摘要:
A dynamic random access memory (DRAM) includes a Y-select circuit (218) that connects a pair of bit lines (204a and 204b) to a pair of sense nodes (210a and 210b). The Y-select circuit (218) provides a first impedance in a read operation, and a second impedance that is lower than the first impedance, in a write operation. Changes in Y-select circuit (218) impedance are achieved by driving transistors (N210a and N210b) within the Y-select circuit (218) with a first voltage during a read operation, and a second voltage during a write operation.
摘要:
A semiconductor device (200) having a substrate routed power supply voltage is disclosed. The semiconductor device (200) includes a relatively highly doped substrate (302) and an epitaxial layer (304) formed over the substrate (302). In one embodiment (200), a surrounding conductive structure (202) is formed on the peripheral edges of the semiconductor device (200) die. The surrounding conductive structure (202) is coupled to the substrate (302). In another embodiment, the back side of the die (404) is coupled to the conductive portion (402) of an integrated circuit package. The conductive portion (402) is coupled to a power supply voltage. In another embodiment (700), the surrounding conductive structure (702) is coupled to a power supply voltage by one or more bond pads (710) formed on, or coupled to, the surrounding conductive structure (702).
摘要:
A method of testing a sleep support member, the method including: identifying the sleep support member; determining a tested comfort/support value for the identified sleep support member before the identified sleep support member is provided to a customer; and determining whether the tested comfort/support value is within a predetermined tolerance level of a goal comfort/support value for the identified sleep support member. An apparatus for testing a sleep support member, the apparatus including: an identification unit configured to identify the sleep support member; a comfort/support testing unit configured to determine a tested comfort/support value for the identified sleep support member before the identified sleep support member is provided to a customer; and an analysis unit configured to determine whether the tested comfort/support value is within a predetermined tolerance level of a goal comfort/support value for the identified sleep support member.
摘要:
A computer system including a control logic and a storage coupled to the control logic. The storage includes a plurality of bitcells and bitlines used to transfer data between the control logic and the bitcells. The control logic provides an address of a target bitcell to the storage. Within a single clock cycle, the storage uses the address to activate the target bitcell, to precharge bitlines coupled to the target bitcell, and to access the target bitcell.
摘要:
A device for adaptively controlling a voltage supplied to circuitry in close proximity to the device, comprising a processing module and a first tracking element coupled to the processing module. The first tracking element produces a first value indicative of a first estimated speed associated with the circuitry. The device also comprises a second tracking element coupled to the processing module. The second tracking element produces a second value indicative of a second estimated speed associated with the circuitry. The processing module compares each of the first and second values to respective target values and causes a voltage output to be adjusted based on the comparisons. The first and second tracking elements comprise a plurality of transistors, at least some of the transistors selectively provided with a transistor bias voltage to adjust transistor speed.
摘要:
A method of forming a transistor (70) in a semiconductor active area (78). The method forms a gate structure (G2) in a fixed relationship to the semiconductor active area thereby defining a first source/drain region (R1) adjacent a first gate structure sidewall and a second source/drain region (R2) adjacent a second sidewall gate structure. The method also forms a lightly doped diffused region (801) formed in the first source/drain region and extending under the gate structure, wherein the lightly doped diffused region comprises a varying resistance in a direction parallel to the gate structure.
摘要:
A compact data line arrangement (600) includes “twisted” data line pairs (604a-604c) disposed in a first direction. Each twisted data line pair (604a-604c) includes an upper segment pair (608a-608f) that is connected to a lower segment pair (610a-610f) by a twist structure (612a-612c). The upper and lower segment pairs (608a-608f and 610a-610f) can be formed with a first pitch using phase-shifted lithography. The twist structures (612a-612c) are formed from a second conductive layer, and have a greater pitch than the first pitch. The twist structures (612a-612c) are generally arranged in a second direction that is perpendicular to the first direction. Selected twist structures (612b) are offset in the first direction with respect to adjacent twist structures (612a and 612c). The offset twist structures (612a-612c) allow supplemental conductive lines (618) to be formed from the first conductive layer that extend in the first direction, between adjacent offset twist structures (612a and 612b).
摘要:
An airbed having multi-zone air mattress is provided having a control that can identify the configuration of any of a plurality of hand control units connected thereto and can interpret control functions differently based on the identified unit configuration. A plurality of normally closed valves seal pressures in each of the zones when power to an air pump is off while mattress zone pressures are constantly monitored and the measurements sent by the control through a communications port for monitoring of the motion or care of a user of the bed and for analysis and diagnosis. When pump power is on, the pressure in the zones is regulated at predetermined pressure settings ideal for the user. Deviations from ideal pressure cause a programmed controller to calculate inflation or deflation times for the respective zones that would be required to inflate or exhaust the zones to the desired pressures. Ideal pressures for individual users are automatically calculated by inflating the zones to initial pressures and sealing them. Then, a user reclines on the bed and pressures are measured. From the measured pressures, ideal pressure settings are calculated that will support the user in an ideal manner, such as maintaining the user in an ideal sleeping posture with a minimum amount of pressure in the zones. The sitting up of the user, the sitting of the user on the edge of the bed, the adjustment of bed inclination angles and other non-reclining conditions are detected by analysis of the pressures in the zones or information from other sources to set pressures particularly suited to such conditions.
摘要:
A polysilicon resistor (40) includes a field oxide layer (12) and a polysilicon layer (20) that covers a portion of field oxide layer (12). The polysilicon layer (20) possesses a predetermined electrical resistance value. Nitride/oxide stack (42) covers a predetermined portion of the polysilicon layer (20) and forms at least one exposed location of polysilicon layer (20) on which not to implant a dopant to achieve a predetermined resistance value. Silicide layer (34) covers exposed location.
摘要:
A process for forming N-channel MOS sources and drains, by implanting both phosphorus and arsenic. The high diffusivity of phosphorus causes it to diffuse in advance of the bulk of the arsenic, so that, after annealing, the source/drain regions have graded regions of gradually decreasing conductivity adjacent to the end of the channels. Thus the electric potential gradient at the ends of the channels is reduced, and impact ionization and hot carrier effects are avoided. The effective radius of the source (or drain) junction is increased, providing increased breakdown voltage.