Abstract:
Provided are a polarizer and a liquid crystal display (LCD) in which wire grid polarizers are formed on a thin film transistor substrate and a color filter substrate, respectively, so that it is possible to reduce fabrication cost and the number of processes and decrease the thickness of the LCD. An LCD includes a thin film transistor substrate, a color filter substrate opposite to the thin film transistor substrate, and a liquid crystal layer positioned between the thin film transistor substrate and the color filter substrate. In the LCD, wire grid polarizing patterns are formed on the thin film transistor substrate and the color filter substrate, respectively.
Abstract:
A via forming method is provided. The via forming method includes: forming via-holes in a substrate; putting the substrate having the via-holes in a first solution to fill the via-holes with the first solution; sinking the metal particles into the via-holes by supplying a second solution containing metal particles to the first solution, in which there is the substrate; and performing a first curing process of heat-treating the substrate having the via-holes filled with the metal particles so as to form vias in the via-holes. Further, a method of manufacturing a multi-chip package using the via forming method is provided.
Abstract:
A complementary metal-oxide semiconductor (CMOS)-based planar type avalanche photo diode (APD) using a silicon epitaxial layer and a method of manufacturing the APD, the photo diode including: a substrate; a well layer of a first conductivity type formed in the substrate; an avalanche embedded junction formed in the well layer of the first conductivity type by low energy ion implantation; the silicon epitaxial layer formed in the avalanche embedded junction; a doping area of a second conductivity type opposite to the first conductive type, formed from a portion of a surface of the well layer of the first conductivity type in the avalanche embedded junction and forming a p-n junction; positive and negative electrodes formed on the doping area of the second conductivity type and the well layer of the first conductivity type separated from the doping area of the second conductivity type, respectively; and an oxide layer formed on an overall surface excluding a window where the positive and negative electrodes are formed.
Abstract:
An RFID tag includes: an antenna receiving an RF signal from a reader; an AFE (analog front end) generating voltage using the RF signal; and one or more switches interposed between the antenna and the AFE and controlling the connection between the antenna and the AFE through the switch operation.
Abstract:
An RFID tag includes: an antenna receiving an RF signal from a reader; an AFE (analog front end) generating voltage using the RF signal; and one or more switches interposed between the antenna and the AFE and controlling the connection between the antenna and the AFE through the switch operation.
Abstract:
An organic light emitting diode (OLED) and a method for manufacturing the same are provided. In the OLED, patterned metal electrodes are positioned on one or more of upper and lower portions of a light emission layer to allow light generated from the light emission layer to emit to an area between the patterned metal electrodes.
Abstract:
Provided is a radio frequency identification (RFID) tag whose data can be stably read at a long distance on the basis of a passive RFID tag. The RFID tag includes a rechargeable unit charged to a predetermined voltage, and a power source including a direct current (DC) power source including a rectifier for converting an RF signal into DC power and a regulator for supplying a predetermined DC voltage, an interceptor disposed between the rechargeable unit and the DC power source to connecting or disconnecting the power to the rechargeable unit, and an overvoltage preventor connected to an output terminal of the DC power source in parallel.
Abstract:
Provided is a method of fabricating a T-type gate including the steps of: forming a first photoresist layer, a blocking layer and a second photoresist layer to a predetermined thickness on a substrate, respectively; forming a body pattern of a T-type gate on the second photoresist layer and the blocking layer; exposing a predetermined portion of the second photoresist layer to form a head pattern of the T-type gate, and performing a heat treatment process to generate cross linking at a predetermined region of the second photoresist layer except for the head pattern of the T-type gate; performing an exposure process on an entire surface of the resultant structure, and then removing the exposed portion; and forming a metal layer of a predetermined thickness on an entire surface of the resultant structure, and then removing the first photoresist layer, the blocking layer, the predetermined region of the second photoresist layer in which the cross linking are generated, and the metal layer, whereby it is possible to readily perform a compound semiconductor device manufacturing process, and to reduce manufacturing cost by means of the increase of manufacturing yield and the simplification of manufacturing processes.
Abstract:
Capacitor and method for fabricating the same, which can simplify a fabrication process and reduce parasitic capacitances between signal lines, the capacitor including a first insulating layer formed on a substrate, a bitline patterned on the first insulating layer, a second insulating layer formed on the bitline, a first electrode formed on the second insulating layer with slopes at both sides, a dielectric film formed on the first electrode, a node contact formed on one side of the first electrode and in contact with the substrate, and a second electrode formed on the dielectric film and connected with the node contact electrically, and the method including the steps of (1) forming a first insulating layer on a substrate, and patterning a bitline on the first insulating layer, (2) forming a second insulating layer on an entire surface inclusive of the bitline, (3) depositing a first conductive material on the second insulating layer, (4) etching the first conductive material to form a first electrode with a sloped etch surface, (5) depositing a dielectric film on the first electrode, (6) etching the second insulating layer and the first insulating layer in succession to form a contact hole exposing the substrate, (7) depositing and etching a second conductive in the contact hole, to form a node contact, and (8) depositing and etching a third conductive material on the node contact, to form a second electrode.
Abstract:
A complementary metal-oxide semiconductor (CMOS)-based planar type avalanche photo diode (APD) using a silicon epitaxial layer and a method of manufacturing the APD, the photo diode including: a substrate; a well layer of a first conductivity type formed in the substrate; an avalanche embedded junction formed in the well layer of the first conductivity type by low energy ion implantation; the silicon epitaxial layer formed in the avalanche embedded junction; a doping area of a second conductivity type opposite to the first conductive type, formed from a portion of a surface of the well layer of the first conductivity type in the avalanche embedded junction and forming a p-n junction; positive and negative electrodes formed on the doping area of the second conductivity type and the well layer of the first conductivity type separated from the doping area of the second conductivity type, respectively; and an oxide layer formed on an overall surface excluding a window where the positive and negative electrodes are formed.