Circuit arrangement, electronic mechanism, electrical turn out and procedures for the operation of one circuit arrangement
    1.
    发明授权
    Circuit arrangement, electronic mechanism, electrical turn out and procedures for the operation of one circuit arrangement 有权
    电路布置,电子机构,电气开关和一个电路布置操作的程序

    公开(公告)号:US07958418B2

    公开(公告)日:2011-06-07

    申请号:US12028657

    申请日:2008-02-08

    IPC分类号: G01R31/28

    摘要: A circuit arrangement may include a scan test input stage having a test input for receiving a test signal, wherein the scan test input stage can be switched in high-impedance state; a data input stage having a data input for receiving a data signal, wherein the data input stage can be switched in high-impedance state. The circuit arrangement may further include a latch coupled to at least one output of the scan test input stage and to at least one output of the data input stage; and a drive circuit, which is configured to generate a pulsed clock signal for the data input stage and a signal for driving the scan test input stage.

    摘要翻译: 电路装置可以包括具有用于接收测试信号的测试输入的扫描测试输入级,其中扫描测试输入级可以以高阻抗状态切换; 数据输入级具有用于接收数据信号的数据输入,其中数据输入级可以以高阻抗状态切换。 电路装置还可以包括耦合到扫描测试输入级的至少一个输出端和数据输入级的至少一个输出端的锁存器; 以及驱动电路,其被配置为产生用于数据输入级的脉冲时钟信号和用于驱动扫描测试输入级的信号。

    Circuit Arrangement, Electronic Mechanism, Electrical Turn out and Procedures for the Operation of One Circuit Arrangement
    2.
    发明申请
    Circuit Arrangement, Electronic Mechanism, Electrical Turn out and Procedures for the Operation of One Circuit Arrangement 有权
    电路布置,电子机构,电路结构和单电路布置操作程序

    公开(公告)号:US20080250285A1

    公开(公告)日:2008-10-09

    申请号:US12028657

    申请日:2008-02-08

    IPC分类号: G01R31/28

    摘要: A circuit arrangement may include a scan test input stage having a test input for receiving a test signal, wherein the scan test input stage can be switched in high-impedance state; a data input stage having a data input for receiving a data signal, wherein the data input stage can be switched in high-impedance state. The circuit arrangement may further include a latch coupled to at least one output of the scan test input stage and to at least one output of the data input stage; and a drive circuit, which is configured to generate a pulsed clock signal for the data input stage and a signal for driving the scan test input stage.

    摘要翻译: 电路装置可以包括具有用于接收测试信号的测试输入的扫描测试输入级,其中扫描测试输入级可以以高阻抗状态切换; 数据输入级具有用于接收数据信号的数据输入,其中数据输入级可以以高阻抗状态切换。 电路装置还可以包括耦合到扫描测试输入级的至少一个输出端和数据输入级的至少一个输出端的锁存器; 以及驱动电路,其被配置为产生用于数据输入级的脉冲时钟信号和用于驱动扫描测试输入级的信号。

    Frequency synthesizer and method
    5.
    发明申请
    Frequency synthesizer and method 有权
    频率合成器和方法

    公开(公告)号:US20080074201A1

    公开(公告)日:2008-03-27

    申请号:US11524674

    申请日:2006-09-21

    IPC分类号: H03L7/00

    摘要: A synthesizer arrangement includes an oscillator, a phase detector, and a loop filter that form a phase-locked loop. The loop filter is coupled to a control unit to activate a respective set of internal states out of a plurality of sets of internal states.

    摘要翻译: 合成器装置包括形成锁相环的振荡器,相位检测器和环路滤波器。 环路滤波器耦合到控制单元以激活多组内部状态中的相应的一组内部状态。

    Pulsed static flip-flop
    6.
    发明申请
    Pulsed static flip-flop 有权
    脉冲静态触发器

    公开(公告)号:US20070182473A1

    公开(公告)日:2007-08-09

    申请号:US11648194

    申请日:2006-12-29

    IPC分类号: H03K3/00

    CPC分类号: H03K3/35625 H03K3/012

    摘要: A pulsed static flip-flop comprises a first logic device which combines a logic signal with a pulsed signal and outputs a set signal, a second logic device which logically combines the logic signal with a complementary pulsed signal and outputs a reset signal; and a latch device comprising storage means which hold a logic hold level to be tapped off as a stored logic state of the logic signal. The logic hold level is adjustable to a first logic level by a first push-pull transistor controlled by the set signal and to a second logic level by a second push-pull transistor controlled by the reset signal.

    摘要翻译: 脉冲静态触发器包括将逻辑信号与脉冲信号组合并输出设定信号的第一逻辑器件,将逻辑信号与互补脉冲信号逻辑组合并输出复位信号的第二逻辑器件; 以及锁存装置,其包括存储装置,其保持要作为逻辑信号的存储的逻辑状态被分接的逻辑保持电平。 逻辑保持电平由被设置信号控制的第一推挽晶体调节到第一逻辑电平,并且由复位信号控制的第二推挽晶体调节到第二逻辑电平。

    Semiconductor component for vertical integration and manufacturing method
    7.
    发明授权
    Semiconductor component for vertical integration and manufacturing method 失效
    半导体元件垂直整合制造方法

    公开(公告)号:US5930596A

    公开(公告)日:1999-07-27

    申请号:US721980

    申请日:1996-09-27

    摘要: A terminal metallization (8) is applied onto and structured on a layer structure on the upper side of the component, the terminal metallization is applied on the upper side of an insulating layer (7) with an opening on a metallization (6) provided for electrical connection. By filling a hole produced in a covering dielectric with metal, a contact rod (12) seated on this terminal metallization (8) is formed. This contact rod is resiliently movable in a surrounding opening (14) of the component on the free part of the terminal metallization (8) anchored in the layer structure. This enables the reversible contacting of the component to a further component arranged vertically thereto, whereby the planar upper sides lying opposite one another can be brought into intimate contact because the contact rod (12) pressed against a contact (15) of the other component is pressed back into the opening (14) and an adequately firm connection of the contacts is achieved by the spring power of the terminal metallization (8).

    摘要翻译: PCT No.PCT / DE95 / 00313 Sec。 371日期1996年9月27日第 102(e)1996年9月27日PCT 1995年3月7日PCT PCT。 公开号WO96 / 26568 PCT 日期1995年10月5日端子金属化(8)被施加到构件的上侧上的层结构上并在其上构造,端子金属化被施加在绝缘层(7)的上侧,金属化开口 (6)用于电连接。 通过用金属填充在覆盖电介质中产生的孔,形成了位于该端子金属化(8)上的接触棒(12)。 该接触杆可以在锚定在层结构中的端子金属化(8)的自由部分上的部件的周围开口(14)中弹性移动。 这使得部件与其垂直方向布置的另一部件可逆地接触,由此,压接在另一部件的接触件(15)上的接触杆(12)是彼此相对的平面上侧面 压入到开口(14)中,通过端子金属化(8)的弹簧功率实现触点的充分牢固的连接。

    Data Moving Processor
    9.
    发明申请
    Data Moving Processor 失效
    数据移动处理器

    公开(公告)号:US20100185832A1

    公开(公告)日:2010-07-22

    申请号:US12358048

    申请日:2009-01-22

    IPC分类号: G06F9/312 G06F15/76 G06F9/02

    摘要: A system and method for processing data is disclosed. In one embodiment, a data moving processor comprises a code memory coupled to a code fetch circuit and a decode circuit coupled to the code fetch circuit. An address stack is coupled to the decode circuit and configured to store address data. A general purpose stack is coupled to the decode circuit and configured to store other data. The data moving processor uses data from the general purpose stack to perform calculations. The data moving processor uses address data from the address stack to identify source and destination memory locations. The address data may be used to drive an address line of a memory during a read or write operation. The address stack and general purpose stack are separately controlled using bytecode.

    摘要翻译: 公开了一种用于处理数据的系统和方法。 在一个实施例中,数据移动处理器包括耦合到代码获取电路的代码存储器和耦合到代码提取电路的解码电路。 地址堆栈被耦合到解码电路并被配置为存储地址数据。 通用堆栈耦合到解码电路并且被配置为存储其他数据。 数据移动处理器使用通用堆栈中的数据进行计算。 数据移动处理器使用来自地址堆栈的地址数据来识别源和目的地存储单元。 地址数据可以用于在读或写操作期间驱动存储器的地址线。 使用字节码分别控制地址堆栈和通用堆栈。

    Semiconductor testing apparatus
    10.
    发明授权
    Semiconductor testing apparatus 失效
    半导体测试仪器

    公开(公告)号:US5969534A

    公开(公告)日:1999-10-19

    申请号:US666491

    申请日:1996-07-11

    CPC分类号: G01R1/06783

    摘要: A method and apparatus for the reversible contacting of a semiconductor circuit level to assist in performing a function test. The apparatus includes a testing head having test points arranged at a test side lying opposite the contact surfaces of a semiconductor circuit level. The test points are formed of liquid contacts in recesses in the test side of the testing head wherein the liquid contacts form menisci that project beyond the surface of the testing head. The recesses, in turn, are provided for metallizations which are connected to electrically-conductive leads. In addition, the surface may be provided with a roughening or with etched trenches.

    摘要翻译: PCT No.PCT / DE95 / 00013 Sec。 371日期:1996年7月11日 102(e)日期1996年7月11日PCT 1995年1月9日PCT PCT。 公开号WO95 / 18975 日期1995年7月13日用于半导体电路级的可逆接触以辅助执行功能测试的方法和装置。 该装置包括具有布置在与半导体电路电平的接触表面相对的测试侧的测试点的测试头。 测试点由测试头测试侧的凹槽中的液体触点形成,其中液体触点形成突出超出测试头表面的半月板。 这些凹槽又被提供用于连接到导电引线的金属化。 此外,表面可以设置有粗糙化或具有蚀刻的沟槽。