On-chip measurement for phase-locked loop

    公开(公告)号:US10295580B2

    公开(公告)日:2019-05-21

    申请号:US15284374

    申请日:2016-10-03

    Abstract: A chip includes a phase-locked loop (PLL) and a test controller. The PLL includes an oscillator and a phase detector. In a normal mode, a first feedback loop includes a phase detector and an oscillator that generates an output based on a frequency input signal. In a test mode, the PLL is re-configured. The output of the loop filter can be decoupled from the input of the oscillator in the test mode and instead be coupled to the input of the phase detector. The oscillator can receive a test tuning signal provided by the test controller. In this test mode configuration, the PLL can measure the frequency of the oscillator.

    Phase-locked loop having a multi-band oscillator and method for calibrating same

    公开(公告)号:US10727848B2

    公开(公告)日:2020-07-28

    申请号:US14794661

    申请日:2015-07-08

    Abstract: A phase-locked loop (PLL) comprising a multi-band oscillator and a memory configured to store control input for the oscillator. The PLL is operable in a calibration mode in which the PLL is configured to acquire a frequency controlled word (FCW) for the PLL corresponding to a frequency generated by the oscillator in response to a first control input threshold on a first band of the oscillator; generate a frequency corresponding to said FCW on a second band of the oscillator adjacent to said first band; identify a second control input causing the oscillator to generate said frequency corresponding to said FCW and store said second control input in memory.

    Jitter reduction techniques when using digital PLLs with ADCs and DACs

    公开(公告)号:US10367516B2

    公开(公告)日:2019-07-30

    申请号:US15674985

    申请日:2017-08-11

    Abstract: This disclosure relates to data converters for electronic systems. An example system includes a primary analog to digital converter (ADC) circuit, a slope calculation circuit, a digital phase lock loop (DPLL) circuit, a sampling error circuit, and a summing circuit. The primary ADC circuit samples an input signal and produces a digital output signal representative of the input signal. The slope calculation circuit generates a digital slope signal representative of slope of the input signal, and the DPLL circuit provides a sampling clock signal to the primary ADC circuit. The sampling error circuit generates a sampling error signal representative of sampling error by the primary ADC circuit using the digital slope signal and the sampling clock signal. The summing circuit receives the sampling error signal and the digital output signal of the primary ADC circuit and generates an adjusted digital output signal representative of the input signal.

Patent Agency Ranking