Abstract:
An environmental cell for use with a scanning probe microscope includes a cell chamber, a probe mounted to the cell chamber, a puck selectively connected to the cell chamber, a sample holder selectively inserted in the puck, and a translation mechanism coupled to the sample holder to move the sample holder. Gasses or liquids may be introduced to the environmental cell through channels formed in either the puck, sample holder, or cell chamber.
Abstract:
The scanning probe microscope translation apparatus includes a scanning probe microscope for examining a specimen, with a specimen stage for mounting the specimen for examination by the scanning probe microscope, and a first translator mounted to the scanning probe microscope for translating the specimen stage relative to the scanning probe microscope. A support frame is dimensioned and adapted to be mounted in a specimen chamber of a scanning electron microscope, and a second translator is provided for scanning the scanning probe microscope relative to the support frame. The second translator is mounted on dual mass plates provided for isolating the scanning probe microscope from external vibrations, and suspension device are provided for suspending the mass plates from the support frame. A vacuum load lock system permits moving the scanning probe microscope, specimen stage, first translator, and mounting assembly into and out of the vacuum of the scanning electron microscope vacuum chamber.
Abstract:
The electromechanical translation apparatus includes a translation drive assembly having front and rear drive leg members coupled together with central extension piezoelectric members, and piezoelectric clamping members which clamp the drive leg members between opposing bearing members of a lower base. The translation drive assembly may directly carry an object for precise positioning of the object, or may carry an upper movable base which in turn may be translated along an axis perpendicular to the direction of movement along the lower base, so that an object placed upon the upper movable base can be precisely positioned.
Abstract:
A high density computer memory which utilizes a probe operating with two degrees of freedom over a memory area, the probe location altered by drive systems incorporating piezoelectric elements arranged to drive the probe parallel to the plane of the memory surface. Sensors to provide an indication of the location of the probe independent of the drive system are provided. The memory system incorporates an underlying substrate upon which is deposited one of a variety of elements or compounds chosen to effect a change in physical-chemical properties when a data bit is written on the surface. The probe is moved over the surface at a distance which produces a current from Schottky or Field effect.
Abstract:
An easy to assemble portable floating hot tub for use in even cold and turbulent water includes an inflatable pontoon, an insulated liner peripherally connected to the pontoon and defining hot tub fill volume, and flexible members extending from the pontoon under the liner such that the weight of the liner filled with water is supported partly by the flexible members. A floor made of rigid spaced apart and parallel slats can be rolled up with the flexible liner and deflated pontoon. A collapsible frame made of connected rigid members may be provided in or outside of the liner. The pontoon is placed on the body of water and inflated. Filling the internal volume defined by the insulated liner with water causes it to descend below the pontoon. A portable heater having a heating capacity of at least 30,000 BTUs rapidly heats up the water within the hot tub. The system components can be transported in carry bags of less than 100 pounds and deployed by one person in an extremely small space, such as on a boat.
Abstract:
A scanning probe microscope that is easy to use, inexpensive to manufacture, has a fast scan rate, and has a broad range of applications. The oscillating sensor has a high resonance frequency. Because an oscillator is used, alignment of a laser is not required. Further, probe approach and scanning can be achieved at much faster rates.
Abstract:
As in prior testers, a capacitive cell in which material is placed to be tested is connected in a voltage divider circuit. However, signal generating means connected to the voltage divider applies voltages at different predetermined frequencies selected for the material being tested, and frequency selective means connected to the cell develop voltages at the applied frequencies having values dependent on the impedance of the filled cell at the respective frequencies. These voltages developed across the cell are applied to a computer that provides an output according to an equation that has been derived statistically from many samples of the material being tested for the substance or quality of the material being measured.
Abstract:
The scanning thermal probe microscope measures a thermal parameter such as thermal conductivity or temperature of surface contours of a specimen with a thermal sensor maintained in thermal communication with the surface of the specimen and maintained at a temperature different than that of the specimen. The thermal sensor is disposed on the free end of a cantilever arm in thermal communication with the probe. A thermal feedback bridge circuit can maintain the thermal sensor at a constant temperature by heating or cooling the sensor, and provides a signal for determining the heat transfer between the probe and the specimen. The cantilever arm includes first and second legs of electrically conductive material, and the thermal sensor comprises a narrowed portion of the conducting material having a relatively high temperature coefficient of resistance.
Abstract:
The synchronous sampling scanning force microscope includes a reflective cantilever arm having a free end which is oscillated at a frequency different from the resonance frequency of the cantilever arm. The motion of the oscillating cantilever arm is measured, to generate a deflection signal indicative of the amplitude of deflection or phase shift of the cantilever arm. Selected portions of cycles of the output signal are sampled, for generating output signal data indicative of deflection of the near and far excursions of the probe. The method and apparatus permit monitoring of compliance of the surface of the specimen by multiple sampling at a rate greater than the period of oscillation of the cantilever probe of the microscope.
Abstract:
The electromechanical translation apparatus includes a translation drive assembly driven by front and rear piezoelectric clamping members coupled together with central extension piezoelectric members, which negotiate an elongated stationary channel. The translation drive assembly may directly carry an object for precise linear positioning in one dimension, or may carry a movable channel which in turn may be translated along an axis perpendicular to the direction of the stationary channel, so that an object placed upon the movable channel can be precisely positioned in two dimensions.