrode, and a cup-shaped conductive member having a rim that contacts the top electrode and an opening in the bottom that contacts the memory material. Accordingly, the conductive path in the memory cells passes from the top electrode through the conductive cup-shaped member, and through the plug of phase change material to the bottom electrode. Also, methods for making the memory cell device include steps of forming a bottom electrode island including an insulative element and a stop element over a bottom electrode, forming a separation layer surrounding the island, removing the stop element to form a hole over the insulative element in the separation layer, forming a conductive film in the hole and an insulative liner over conductive film, etching to form a cup-shaped conductive film having a rim and to form an opening through the insulative liner and the bottom of the cup-shaped conductive film to the surface of the bottom electrode, forming a plug of phase change memory material in the opening, and forming a top electrode in contact with the rim of the cup-shaped conductive film.

    摘要翻译: 存储单元装置具有底部电极和顶部电极,与底部电极接触的存储器材料的插头以及具有接触顶部电极的边缘和接触存储器的底部开口的杯形导电构件 材料。 因此,存储单元中的导电路径从顶部电极通过导电杯状构件,并通过相变材料的塞子到达底部电极。 此外,用于制造存储单元器件的方法包括在底部电极上形成包括绝缘元件和止动元件的底部电极岛的步骤,形成围绕岛的分离层,去除止动元件以在绝缘元件上方形成孔 在分离层中,在孔中形成导电膜,在导电膜上形成绝缘衬垫,进行蚀刻以形成具有边缘的杯形导电膜,并且通过绝缘衬垫和杯状导电体的底部形成开口 在底部电极的表面形成薄膜,在开口中形成相变记忆材料塞,形成与杯状导电膜的边缘接触的顶部电极。

    RESISTIVE RANDOM ACCESS MEMORY AND METHOD FOR MANUFACTURING THE SAME
    6.
    发明申请
    RESISTIVE RANDOM ACCESS MEMORY AND METHOD FOR MANUFACTURING THE SAME 有权
    电阻随机存取存储器及其制造方法

    公开(公告)号:US20120108031A1

    公开(公告)日:2012-05-03

    申请号:US13346935

    申请日:2012-01-10

    IPC分类号: H01L21/02

    摘要: A resistive random access memory including, an insulating layer, a hard mask layer, a bottom electrode, a memory cell and a top electrode is provided. The insulating layer is disposed on the bottom electrode. The insulating layer has a contact hole having a first width. The hard mask layer has an opening. A portion of the memory cell is exposed from the opening and has a second width smaller than the first width. The top electrode is disposed on the insulating layer and is coupled with the memory cell.

    摘要翻译: 提供了包括绝缘层,硬掩模层,底电极,存储单元和顶电极的电阻随机存取存储器。 绝缘层设置在底部电极上。 绝缘层具有第一宽度的接触孔。 硬掩模层具有开口。 存储单元的一部分从开口露出并且具有小于第一宽度的第二宽度。 顶部电极设置在绝缘层上并与存储单元耦合。

    Dual-gate, sonos, non-volatile memory cells and arrays thereof
    9.
    发明授权
    Dual-gate, sonos, non-volatile memory cells and arrays thereof 有权
    双栅极,超声波,非易失性存储单元及其阵列

    公开(公告)号:US07973366B2

    公开(公告)日:2011-07-05

    申请号:US11352788

    申请日:2006-02-13

    IPC分类号: H01L29/792

    摘要: Memory cells which include a semiconductor substrate having a source region and a drain region separated by a channel region; a charge-trapping structure disposed above the channel region of the semiconductor substrate; a first gate disposed above the charge-trapping structure and proximate to the source region; and a second gate disposed above the charge-trapping structure and proximate to the drain region; where the first gate and the second gate are separated by a first nanospace are provided, along with arrays including a plurality of such cells, methods of manufacturing such cells and methods of operating such cells.

    摘要翻译: 存储单元,其包括具有由沟道区域分离的源极区域和漏极区域的半导体衬底; 电荷捕获结构,设置在所述半导体衬底的沟道区之上; 设置在电荷捕获结构上方并靠近源极区的第一栅极; 以及第二栅极,其设置在所述电荷捕获结构的上方并且靠近所述漏极区; 提供了第一栅极和第二栅极被第一纳米级分隔开的区域,以及包括多个这样的电池的阵列,制造这种电池的方法以及操作这种电池的方法。

    Memory device manufacturing method
    10.
    发明授权
    Memory device manufacturing method 有权
    存储器件制造方法

    公开(公告)号:US07972893B2

    公开(公告)日:2011-07-05

    申请号:US12469184

    申请日:2009-05-20

    IPC分类号: H01L21/00

    摘要: A method for making a memory device includes providing a dielectric material, having first and second upwardly and inwardly tapering surfaces and a surface segment connecting the first and second surfaces. First and second electrodes are formed over the first and second surfaces. A memory element is formed over the surface segment to electrically connect the first and second electrodes.

    摘要翻译: 制造存储器件的方法包括提供具有第一和第二向上和向内渐缩的表面的电介质材料以及连接第一和第二表面的表面段。 第一和第二电极形成在第一和第二表面上。 存储元件形成在表面段上以电连接第一和第二电极。