SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD AND COMPOSITION

    公开(公告)号:US20240105451A1

    公开(公告)日:2024-03-28

    申请号:US18509611

    申请日:2023-11-15

    CPC classification number: H01L21/0277 G03F7/2004 G03F7/32

    Abstract: A method for manufacturing a semiconductor substrate, includes: directly or indirectly applying a composition for forming a resist underlayer film to a substrate to form a resist underlayer film; applying a composition for forming a resist film to the resist underlayer film to form a resist film; exposing the resist film to radiation; and developing the exposed resist film. The composition for forming a resist underlayer film includes: a polymer; an acid generating agent; and a solvent. The resist underlayer film has a film thickness of 6 nm or less.

    METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE AND COMPOSITION

    公开(公告)号:US20230341778A1

    公开(公告)日:2023-10-26

    申请号:US18209751

    申请日:2023-06-14

    Abstract: A method for manufacturing a semiconductor substrate includes forming a resist underlayer film directly or indirectly on a substrate by applying a composition. The composition includes a compound and a solvent. The compound includes: at least one nitrogen-containing ring structure selected from the group consisting of a pyridine ring structure and a pyrimidine ring structure; and a partial structure represented by formula (1-1) or (1-2). X1 and X2 are each independently a group represented by formula (i), (ii), (iii), or (iv); * is a bond with a moiety of the compound other than the partial structure represented by formula (1-1) or (1-2); and Ar11 and Ar12 are each independently a substituted or unsubstituted aromatic ring having 5 to 20 ring members that forms a fused ring structure together with the two adjacent carbon atoms in the formulas (1-1) and (1-2).

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