Oxide Layers on Silicone Substrates for Effective Confocal Laser Microscopy
    10.
    发明申请
    Oxide Layers on Silicone Substrates for Effective Confocal Laser Microscopy 审中-公开
    氧化层在有机硅基底上有效共焦激光显微镜

    公开(公告)号:US20120264644A1

    公开(公告)日:2012-10-18

    申请号:US13533594

    申请日:2012-06-26

    IPC分类号: C40B30/04

    摘要: Methods of performing confocal laser microscopy on a polymer array disposed on a silicon wafer substrate, the method comprising the steps of providing a silicon wafer substrate having a top side and a bottom side, coating the top side of the silicon wafer with an oxide coating to provide an oxide coated wafer, covalently coupling a plurality of probes to the top side of the coated wafer to provide a fixed polymer array, hybridizing the fixed polymer array with a plurality of labeled ligands, and assaying for one or more hybridized ligands using confocal laser fluorescence microscopy to detect hybridization are provided.

    摘要翻译: 在设置在硅晶片基板上的聚合物阵列上进行共焦激光显微镜的方法,所述方法包括以下步骤:提供具有顶侧和底侧的硅晶片衬底,用氧化物涂层涂覆硅晶片的顶侧 提供氧化物涂覆的晶片,将多个探针共价耦合到涂覆的晶片的顶侧,以提供固定的聚合物阵列,将固定的聚合物阵列与多个标记的配体杂交,以及使用共焦激光测定一个或多个杂交配体 提供荧光显微镜检测杂交。