EL SEMICONDUCTOR DEVICE
    4.
    发明申请
    EL SEMICONDUCTOR DEVICE 有权
    EL半导体器件

    公开(公告)号:US20090059985A1

    公开(公告)日:2009-03-05

    申请号:US12038062

    申请日:2008-02-27

    IPC分类号: H01S5/32

    摘要: An n-type cladding layer structure which has good luminescence properties without the use of substances corresponding to RoHS Directive and a high Cl-doping efficiency, i.e. which facilitates the manufacture of a semiconductor optical element and device with low crystal defects and high reliability, and an active layer and a p-type cladding layer therefor are provided. The n-type layer being lattice matched to an InP substrate and containing Group II-VI compound as a main ingredient is a Group II-VI compound semiconductor, in which the Group II elements consist of Mg, Zn, and Be and the Group VI elements consist of Se and Te. The n-type layer of the present invention is characterized by a large energy gap, high energy of the bottom of a conduction band that is effective for suppress the Type II luminescence, high carrier concentration, and low crystal defects attributed to a good quality crystallinity.

    摘要翻译: 具有良好发光特性的n型包覆层结构,不使用与RoHS指令相对应的物质和高Cl掺杂效率,即有助于制造具有低晶体缺陷和高可靠性的半导体光学元件和器件,以及 提供了一种有源层及其p型覆层。 与InP基质晶格匹配并含有II-VI族化合物作为主要成分的n型层是II族化合物半导体,II族元素由Mg,Zn和Be组成,第VI族 元素由Se和Te组成。 本发明的n型层的特征在于具有大的能隙,能够有效地抑制II型发光,高载流子浓度和归因于良好质量结晶度的低晶体缺陷的导带底部的高能量 。

    EL semiconductor device
    5.
    发明授权
    EL semiconductor device 有权
    EL半导体器件

    公开(公告)号:US07899104B2

    公开(公告)日:2011-03-01

    申请号:US12038062

    申请日:2008-02-27

    IPC分类号: H01S5/00

    摘要: An n-type cladding layer structure which has good luminescence properties without the use of substances corresponding to RoHS Directive and a high Cl-doping efficiency, i.e. which facilitates the manufacture of a semiconductor optical element and device with low crystal defects and high reliability, and an active layer and a p-type cladding layer therefor are provided. The n-type layer being lattice matched to an InP substrate and containing Group II-VI compound as a main ingredient is a Group II-VI compound semiconductor, in which the Group II elements consist of Mg, Zn, and Be and the Group VI elements consist of Se and Te. The n-type layer of the present invention is characterized by a large energy gap, high energy of the bottom of a conduction band that is effective for suppressing the Type II luminescence, high carrier concentration, and low crystal defects attributed to a good quality crystallinity.

    摘要翻译: 具有良好发光特性的n型包覆层结构,不使用与RoHS指令相对应的物质和高Cl掺杂效率,即有助于制造具有低晶体缺陷和高可靠性的半导体光学元件和器件,以及 提供了一种有源层及其p型覆层。 与InP基质晶格匹配并含有II-VI族化合物作为主要成分的n型层是II族化合物半导体,II族元素由Mg,Zn和Be组成,第VI族 元素由Se和Te组成。 本发明的n型层的特征在于具有大的能隙,导带的底部的高能量对于抑制II型发光,高载流子浓度和归因于良好质量结晶度的低晶体缺陷是有效的 。

    Laser diode
    8.
    发明申请
    Laser diode 失效
    激光二极管

    公开(公告)号:US20090161716A1

    公开(公告)日:2009-06-25

    申请号:US12379216

    申请日:2009-02-17

    IPC分类号: H01S5/22

    摘要: A laser diode capable of effectively inhibiting effects of feedback light is provided. A laser diode includes a substrate, and a laminated structure including a first conductive semiconductor layer, an active layer having a light emitting region, and a second conductive semiconductor layer having a projecting part on the surface thereof, on the substrate, wherein a feedback light inhibition part is provided on a main-emitting-side end face, and effects of feedback light in the vicinity of lateral boundaries of the light emitting region are inhibited by the feedback light inhibition part.

    摘要翻译: 提供能够有效地抑制反馈光的影响的激光二极管。 激光二极管包括基板,以及包括第一导电半导体层,具有发光区域的有源层和在其表面上具有突出部分的第二导电半导体层的层叠结构,其中反馈光 抑制部分设置在主发光侧端面上,并且反射光抑制部分抑制了发光区域的横向边界附近的反馈光的影响。

    Method for growing a nitride compound semiconductor
    9.
    再颁专利
    Method for growing a nitride compound semiconductor 有权
    生长氮化物半导体的方法

    公开(公告)号:USRE38613E1

    公开(公告)日:2004-10-05

    申请号:US10174289

    申请日:2002-09-18

    IPC分类号: H01L2104

    摘要: A new and improved method for growing a p-type nitride III-V compound semiconductor is provided which can produce a p-type nitride compound semiconductors having a high carrier concentration, without the need for annealing to activate impurities after growth. In a preferred embodiment, a p-type nitride compound semiconductor, such as p-type GaN, is grown by metal organic chemical vapor deposition methods using a nitrogen source material which does not release hydrogen during release of nitrogen and the semiconductor is grown in an inactive gas. The nitrogen source materials may be selected from nitrogen compounds that contain hydrogen radicals groups and alkyl radicals groups and/or phenyl radicals groups provided that the total amount of hydrogen radicals groups is less than or equal to the sum total of alkyl radicals groups and phenyl radicals groups present in the nitrogen compound used as the nitrogen source material.