摘要:
A circuit arrangement may include a scan test input stage having a test input for receiving a test signal, wherein the scan test input stage can be switched in high-impedance state; a data input stage having a data input for receiving a data signal, wherein the data input stage can be switched in high-impedance state. The circuit arrangement may further include a latch coupled to at least one output of the scan test input stage and to at least one output of the data input stage; and a drive circuit, which is configured to generate a pulsed clock signal for the data input stage and a signal for driving the scan test input stage.
摘要:
A circuit arrangement may include a scan test input stage having a test input for receiving a test signal, wherein the scan test input stage can be switched in high-impedance state; a data input stage having a data input for receiving a data signal, wherein the data input stage can be switched in high-impedance state. The circuit arrangement may further include a latch coupled to at least one output of the scan test input stage and to at least one output of the data input stage; and a drive circuit, which is configured to generate a pulsed clock signal for the data input stage and a signal for driving the scan test input stage.
摘要:
A time delay circuit is disclosed and includes a delay line with a first delay circuit and at least a second delay circuit connected downstream. An interpolation circuit is used to generate intermediate signals derived by delayed successive signals in the delay line.
摘要:
A time delay circuit is disclosed and includes a delay line with a first delay circuit and at least a second delay circuit connected downstream. An interpolation circuit is used to generate intermediate signals derived by delayed successive signals in the delay line.
摘要:
A synthesizer arrangement includes an oscillator, a phase detector, and a loop filter that form a phase-locked loop. The loop filter is coupled to a control unit to activate a respective set of internal states out of a plurality of sets of internal states.
摘要:
A pulsed static flip-flop comprises a first logic device which combines a logic signal with a pulsed signal and outputs a set signal, a second logic device which logically combines the logic signal with a complementary pulsed signal and outputs a reset signal; and a latch device comprising storage means which hold a logic hold level to be tapped off as a stored logic state of the logic signal. The logic hold level is adjustable to a first logic level by a first push-pull transistor controlled by the set signal and to a second logic level by a second push-pull transistor controlled by the reset signal.
摘要:
A terminal metallization (8) is applied onto and structured on a layer structure on the upper side of the component, the terminal metallization is applied on the upper side of an insulating layer (7) with an opening on a metallization (6) provided for electrical connection. By filling a hole produced in a covering dielectric with metal, a contact rod (12) seated on this terminal metallization (8) is formed. This contact rod is resiliently movable in a surrounding opening (14) of the component on the free part of the terminal metallization (8) anchored in the layer structure. This enables the reversible contacting of the component to a further component arranged vertically thereto, whereby the planar upper sides lying opposite one another can be brought into intimate contact because the contact rod (12) pressed against a contact (15) of the other component is pressed back into the opening (14) and an adequately firm connection of the contacts is achieved by the spring power of the terminal metallization (8).
摘要:
An integrated semiconductor circuit has a regular array of logic function blocks (L) and a regular array of wiring zones (X) corresponding thereto. The wiring lines in at least one wiring layer of a wiring zone (X) are realized as line segments that are continuous within the wiring zone and are interrupted at zone boundaries. Furthermore, the semiconductor circuit comprises driver cells that surround a logic cell of the logic function block in an L-shaped manner.
摘要:
A system and method for processing data is disclosed. In one embodiment, a data moving processor comprises a code memory coupled to a code fetch circuit and a decode circuit coupled to the code fetch circuit. An address stack is coupled to the decode circuit and configured to store address data. A general purpose stack is coupled to the decode circuit and configured to store other data. The data moving processor uses data from the general purpose stack to perform calculations. The data moving processor uses address data from the address stack to identify source and destination memory locations. The address data may be used to drive an address line of a memory during a read or write operation. The address stack and general purpose stack are separately controlled using bytecode.
摘要:
A method and apparatus for the reversible contacting of a semiconductor circuit level to assist in performing a function test. The apparatus includes a testing head having test points arranged at a test side lying opposite the contact surfaces of a semiconductor circuit level. The test points are formed of liquid contacts in recesses in the test side of the testing head wherein the liquid contacts form menisci that project beyond the surface of the testing head. The recesses, in turn, are provided for metallizations which are connected to electrically-conductive leads. In addition, the surface may be provided with a roughening or with etched trenches.