LITHOGRAPHIC APPARATUS AND METHOD
    1.
    发明申请
    LITHOGRAPHIC APPARATUS AND METHOD 有权
    LITHOGRAPHIC设备和方法

    公开(公告)号:US20120281193A1

    公开(公告)日:2012-11-08

    申请号:US13442458

    申请日:2012-04-09

    IPC分类号: G03B27/54

    摘要: A lithographic apparatus includes a projection system that includes a plurality of reflective optics. One of the reflective optics is provided with an opening which passes through the reflective optic. The opening is closed by a covering layer that is substantially transparent to EUV radiation. The covering layer prevents contamination from entering the projection system, while allowing patterned EUV radiation to pass from the projection system onto a substrate.

    摘要翻译: 光刻设备包括包括多个反射光学元件的投影系统。 反射光学器件中的一个设置有穿过反射光学器件的开口。 开口由对EUV辐射基本透明的覆盖层封闭。 覆盖层防止污染物进入投影系统,同时允许图案化的EUV辐射从投影系统传递到基底上。

    Lithographic apparatus and method
    2.
    发明授权
    Lithographic apparatus and method 有权
    平版印刷设备和方法

    公开(公告)号:US08917380B2

    公开(公告)日:2014-12-23

    申请号:US13442458

    申请日:2012-04-09

    IPC分类号: G03B27/54 G03B27/42 G03F7/20

    摘要: A lithographic apparatus includes a projection system that includes a plurality of reflective optics. One of the reflective optics is provided with an opening which passes through the reflective optic. The opening is closed by a covering layer that is substantially transparent to EUV radiation. The covering layer prevents contamination from entering the projection system, while allowing patterned EUV radiation to pass from the projection system onto a substrate.

    摘要翻译: 光刻设备包括包括多个反射光学元件的投影系统。 反射光学器件中的一个设置有穿过反射光学器件的开口。 开口由对EUV辐射基本透明的覆盖层封闭。 覆盖层防止污染物进入投影系统,同时允许图案化的EUV辐射从投影系统传递到基底上。