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1.
公开(公告)号:US20190028081A1
公开(公告)日:2019-01-24
申请号:US16126840
申请日:2018-09-10
申请人: IQE plc
发明人: Rodney Pelzel , Rytis Dargis , Andrew Clark , Howard Williams , Patrick Chin , Michael Lebby
IPC分类号: H03H1/00 , H01L41/319 , H01L27/06 , H01L29/66 , H03H9/17 , H03H3/08 , H03H3/02 , H01L23/66 , H01L41/083 , H01L41/08 , H01L29/778 , H01L29/737
CPC分类号: H03H1/0007 , H01L23/66 , H01L27/0688 , H01L29/66242 , H01L29/66431 , H01L29/737 , H01L29/778 , H01L41/0815 , H01L41/083 , H01L41/319 , H01L2223/6672 , H03H3/02 , H03H3/08 , H03H9/175 , H03H2001/0064 , H03H2001/0085 , H03H2003/025
摘要: Layer structures for RF filters can be fabricated using rare earth oxides and epitaxial aluminum nitride, and methods for growing the layer structures. A layer structure can include an epitaxial crystalline rare earth oxide (REO) layer over a substrate, a first epitaxial electrode layer over the crystalline REO layer, and an epitaxial piezoelectric layer over the first epitaxial electrode layer. The layer structure can further include a second electrode layer over the epitaxial piezoelectric layer. The first electrode layer can include an epitaxial metal. The epitaxial metal can be single-crystal. The first electrode layer can include one or more of a rare earth pnictide, and a rare earth silicide (RESi).
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公开(公告)号:US20180138284A1
公开(公告)日:2018-05-17
申请号:US15712002
申请日:2017-09-21
申请人: IQE, plc
发明人: Rodney Pelzel , Andrew Clark , Rytis Dargis , Patrick Chin , Michael Lebby
CPC分类号: H01L29/511 , H01L21/02123 , H01L21/02178 , H01L21/02293 , H01L21/02381 , H01L21/02414 , H01L21/0242 , H01L21/02433 , H01L21/02483 , H01L21/02488 , H01L21/02491 , H01L21/02502 , H01L21/02505 , H01L21/02521 , H01L29/517
摘要: Systems and methods are described herein to include an epitaxial metal layer between a rare earth oxide and a semiconductor layer. Systems and methods are described to grow a layered structure, comprising a substrate, a first rare earth oxide layer epitaxially grown over the substrate, a first metal layer epitaxially grown over the rare earth oxide layer, and a first semiconductor layer epitaxially grown over the first metal layer.
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公开(公告)号:US10825912B2
公开(公告)日:2020-11-03
申请号:US16178495
申请日:2018-11-01
申请人: IQE plc
发明人: Rodney Pelzel , Andrew Clark , Rytis Dargis , Patrick Chin , Michael Lebby
摘要: Systems and methods are described herein to include an epitaxial metal layer between a rare earth oxide and a semiconductor layer. Systems and methods are described to grow a layered structure, comprising a substrate, a first rare earth oxide layer epitaxially grown over the substrate, a first metal layer epitaxially grown over the rare earth oxide layer, and a first semiconductor layer epitaxially grown over the first metal layer.
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4.
公开(公告)号:US20170141750A1
公开(公告)日:2017-05-18
申请号:US15342045
申请日:2016-11-02
申请人: IQE, PLC
发明人: Rodney Pelzel , Rytis Dargis , Andrew Clark , Howard Williams , Patrick Chin , Michael Lebby
IPC分类号: H03H1/00 , H01L27/06 , H01L29/737 , H01L29/66 , H01L23/66 , H01L29/778
CPC分类号: H03H1/0007 , H01L23/66 , H01L27/0688 , H01L29/66242 , H01L29/66431 , H01L29/737 , H01L29/778 , H01L41/0815 , H01L41/083 , H01L41/319 , H01L2223/6672 , H03H3/02 , H03H3/08 , H03H9/175 , H03H2001/0064 , H03H2001/0085 , H03H2003/025
摘要: Layer structures for RF filters can be fabricated using rare earth oxides and epitaxial aluminum nitride, and methods for growing the layer structures. A layer structure can include an epitaxial crystalline rare earth oxide (REO) layer over a substrate, a first epitaxial electrode layer over the crystalline REO layer, and an epitaxial piezoelectric layer over the first epitaxial electrode layer. The layer structure can further include a second electrode layer over the epitaxial piezoelectric layer. The first electrode layer can include an epitaxial metal. The epitaxial metal can be single-crystal. The first electrode layer can include one or more of a rare earth pnictide, and a rare earth silicide (RESi).
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5.
公开(公告)号:US10566944B2
公开(公告)日:2020-02-18
申请号:US16126840
申请日:2018-09-10
申请人: IQE plc
发明人: Rodney Pelzel , Rytis Dargis , Andrew Clark , Howard Williams , Patrick Chin , Michael Lebby
IPC分类号: H03H1/00 , H01L41/08 , H01L41/319 , H03H3/02 , H03H3/08 , H03H9/17 , H01L23/66 , H01L27/06 , H01L29/66 , H01L29/737 , H01L29/778 , H01L41/083
摘要: Layer structures for RF filters can be fabricated using rare earth oxides and epitaxial aluminum nitride, and methods for growing the layer structures. A layer structure can include an epitaxial crystalline rare earth oxide (REO) layer over a substrate, a first epitaxial electrode layer over the crystalline REO layer, and an epitaxial piezoelectric layer over the first epitaxial electrode layer. The layer structure can further include a second electrode layer over the epitaxial piezoelectric layer. The first electrode layer can include an epitaxial metal. The epitaxial metal can be single-crystal. The first electrode layer can include one or more of a rare earth pnictide, and a rare earth silicide (RESi).
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公开(公告)号:US20190074365A1
公开(公告)日:2019-03-07
申请号:US16178495
申请日:2018-11-01
申请人: IQE plc
发明人: Rodney Pelzel , Andrew Clark , Rytis Dargis , Patrick Chin , Michael Lebby
摘要: Systems and methods are described herein to include an epitaxial metal layer between a rare earth oxide and a semiconductor layer. Systems and methods are described to grow a layered structure, comprising a substrate, a first rare earth oxide layer epitaxially grown over the substrate, a first metal layer epitaxially grown over the rare earth oxide layer, and a first semiconductor layer epitaxially grown over the first metal layer.
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7.
公开(公告)号:US10075143B2
公开(公告)日:2018-09-11
申请号:US15342045
申请日:2016-11-02
申请人: IQE, PLC
发明人: Rodney Pelzel , Rytis Dargis , Andrew Clark , Howard Williams , Patrick Chin , Michael Lebby
IPC分类号: H01L27/06 , H03H1/00 , H01L21/00 , H01L29/737 , H01L23/66 , H01L29/66 , H01L29/778 , H01L41/08 , H01L41/083 , H01L41/319 , H03H3/02 , H03H3/08 , H03H9/17
CPC分类号: H03H1/0007 , H01L23/66 , H01L27/0688 , H01L29/66242 , H01L29/66431 , H01L29/737 , H01L29/778 , H01L41/0815 , H01L41/083 , H01L41/319 , H01L2223/6672 , H03H3/02 , H03H3/08 , H03H9/175 , H03H2001/0064 , H03H2001/0085 , H03H2003/025
摘要: Layer structures for RF filters can be fabricated using rare earth oxides and epitaxial aluminum nitride, and methods for growing the layer structures. A layer structure can include an epitaxial crystalline rare earth oxide (REO) layer over a substrate, a first epitaxial electrode layer over the crystalline REO layer, and an epitaxial piezoelectric layer over the first epitaxial electrode layer. The layer structure can further include a second electrode layer over the epitaxial piezoelectric layer. The first electrode layer can include an epitaxial metal. The epitaxial metal can be single-crystal. The first electrode layer can include one or more of a rare earth pnictide, and a rare earth silicide (RESi).
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公开(公告)号:US20190172923A1
公开(公告)日:2019-06-06
申请号:US16257707
申请日:2019-01-25
申请人: IQE plc
发明人: Rodney Pelzel , Andrew Clark , Rytis Dargis , Patrick Chin , Michael Lebby
摘要: Systems and methods are described herein to include an epitaxial metal layer between a rare earth oxide and a semiconductor layer. Systems and methods are described to grow a layered structure, comprising a substrate, a first rare earth oxide layer epitaxially grown over the substrate, a first metal layer epitaxially grown over the rare earth oxide layer, and a first semiconductor layer epitaxially grown over the first metal layer. Specifically, the substrate may include a porous portion, which is usually aligned with the metal layer, with or without a rare earth oxide layer in between.
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公开(公告)号:US10128350B2
公开(公告)日:2018-11-13
申请号:US15712002
申请日:2017-09-21
申请人: IQE, plc
发明人: Rodney Pelzel , Andrew Clark , Rytis Dargis , Patrick Chin , Michael Lebby
摘要: Systems and methods are described herein to include an epitaxial metal layer between a rare earth oxide and a semiconductor layer. Systems and methods are described to grow a layered structure, comprising a substrate, a first rare earth oxide layer epitaxially grown over the substrate, a first metal layer epitaxially grown over the rare earth oxide layer, and a first semiconductor layer epitaxially grown over the first metal layer.
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