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    Multi tip clearance measurement system and method of operation
    1.
    发明授权
    Multi tip clearance measurement system and method of operation 失效
    多头清关测量系统及操作方法

    公开(公告)号：US07215129B1

    公开(公告)日：2007-05-08

    申请号：US11393584

    申请日：2006-03-30

    申请人： Emad Andarawis Andarawis ,  Samhita Dasgupta ,  Shobhana Mani ,  Weiguo Chen

    发明人： Emad Andarawis Andarawis ,  Samhita Dasgupta ,  Shobhana Mani ,  Weiguo Chen

    IPC分类号： G01R27/26

    CPC分类号： G01B7/14 ,  F01D21/003 ,  F05D2260/80

    摘要： A multi tip clearance measurement system is provided. The clearance measurement system includes a sensor disposed on a first object, wherein the sensor comprises a plurality of probe tips configured to generate signals representative of a sensed parameter corresponding to a second object and a processing unit configured to evaluate the signals from subsets of the sensed parameters from the probe tips to detect an outlier probe tip and to adjust a gain, or an offset of the respective outlier probe tip for estimating the clearance between the first and second objects based upon the signals.

    摘要翻译： 提供了多顶端间隙测量系统。 所述间隙测量系统包括设置在第一物体上的传感器，其中所述传感器包括被配置为产生表示对应于第二物体的感测参数的信号的多个探测头，以及被配置为评估来自所检测到的子集的信号的信号 来自探针尖端的参数以检测异常值探针尖端并且调整增益，或者基于该信号来估计第一和第二对象之间的间隙的相应异常值探针尖端的偏移。

    Clearance measurement system and method of operation
    2.
    发明授权
    Clearance measurement system and method of operation 有权
    间隙测量系统和操作方法

    公开(公告)号：US07333913B2

    公开(公告)日：2008-02-19

    申请号：US11167434

    申请日：2005-06-27

    申请人： Emad Andarawis Andarawis ,  Mahadevan Balasubramaniam ,  Todd Alan Anderson ,  Samhita Dasgupta ,  David Mulford Shaddock ,  Shobhana Mani ,  Jie Jiang

    发明人： Emad Andarawis Andarawis ,  Mahadevan Balasubramaniam ,  Todd Alan Anderson ,  Samhita Dasgupta ,  David Mulford Shaddock ,  Shobhana Mani ,  Jie Jiang

    IPC分类号： G01B5/14

    CPC分类号： G01B7/144

    摘要： A clearance measurement system is provided. The clearance measurement system includes a reference geometry disposed on a first object having an otherwise continuous surface geometry and a sensor disposed on a second object, wherein the sensor is configured to generate a first signal representative of a first sensed parameter from the first object and a second signal representative of a second sensed parameter from the reference geometry. The clearance measurement system also includes a processing unit configured to process the first and second signals to estimate a clearance between the first and second objects based upon a measurement difference between the first and second sensed parameters.

    摘要翻译： 提供了间隙测量系统。 间隙测量系统包括设置在具有另外连续的表面几何形状的第一物体上的参考几何形状和设置在第二物体上的传感器，其中传感器被配置为产生表示来自第一物体的第一感测参数的第一信号，以及 第二信号表示来自参考几何的第二感测参数。 间隙测量系统还包括处理单元，其被配置为基于第一和第二感测参数之间的测量差异来处理第一和第二信号以估计第一和第二对象之间的间隙。

    SYSTEM AND METHOD FOR MEASURING THICKNESS OF A REFRACTORY WALL OF A GASIFIER USING ELECTROMAGNETIC ENERGY
    3.
    发明申请
    SYSTEM AND METHOD FOR MEASURING THICKNESS OF A REFRACTORY WALL OF A GASIFIER USING ELECTROMAGNETIC ENERGY 有权
    使用电磁能量测量气化炉的厚度厚度的系统和方法

    公开(公告)号：US20100123467A1

    公开(公告)日：2010-05-20

    申请号：US12272310

    申请日：2008-11-17

    申请人： Emad Andarawis Andarawis ,  John Erik Hershey ,  Ibrahim Issoufou Kouada ,  Shobhana Mani ,  Anthony Mark Thompson

    发明人： Emad Andarawis Andarawis ,  John Erik Hershey ,  Ibrahim Issoufou Kouada ,  Shobhana Mani ,  Anthony Mark Thompson

    IPC分类号： G01B21/08

    CPC分类号： G01B15/02

    摘要： A system and method for measuring a thickness of a refractory wall of a gasifier using electromagnetic energy is disclosed. The system includes a waveguide with a bistatic or monostatic phased array antenna at one end. The waveguide is operably connected to a Network Analyzer that generates a pulse of electromagnetic energy with a desired bandwidth. The pulse is transmitted through a coaxial cable to the waveguide. The reflection of the pulse is received by the waveguide and input to a data acquisition system. An output device displays the resolvable discontinuities in impedance encountered by the pulse in its propagation path in the system

    摘要翻译： 公开了一种使用电磁能测量气化器的耐火壁的厚度的系统和方法。 该系统包括在一端具有双稳态或单稳态相控阵天线的波导。 波导可操作地连接到网络分析器，其产生具有期望带宽的电磁能量的脉冲。 脉冲通过同轴电缆传输到波导。 脉冲的反射由波导接收并输入到数据采集系统。 输出设备在系统中的传播路径中显示脉冲遇到的阻抗的可解决的不连续性

    System and method for measuring thickness of a refractory wall of a gasifier using electromagnetic energy
    4.
    发明授权
    System and method for measuring thickness of a refractory wall of a gasifier using electromagnetic energy 有权
    使用电磁能量测量气化炉耐火壁厚度的系统和方法

    公开(公告)号：US08269509B2

    公开(公告)日：2012-09-18

    申请号：US12272310

    申请日：2008-11-17

    申请人： Emad Andarawis Andarawis ,  John Erik Hershey ,  Ibrahim Issoufou Kouada ,  Shobhana Mani ,  Anthony Mark Thompson

    发明人： Emad Andarawis Andarawis ,  John Erik Hershey ,  Ibrahim Issoufou Kouada ,  Shobhana Mani ,  Anthony Mark Thompson

    IPC分类号： G01R27/32

    CPC分类号： G01B15/02

    摘要： A system and method for measuring a thickness of a refractory wall of a gasifier using electromagnetic energy is disclosed. The system includes a waveguide with a bistatic or monostatic phased array antenna at one end. The waveguide is operably connected to a Network Analyzer that generates a pulse of electromagnetic energy with a desired bandwidth. The pulse is transmitted through a coaxial cable to the waveguide. The reflection of the pulse is received by the waveguide and input to a data acquisition system. An output device displays the resolvable discontinuities in impedance encountered by the pulse in its propagation path in the system.

    摘要翻译： 公开了一种使用电磁能测量气化器的耐火壁的厚度的系统和方法。 该系统包括在一端具有双稳态或单稳态相控阵天线的波导。 波导可操作地连接到网络分析器，其产生具有期望带宽的电磁能量的脉冲。 脉冲通过同轴电缆传输到波导。 脉冲的反射由波导接收并输入到数据采集系统。 输出设备在系统中的传播路径中显示脉冲遇到的阻抗的可解决的不连续性。

    Clearance measurement system and method of operation
    6.
    发明申请
    Clearance measurement system and method of operation 有权
    间隙测量系统和操作方法

    公开(公告)号：US20070005294A1

    公开(公告)日：2007-01-04

    申请号：US11167434

    申请日：2005-06-27

    申请人： Emad Andarawis ,  Mahadevan Balasubramaniam ,  Todd Anderson ,  Samhita Dasgupta ,  David Shaddock ,  Shobhana Mani ,  Jie Jiang

    发明人： Emad Andarawis ,  Mahadevan Balasubramaniam ,  Todd Anderson ,  Samhita Dasgupta ,  David Shaddock ,  Shobhana Mani ,  Jie Jiang

    IPC分类号： G01B15/00

    CPC分类号： G01B7/144

    摘要： A clearance measurement system is provided. The clearance measurement system includes a reference geometry disposed on a first object having an otherwise continuous surface geometry and a sensor disposed on a second object, wherein the sensor is configured to generate a first signal representative of a first sensed parameter from the first object and a second signal representative of a second sensed parameter from the reference geometry. The clearance measurement system also includes a processing unit configured to process the first and second signals to estimate a clearance between the first and second objects based upon a measurement difference between the first and second sensed parameters.

    摘要翻译： 提供了间隙测量系统。 间隙测量系统包括设置在具有另外连续的表面几何形状的第一物体上的参考几何形状和设置在第二物体上的传感器，其中传感器被配置为产生表示来自第一物体的第一感测参数的第一信号，以及 第二信号表示来自参考几何的第二感测参数。 间隙测量系统还包括处理单元，其被配置为基于第一和第二感测参数之间的测量差异来处理第一和第二信号以估计第一和第二对象之间的间隙。