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1.发明申请Fuel System for Lithographic Apparatus, EUV Source, Lithographic Apparatus and Fuel Filtering Method 有权用于平版印刷设备的燃料系统，EUV源，平版印刷设备和燃料过滤方法公开(公告)号：US20150070675A1
公开(公告)日：2015-03-12
申请号：US14388742
申请日：2013-02-06
Applicant: ASML Netherlands B.V.
CPC classification number: H05G2/006 , G03F7/70033 , H05G2/001 , H05G2/005 , H05G2/008 , Y10T137/0318 , Y10T137/794
Abstract: A fuel supply for an EUV radiation source is disclosed. The fuel supply comprises a reservoir (40) for retaining a volume of fuel (42), a nozzle (32), in fluid connection with the reservoir, and configured to direct a stream of fuel along a trajectory towards a plasma formation location, and a fuel contamination control arrangement (44) which separates contamination particles from the fuel. The contamination control arrangement comprises at least one acoustic filter. The acoustic filter may apply an acoustic standing wave to the fuel. Also disclosed is a method of controlling contamination in such a fuel supply.
Abstract translation: 公开了用于EUV辐射源的燃料供应。 燃料供应包括用于保持一定体积的燃料（42）的储存器（40），与储存器流体连接的喷嘴（32），并且构造成沿着等离子体形成位置的轨迹引导燃料流;以及 燃料污染控制装置（44），其将污染颗粒与燃料分离。 污染控制装置包括至少一个声学滤波器。 声学滤波器可以将声驻波应用于燃料。 还公开了一种控制这种燃料供应中的污染物的方法。
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公开(公告)号：US11237491B2
公开(公告)日：2022-02-01
申请号：US17048834
申请日：2019-04-10
Applicant: ASML Netherlands B.V.
Inventor： Ramon Mark Hofstra , Andrey Sergeevich Tychkov , Francois Charles Dominique Deneuville , Gerardus Hubertus Petrus Maria Swinkels , Petrus Adrianus Theodorus Maria Ruijs
Abstract: A system comprises a reflective optical element with a reflective surface that is configured to reflect a radiation beam. The reflective optical element also has a body. The system includes a thermal conditioning mechanism operative to thermally induce a deformation of the body under control of a controller. By means of controllably deforming the body, the shape of the reflective surface can be adjusted in a controlled manner.
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公开(公告)号：US09841680B2
公开(公告)日：2017-12-12
申请号：US14781262
申请日：2014-03-05
Applicant: ASML Netherlands B.V.
Inventor： Niek Antonius Jacobus Maria Kleemans , Denis Alexandrovich Glushkov , Ronald Johannes Hultermans , Benedictus Mathijs Renkens , Gerardus Hubertus Petrus Maria Swinkels , Christiaan Johannes Petrus Verspeek
CPC classification number: G03F7/70033 , H05G2/003 , H05G2/008
Abstract: A source collector apparatus for use in a lithographic apparatus includes a fuel droplet generator configured in use to generate a stream of fuel droplets directed from an outlet of the fuel droplet generator towards a plasma formation location. In order to prevent droplet satellites from interfering with plasma formation, a gas supply is provided that in use provides a flow of gas (e.g., hydrogen) that deflects any droplet satellites out of the fuel droplet stream. Additionally, a detection apparatus may be provided as part of a shroud to determine the point at which coalescence of fuel droplets occurs thereby providing an indication of the likelihood of satellite droplets being present in the fuel droplet stream.
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4.发明申请SOURCE-COLLECTOR DEVICE, LITHOGRAPHIC APPARATUS, AND DEVICE MANUFACTURING METHOD 有权源收集器件，光刻设备和器件制造方法公开(公告)号：US20140375974A1
公开(公告)日：2014-12-25
申请号：US14372950
申请日：2013-01-10
Applicant: ASML Netherlands B.V.
Inventor： Andrei Mikhailovich Yakunin , Vadim Yevgenyevich Banine , Johannes Hubertus Josephina Moors , Jan Bernard Plechelmus Van Schoot , Martinus Cornelis Maria Verhagen , Olav Waldemar Vladimir Frijns , Vladimir Mihailovitch Krivtsun , Gerardus Hubertus Petrus Maria Swinkels , Michel Riepen , Hendrikus Gijsbertus Schimmel , Viacheslav Medvedev
CPC classification number: G03F7/70033 , G03F7/70166 , G03F7/70191 , G03F7/70575 , G03F7/70916 , G21K1/067 , G21K2201/064 , H05G2/008
Abstract: A source-collector device is constructed and arranged to generate a radiation beam, The device includes a target unit constructed and arranged to present a target surface of plasma-forming material; a laser unit constructed and arranged to generate a beam of radiation directed onto the target surface so as to form a plasma from said plasma-forming material; a contaminant trap constructed and arranged to reduce propagation of particulate contaminants generated by the plasma; a radiation collector comprising a plurality of grazing-incidence reflectors arranged to collect radiation emitted by the plasma and form a beam therefrom; and a filter constructed and arranged to attenuate at least one wavelength range of the beam.
Abstract translation: 源极 - 集电极器件被构造和布置成产生辐射束。该器件包括构造和布置成呈现等离子体形成材料的目标表面的靶单元; 激光单元，其被构造和布置成产生被引导到所述目标表面上的辐射束，以便形成来自所述等离子体形成材料的等离子体; 构造和布置以减少由等离子体产生的颗粒污染物的传播的污染物阱; 辐射收集器，包括多个放射入射反射器，其布置成收集由等离子体发射的辐射并从其形成光束; 以及被构造和布置成衰减所述光束的至少一个波长范围的滤光器。
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公开(公告)号：US09964852B1
公开(公告)日：2018-05-08
申请号：US15803448
申请日：2017-11-03
Applicant: ASML Netherlands B.V.
Inventor： Niek Antonius Jacobus Maria Kleemans , Denis Alexandrovich Glushkov , Ronald Johannes Hultermans , Benedictus Mathijs Renkens , Gerardus Hubertus Petrus Maria Swinkels , Christiaan Johannes Petrus Verspeek
CPC classification number: G03F7/70033 , H05G2/003 , H05G2/008
Abstract: A source collector apparatus for use in a lithographic apparatus includes a fuel droplet generator configured in use to generate a stream of fuel droplets directed from an outlet of the fuel droplet generator towards a plasma formation location. In order to prevent droplet satellites from interfering with plasma formation, a gas supply is provided that in use provides a flow of gas (e.g., hydrogen) that deflects any droplet satellites out of the fuel droplet stream. Additionally, a detection apparatus may be provided as part of a shroud to determine the point at which coalescence of fuel droplets occurs thereby providing an indication of the likelihood of satellite droplets being present in the fuel droplet stream.
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Patent Agency Ranking
公开(公告)号：US09363879B2
公开(公告)日：2016-06-07
申请号：US14532897
申请日：2014-11-04
Applicant: ASML NETHERLANDS B.V.
Inventor： Tjarko Adriaan Rudolf Van Empel , Vadim Yevgenyevich Banine , Vladimir Vitalevich Ivanov , Erik Roelof Loopstra , Johannes Hubertus Josephina Moors , Jan Bernard Plechelmus Van Schoot , Yuri Johannes Gabriël Van de Vijver , Gerardus Hubertus Petrus Maria Swinkels , Hendrikus Gijsbertus Schimmel , Dzmitry Labetski
CPC classification number: H05G2/008 , G03F7/70175 , G03F7/70891 , G03F7/70916 , G03F7/70983 , H05G2/003 , H05G2/006 , H05K7/2039
Abstract: A module for producing extreme ultraviolet radiation, including an extreme ultraviolet radiation-emitting source, the source being provided with a supply configured to supply a fluid of an ignition material to a predetermined target ignition position and a target-igniting mechanism constructed and arranged to produce a plasma from the ignition material at the target ignition position, the plasma emitting the extreme ultraviolet radiation; a collector mirror constructed and arranged to focus radiation emitted by the plasma at a focal point; and a heat sink having a thermal energy-diverting surface constructed and arranged to divert thermal energy away from the target ignition position, wherein the heat sink is located at a position proximate the target ignition position.
Abstract translation: 一种用于产生极紫外辐射源的模块，包括极紫外辐射发射源，该源提供有被配置为将点火材料的流体供应到预定的目标点火位置的供应，以及构造和布置以产生的点火机构 来自点火材料的等离子体在目标点火位置，等离子体发射极紫外线辐射; 收集器镜，构造和布置成将等离子体发射的辐射聚焦在焦点处; 以及散热器，其具有构造和布置成将热能转移离开目标点火位置的热能转向表面，其中散热器位于靠近目标点火位置的位置。
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公开(公告)号：US10001709B2
公开(公告)日：2018-06-19
申请号：US15432698
申请日：2017-02-14
Applicant: ASML Netherlands B.V.
Inventor： Vadim Yevgenyevich Banine , Erik Roelof Loopstra , Johannes Hubertus Josephina Moors , Jan Bernard Plechelmus Van Schoot , Gerardus Hubertus Petrus Maria Swinkels , Andrei Mikhailovich Yakunin , Antonius Johannes Josephus Van Dijsseldonk , Wilhelmus Petrus De Boeij
CPC classification number: G03F7/70191 , B82Y10/00 , G02B1/11 , G02B5/1838 , G02B5/281 , G02B5/283 , G03F7/70008 , G03F7/702 , G03F7/70308 , G03F7/70575 , G21K1/062 , G21K1/067 , G21K2201/061 , G21K2201/067 , H05G2/003 , H05G2/005 , H05G2/008
Abstract: A lithographic apparatus for patterning a beam of radiation and projecting it onto a substrate, comprising at least two spectral purity filters configured to reduce the intensity of radiation in the beam of radiation in at least one undesirable range of radiation wavelength, wherein the two spectral purity filters are provided with different radiation filtering structures from each other.
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公开(公告)号：US20170160646A1
公开(公告)日：2017-06-08
申请号：US15432698
申请日：2017-02-14
Applicant: ASML Netherlands B.V.
Inventor： Vadim Yevgenyevich BANINE , Erik Roelof Loopstra , Johannes Hubertus Josephina Moors , Jan Bernard Plechelmus Van Schoot , Gerardus Hubertus Petrus Maria Swinkels , Andrei Mikhailovich Yakunin , Antonius Johannes Josephus Van Dijsseldonk , Wilhelmus Petrus De Boeij
CPC classification number: G03F7/70191 , B82Y10/00 , G02B1/11 , G02B5/1838 , G02B5/281 , G02B5/283 , G03F7/70008 , G03F7/702 , G03F7/70308 , G03F7/70575 , G21K1/062 , G21K1/067 , G21K2201/061 , G21K2201/067 , H05G2/003 , H05G2/005 , H05G2/008
Abstract: A lithographic apparatus for patterning a beam of radiation and projecting it onto a substrate, comprising at least two spectral purity filters configured to reduce the intensity of radiation in the beam of radiation in at least one undesirable range of radiation wavelength, wherein the two spectral purity filters are provided with different radiation filtering structures from each other.
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9.发明授权Source-collector device, lithographic apparatus, and device manufacturing method 有权源极集电极器件，光刻设备和器件制造方法公开(公告)号：US09411238B2
公开(公告)日：2016-08-09
申请号：US14372950
申请日：2013-01-10
Applicant: ASML Netherlands B.V.
Inventor： Andrei Mikhailovich Yakunin , Vadim Yevgenyevich Banine , Johannes Hubertus Josephina Moors , Jan Bernard Plechelmus Van Schoot , Martinus Cornelis Maria Verhagen , Olav Waldemar Vladimir Frijns , Vladimir Mihailovitch Krivtsun , Gerardus Hubertus Petrus Maria Swinkels , Michel Riepen , Hendrikus Gijsbertus Schimmel , Viacheslav Medvedev
CPC classification number: G03F7/70033 , G03F7/70166 , G03F7/70191 , G03F7/70575 , G03F7/70916 , G21K1/067 , G21K2201/064 , H05G2/008
Abstract: A source-collector device includes a target unit having a target surface of plasma-forming material and a laser unit to generate a beam of radiation directed onto the target surface to form a plasma from said plasma-forming material. A contaminant trap is provided to reduce propagation of particulate contaminants generated by the plasma. A radiation collector includes a one or more grazing-incidence reflectors arranged to collect radiation emitted by the plasma and form a beam therefrom, and a filter is configured to attenuate at least one wavelength range of the beam.
Abstract translation: 源极 - 集电极器件包括具有等离子体形成材料的靶表面的靶单元和用于产生被引导到靶表面上的辐射束以形成来自所述等离子体形成材料的等离子体的激光单元。 提供污染物阱以减少由等离子体产生的颗粒污染物的传播。 辐射收集器包括一个或多个放射入射反射器，其布置成收集由等离子体发射的辐射并从其形成光束，并且滤光器被配置为衰减光束的至少一个波长范围。
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10.发明授权公开(公告)号：US08946661B2
公开(公告)日：2015-02-03
申请号：US13686633
申请日：2012-11-27
Applicant: ASML Netherlands B.V.
Inventor： Erik Roelof Loopstra , Gerardus Hubertus Petrus Maria Swinkels , Vadim Yevgenyevich Banine , Johannes Hubertus Josephina Moors
CPC classification number: H05G2/006 , G03F7/70033 , G03F7/70891 , G03F7/70916 , G21K1/06 , H05G2/003 , H05G2/005 , H05G2/008
Abstract: A radiation source is configured to produce extreme ultraviolet radiation. The radiation source includes a chamber in which, in use, a plasma is generated, and an evaporation surface configured to evaporate a material formed as a by-product from the plasma and that is emitted to the evaporation surface. A method for removing a by-product material in or from a plasma radiation source of a lithographic apparatus includes evaporating a material which, in use, is emitted to that surface from the plasma.
Abstract translation: 辐射源被配置为产生极紫外辐射。 辐射源包括在其中使用中产生等离子体的腔室，以及蒸发表面，该蒸发表面构造成蒸发由等离子体形成的副产物并被发射到蒸发表面的材料。 用于在平版印刷设备的等离子体辐射源中除去或来自等离子体辐射源的副产物材料的方法包括在等离子体中蒸发在使用中发射到该表面的材料。
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