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    APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE
    3.
    发明申请
    APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE 有权
    用于监控玻璃板抛光状态的装置和方法

    公开(公告)号：US20110223834A1

    公开(公告)日：2011-09-15

    申请号：US13045273

    申请日：2011-03-10

    申请人： Won-Jae MOON ,  Hyung-Young Oh ,  Dae-Yeon Lee ,  Jae-Ik Song ,  Young-Kuk Kim ,  Kyu-Chul Chung ,  Hyun-Chul Chung

    发明人： Won-Jae MOON ,  Hyung-Young Oh ,  Dae-Yeon Lee ,  Jae-Ik Song ,  Young-Kuk Kim ,  Kyu-Chul Chung ,  Hyun-Chul Chung

    IPC分类号： B24B49/10

    CPC分类号： B24B49/10 ,  B24B7/24 ,  B24B13/015

    摘要： Disclosed are an apparatus and a method for monitoring a glass plate polishing state. The apparatus may include a location measuring unit for measuring a location on a glass plate being polished by a polishing machine, a current measuring unit for measuring an electric current flowing into the polishing machine, a memory unit for storing a reference value of the electric current flowing into the polishing machine for each polishing location of the glass plate, and a control unit for determining whether a polishing state is faulty, by comparing a value of the electric current measured by the current measuring unit for each polishing location measured by the location measuring unit with a corresponding reference value of the electric current stored in the memory unit for each polishing location.

    摘要翻译： 公开了一种用于监测玻璃板研磨状态的装置和方法。 该装置可以包括位置测量单元，用于测量由抛光机抛光的玻璃板上的位置，用于测量流入抛光机的电流的电流测量单元，用于存储电流参考值的存储单元 流入玻璃板的每个抛光位置的抛光机，以及用于通过比较由测量位置测量的每个抛光位置由当前测量单元测量的电流的值来确定抛光状态是否有故障的控制单元 单元，其具有针对每个抛光位置存储在存储器单元中的对应的电流参考值。

    PROBE CARD AND TEST APPARATUS INCLUDING THE SAME
    4.
    发明申请
    PROBE CARD AND TEST APPARATUS INCLUDING THE SAME 有权
    探针卡和测试装置，包括它们

    公开(公告)号：US20110121852A1

    公开(公告)日：2011-05-26

    申请号：US12817826

    申请日：2010-06-17

    申请人： Hideki Horii ,  Young-kuk Kim ,  Mi-lim Park

    发明人： Hideki Horii ,  Young-kuk Kim ,  Mi-lim Park

    IPC分类号： G01R31/02 ,  G01R13/34 ,  G01R31/00

    CPC分类号： G01R31/2889

    摘要： A probe card and a test apparatus including the probe card for improving test reliability. The probe card may include a first input terminal Microelectromechanical Systems (MEMS) switch that connects a first input terminal and a first input probe pin, wherein the first input terminal MEMS switch comprises a control portion that receives an operation signal and a connection portion that connects the first input terminal and the first input probe pin. The probe card may further include a first output terminal MEMS switch that connects a first output terminal and a first output probe pin, wherein the first output terminal MEMS switch comprises a control portion that receives the operation signal and a connection portion that connects the first output terminal and the first output probe pin.

    摘要翻译： 探针卡和测试装置，包括用于提高测试可靠性的探针卡。 探针卡可以包括连接第一输入端和第一输入探针的第一输入端微机电系统（MEMS）开关，其中第一输入端MEMS开关包括接收操作信号的控制部分和连接 第一输入端和第一输入探针。 探针卡还可以包括连接第一输出端和第一输出探针的第一输出端MEMS开关，其中第一输出端MEMS开关包括接收操作信号的控制部分和连接第一输出端 端子和第一个输出探针。

    Apparatus and method for managing layout of a window
    5.
    发明授权
    Apparatus and method for managing layout of a window 有权
    用于管理窗口布局的装置和方法

    公开(公告)号：US07783989B2

    公开(公告)日：2010-08-24

    申请号：US11670178

    申请日：2007-02-01

    申请人： Young-kuk Kim ,  Sung-min Yoon

    发明人： Young-kuk Kim ,  Sung-min Yoon

    IPC分类号： G06F15/00 ,  G06F13/00

    CPC分类号： G09G5/14 ,  G09G2340/04 ,  G09G2340/0471 ,  G09G2340/0478

    摘要： An apparatus and method for managing the layout of a window is provided. The apparatus includes a display unit that displays the window on a screen; the screen is divided into a plurality of display areas; a pointer-position-checking unit that checks the coordinate position of a pointer moved by a user and determines the one display area corresponding to the position of the checked pointer; and a window-size-adjusting unit that moves the window to the one display area where the pointer is positioned and adjusts the size of the window in proportion to the size of the one display area.

    摘要翻译： 提供了一种用于管理窗口布局的装置和方法。 该装置包括在屏幕上显示窗口的显示单元; 屏幕被分成多个显示区域; 指针位置检查单元，其检查由用户移动的指针的坐标位置，并确定与所检查指针的位置对应的一个显示区域; 以及窗口尺寸调整单元，其将窗口移动到指示器所在的一个显示区域，并且与一个显示区域的大小成比例地调整窗口的大小。

    Recording medium, method of configuring control information thereof, recording and/or reproducing method using the same, and apparatus thereof
    6.
    发明授权
    Recording medium, method of configuring control information thereof, recording and/or reproducing method using the same, and apparatus thereof 有权
    记录介质，配置其控制信息的方法，使用其的记录和/或再现方法及其装置

    公开(公告)号：US07486600B2

    公开(公告)日：2009-02-03

    申请号：US10883668

    申请日：2004-07-06

    申请人： Jin Yong Kim ,  Young Kuk Kim

    发明人： Jin Yong Kim ,  Young Kuk Kim

    IPC分类号： G11B7/24

    CPC分类号： G11B7/00736 ,  G11B7/00456 ,  G11B2007/0013

    摘要： The present invention provides a record media, and more particularly, to a method of recording disc identification information within a management area of a recordable optical disc and an optical disc recording/reproducing method using the same. In recording optical disc identification information within a disc management area, the present invention includes recording a media type identification information identifying a type of a record media of an optical disc and a disc manufacturer identification information identifying a manufacturer of the optical disc, respectively. Accordingly, the present invention provides various specified methods of recording disc identification information within a management area in a high-density optical disc, thereby enabling to efficiently cope with the recording/reproducing of the optical disc using the recorded identification information.

    摘要翻译： 本发明提供了一种记录介质，更具体地说，涉及在可记录光盘的管理区域内记录盘识别信息的方法和使用其的光盘记录/再现方法。 在光盘管理区域内记录光盘识别信息时，本发明包括分别记录识别光盘的记录介质的类型的介质类型识别信息和识别光盘制造商的盘制造商标识信息。 因此，本发明提供了在高密度光盘的管理区域内记录盘识别信息的各种指定方法，从而能够使用记录的识别信息有效地应对光盘的记录/再现。

    SEMICONDUCTOR DEVICES HAVING SELF-ALIGNED CONTACT PADS AND METHODS OF MANUFACTURING THE SAME
    8.
    发明申请
    SEMICONDUCTOR DEVICES HAVING SELF-ALIGNED CONTACT PADS AND METHODS OF MANUFACTURING THE SAME 有权
    具有自对准接触垫的半导体器件及其制造方法

    公开(公告)号：US20150311276A1

    公开(公告)日：2015-10-29

    申请号：US14529500

    申请日：2014-10-31

    申请人： YOUNG-KUK KIM ,  Ki-Vin Im ,  Han-Jin Lim ,  In-Seak Hwang

    发明人： YOUNG-KUK KIM ,  Ki-Vin Im ,  Han-Jin Lim ,  In-Seak Hwang

    IPC分类号： H01L49/02 ,  H01L21/8234

    CPC分类号： H01L27/10823 ,  H01L21/823437 ,  H01L21/823475 ,  H01L27/10808 ,  H01L27/10855 ,  H01L27/10885 ,  H01L28/60 ,  H01L29/4236 ,  H01L29/42364 ,  H01L29/7827

    摘要： A semiconductor device includes a substrate having a field area that defines active areas, gate trenches in the substrate and extending in a first direction, a buried gate in a respective gate trench, gate capping fences in a respective gate trench over a respective buried gate, the gate capping fences protruding from top surfaces of the active areas and extending in the first direction, bit line trenches in the gate capping fences, a respective bit line trench crossing the gate capping fences and extending in a second direction perpendicular to the first direction, an insulator structure on inner walls of a respective bit line trench, bit lines and bit line capping patterns stacked on the insulator structures in a respective bit line trench, contact pads self-aligned with the gate capping fences and on the substrate between the adjacent bit lines, and a lower electrode of a capacitor on a respective contact pad.

    摘要翻译： 半导体器件包括具有限定有源区域的场区域的衬底，衬底中的栅极沟槽和沿第一方向延伸的衬底，相应栅极沟槽中的掩埋栅极，在相应的掩埋栅极上的相应栅极沟槽中的栅极栅极栅极， 所述栅极覆盖栅栏从所述有源区域的顶表面突出并且沿所述第一方向延伸，所述栅极覆盖栅栏中的位线沟槽跨过所述栅极覆盖栅栏并沿垂直于所述第一方向的第二方向延伸的相应位线沟槽， 相应位线沟槽的内壁上的绝缘体结构，堆叠在相应位线沟槽中的绝缘体结构上的位线和位线封接图案，与栅极覆盖栅栏自对准的接触焊盘和相邻位之间的衬底上的绝缘体结构 线路和相应接触焊盘上的电容器的下电极。

    Apparatus and method for monitoring glass plate polishing state
    9.
    发明授权
    Apparatus and method for monitoring glass plate polishing state 有权
    监控玻璃板抛光状态的装置和方法

    公开(公告)号：US09028294B2

    公开(公告)日：2015-05-12

    申请号：US13045273

    申请日：2011-03-10

    申请人： Won-Jae Moon ,  Hyung-Young Oh ,  Dae-Yeon Lee ,  Jae-Ik Song ,  Young-Kuk Kim ,  Kyu-Chul Chung ,  Hyun-Chul Chung

    发明人： Won-Jae Moon ,  Hyung-Young Oh ,  Dae-Yeon Lee ,  Jae-Ik Song ,  Young-Kuk Kim ,  Kyu-Chul Chung ,  Hyun-Chul Chung

    IPC分类号： B24B49/00 ,  B24B49/10 ,  B24B7/24 ,  B24B13/015

    CPC分类号： B24B49/10 ,  B24B7/24 ,  B24B13/015

    摘要： Disclosed are an apparatus and a method for monitoring a glass plate polishing state. The apparatus may include a location measuring unit for measuring a location on a glass plate being polished by a polishing machine, a current measuring unit for measuring an electric current flowing into the polishing machine, a memory unit for storing a reference value of the electric current flowing into the polishing machine for each polishing location of the glass plate, and a control unit for determining whether a polishing state is faulty, by comparing a value of the electric current measured by the current measuring unit for each polishing location measured by the location measuring unit with a corresponding reference value of the electric current stored in the memory unit for each polishing location.

    摘要翻译： 公开了一种用于监测玻璃板研磨状态的装置和方法。 该装置可以包括位置测量单元，用于测量由抛光机抛光的玻璃板上的位置，用于测量流入抛光机的电流的电流测量单元，用于存储电流参考值的存储单元 流入玻璃板的每个抛光位置的抛光机，以及用于通过比较由测量位置测量的每个抛光位置由当前测量单元测量的电流的值来确定抛光状态是否有故障的控制单元 单元，其具有针对每个抛光位置存储在存储器单元中的对应的电流参考值。