Optical device and imaging system
    1.
    发明授权
    Optical device and imaging system 失效
    光学设备和成像系统

    公开(公告)号:US06388799B1

    公开(公告)日:2002-05-14

    申请号:US09432762

    申请日:1999-11-03

    IPC分类号: G02F0135

    摘要: An optical device for efficient radiation emission having a modulation region with phase matching means (1) for enhancing the phase matching between two different frequency signals propagating in the optical modulation region (1) in response to illumination by at least one incident beam (7, 8), the phase matching means (1), having a spatial variation in its refractive index (5) along the path of the incident radiation beam (7, 8). The device may be configured as a radiation source comprising a frequency conversion member (C2) for emitting a beam of radiation (553) in response to irradiation by one or more input beams (507), the emitted beam (553) having a frequency different to that of the one or more input beams (507), the one or more input beams (507) all being produced within a lasing cavity (defined by M3, M4, M5, M6 and output coupler (523)) and said frequency conversion member (C2) being located within said lasing cavity. The invention also extends to an imaging system using the radiation source.

    摘要翻译: 一种用于高效辐射发射的光学装置,其具有带有相位匹配装置(1)的调制区域,用于响应于至少一个入射光束(7,7)的光照而增强在光学调制区域(1)中传播的两个不同频率信号之间的相位匹配, 8),相位匹配装置(1)沿着入射辐射束(7,8)的路径具有其折射率(5)的空间变化。 该装置可以被配置为包括用于响应于一个或多个输入光束(507)的照射而发射辐射束(553)的频率转换部件(C2)的辐射源,发射的光束(553)具有不同的频率 与一个或多个输入光束(507)的输入光束(507)的一个或多个输入光束(507)全部在激光腔(由M3,M4,M5,M6和输出耦合器(523)定义)内产生,并且所述频率转换 构件(C2)位于所述激光腔内。 本发明还延伸到使用辐射源的成像系统。

    THz semiconductor laser incorporating a controlled plasmon confinement waveguide
    2.
    发明授权
    THz semiconductor laser incorporating a controlled plasmon confinement waveguide 有权
    掺入受控等离子体限制波导的太赫兹半导体激光器

    公开(公告)号:US07382806B2

    公开(公告)日:2008-06-03

    申请号:US10508996

    申请日:2003-03-24

    IPC分类号: H01S3/30

    摘要: A semiconductor laser comprises an active region (12) which, in response to a pumping energy applied thereto, can produce a stimulated emission of radiation with a central wavelength (λ) in the far infrared region, and a confinement region (16, 18, 22) suitable for confining the radiation in the active region (12), and comprising at least one interface (16a, 16b, 22a) between adjacent layers that is capable of supporting surface plasmon modes generated by an interaction of the interface with the radiation. The confinement region (16, 18, 22) comprises a wave-guide layer (16) which is delimited on opposite sides by a first interface and by a second interface (16a, 16b). The guide layer (16) is doped in a manner such that the first and second interfaces (16a, 16b) are capable of supporting the plasmon modes, respectively, and is of a thickness (d) such as to bring about the accumulation of the plasmon modes in proximity to the first and second interfaces (16a, 16b), outside the layer (16), and substantially a suppression of the plasmon modes, inside the layer.

    摘要翻译: 半导体激光器包括有源区域(12),其响应于施加到其上的泵送能量,可产生受激发射的远红外区域中具有中心波长(λ)的辐射,以及约束区域(16,18, 22),其适于将辐射限制在有源区域(12)中,并且包括相邻层之间的至少一个界面(16a,16b,22a),其能够支持通过界面与 辐射。 所述限制区域(16,18,22)包括波导层(16),所述波导层(16)由相对侧由第一界面和第二界面(16a,16b)限定。 引导层(16)以使得第一和第二界面(16a,16b)能够分别支撑等离子体模式并且具有厚度(d)的方式被掺杂,以便产生积累 在层(16)外部的第一和第二界面(16a,16b)附近的等离子体激元模式,以及基本上抑制层内的等离子体激元模式。

    APPARATUS AND METHOD FOR MEASURING TERAHERTZ-ABSORPTION CHARACTERISTICS OF SAMPLES
    3.
    发明申请
    APPARATUS AND METHOD FOR MEASURING TERAHERTZ-ABSORPTION CHARACTERISTICS OF SAMPLES 审中-公开
    用于测量样品的TERAHERTZ吸收特性的装置和方法

    公开(公告)号:US20110310379A1

    公开(公告)日:2011-12-22

    申请号:US13058403

    申请日:2009-08-05

    IPC分类号: G01N21/25 G01J3/00

    摘要: A method for measuring an absorption characteristic of a sample comprises: providing a microstrip waveguide comprising a ground plane, an elongate conductive strip having a first end and a second end, and a dielectric substrate separating the ground plane from the elongate strip such that the strip extends from its first end to its second end in a plane substantially parallel to the ground plane; emitting electromagnetic radiation from a first intermediate position along the microstrip waveguide, said first intermediate position being a position between the first and second ends of the strip, such that said radiation propagates along the waveguide in a direction towards the second end; positioning a sample at a position external to the microstrip waveguide and between the first intermediate position and a second intermediate position along the microstrip waveguide, the second intermediate position being a position between the first intermediate position and the second end, such that at least a portion of the sample is exposed to the evanescent electric field of the propagating radiation; and detecting at least one characteristic of the propagating radiation at said second intermediate position. Corresponding apparatus is also disclosed.

    摘要翻译: 用于测量样品的吸收特性的方法包括:提供包括接地平面的微带波导,具有第一端和第二端的细长导电条,以及将接地平面与细长条分开的电介质基板,使得带 在基本上平行于接地平面的平面中从其第一端延伸到其第二端; 沿着所述微带波导从第一中间位置发射电磁辐射,所述第一中间位置是所述带的第一和第二端之间的位置,使得所述辐射沿着所述波导在朝向所述第二端的方向上传播; 将样品定位在微带波导外部的位置处,并且沿着微带波导在第一中间位置和第二中间位置之间,第二中间位置是位于第一中间位置和第二端之间的位置,使得至少一部分 的样品暴露于传播辐射的ev逝电场; 并且检测所述第二中间位置处的传播辐射的至少一个特性。 还公开了相应的装置。