Abstract:
A multilayer resist process pattern-forming method includes providing an inorganic film over a substrate. A protective film is provided on the inorganic film. A resist pattern is provided on the protective film. A pattern is provided on the substrate by etching that utilizes the resist pattern as a mask. A multilayer resist process inorganic film-forming composition includes a compound, an organic solvent, and a crosslinking accelerator. The compound includes a metal compound that includes a hydrolyzable group, a hydrolysate of a metal compound that includes a hydrolyzable group, a hydrolysis-condensation product of a metal compound that includes a hydrolyzable group, or a combination thereof. The compound includes at least one metal element belonging to Group 6, Group 12, or Group 13 of the Periodic Table of the Elements.
Abstract:
A radiation-sensitive resin composition includes a first polymer including an acid-labile group, an acid generator to generate an acid upon exposure to radiation, and a second polymer including a fluorine atom and a functional group shown by a general formula (x). The second polymer has a fluorine atom content higher than a fluorine atom content of the first polymer. R1 represents an alkali-labile group. A represents an oxygen atom, —NR′—, —CO—O—# or —SO2—O—##, wherein the oxygen atom represented by A is not an oxygen atom bonded directly to an aromatic ring, a carbonyl group, or a sulfoxyl group, R′ represents a hydrogen atom or an alkali-labile group, and “#” and “##” each indicate a bonding hand bonded to R1. -A-R1 (x)
Abstract:
A radiation-sensitive resin composition includes a polymer having a structural unit represented by a formula (I). In the formula (I), R1 represents a hydrogen atom or a methyl group. X represents a bivalent alicyclic hydrocarbon group not having or having a substituent. Y represents a bivalent hydrocarbon group having 1 to 20 carbon atoms. R2 represents a methyl group or a trifluoromethyl group.
Abstract:
A radiation-sensitive resin composition includes a compound represented by a formula (1), and a polymer that includes a structural unit having an acid-labile group. R1 and R4 each independently represent a hydrogen atom, or the like. R2 and R3 each independently represent a hydrogen atom or the like. X1 and X2 each independently represent a hydrogen atom, or the like, or X1 and X2 taken together represent —S—, —O—, —SO2—, or the like. A represents an ethanediyl group, wherein at least one hydrogen atom included in X1, X2 and A is substituted by —Y—SO3−M+. Y represents an alkanediyl group having 1 to 10 carbon atoms, or the like. M+ represents a monovalent onium cation. In the case where —Y—SO3−M+ is present in a plurality of number, a plurality of Ys are each identical or different and a plurality of M+s are each identical or different.
Abstract translation:辐射敏感性树脂组合物包括由式(1)表示的化合物和包含具有酸不稳定基团的结构单元的聚合物。 R 1和R 4各自独立地表示氢原子等。 R2和R3各自独立地表示氢原子等。 X1和X2各自独立地表示氢原子等,或者X1和X2一起表示-S-,-O-,-SO 2 - 等。 A表示乙二基,其中X1,X2和A中包含的至少一个氢原子被-Y-SO3-M +取代。 Y表示碳原子数1〜10的烷二基等。 M +表示单价鎓阳离子。 在-Y-SO3-M +存在多个数的情况下,多个Y分别相同或不同,多个M + s分别相同或不同。
Abstract:
A radiation-sensitive resin composition includes a compound represented by a following formula (1) and a base polymer. In the formula (1), R1 represents a monovalent cyclic organic group having a cyclic ester structure or a cyclic ketone structure; R2 represents a single bond or —CH2—; X is —O—*, —COO—*, —O—CO—O—* or —SO2-O—*, wherein * denotes a binding site to R3; R3 represents a bivalent chain hydrocarbon group having 1 to 5 carbon atoms; and M+ is a monovalent cation. The base polymer has a structural unit derived from (meth)acrylate that includes a lactone skeleton, a structural unit derived from (meth)acrylate that includes a cyclic carbonate skeleton, a structural unit derived from (meth)acrylate that includes a sultone skeleton, a structural unit derived from (meth)acrylate that includes a polar group, or a combination thereof. R1—R2—X—R3—CHF—CF2—SO3−M+ (1)
Abstract translation:辐射敏感性树脂组合物包含由下式(1)表示的化合物和基础聚合物。 式(1)中,R 1表示具有环状酯结构或环状酮结构的1价的环状有机基团, R 2表示单键或-CH 2 - ; X是-O-,-COO- *,-O-CO-O- *或-SO2-O- *,其中*表示与R3的结合位点; R3表示碳原子数为1〜5的二价链烃基; M +是一价阳离子。 基础聚合物具有衍生自包含内酯骨架的(甲基)丙烯酸酯的结构单元,衍生自包含环状碳酸酯骨架的(甲基)丙烯酸酯的结构单元,衍生自包含磺内酯骨架的(甲基)丙烯酸酯的结构单元, 衍生自包括极性基团的(甲基)丙烯酸酯的结构单元或其组合。 R1-R2-X-R3-CHF-CF2-SO3-M +(1)
Abstract:
A photoresist composition containing a polymer having a structural unit including an acid-labile group, and a compound represented by the formula (1). In the formula (1), R1 represents a hydrogen atom or a monovalent acid-labile group. R2 represents an alicyclic hydrocarbon group having 3 to 20 carbon atoms and a valency of (m+1). m is an integer of 2 to 5. R3 and R4 each independently represent a hydrogen atom, a fluorine atom, a monovalent hydrocarbon group having 1 to 20 carbon atoms or a monovalent fluorinated hydrocarbon group having 1 to 20 carbon atoms. n is an integer of 0 to 5. At least two of a plurality of R1 s optionally taken together represent a ring structure, together with a plurality of oxygen atoms bonding to R1 and the carbon atom(s) constituting R2 and bonding to these oxygen atoms. M+ represents a monovalent radiation-degradable onium cation.
Abstract translation:一种含有具有包含酸不稳定基团的结构单元的聚合物和由式(1)表示的化合物的光致抗蚀剂组合物。 在式(1)中,R 1表示氢原子或一价酸不稳定基团。 R 2表示碳原子数3〜20的脂环式烃基,(m + 1)价。 m为2〜5的整数.R 3和R 4各自独立地表示氢原子,氟原子,碳原子数1〜20的一价烃基或碳原子数1〜20的1价氟代烃基。 n是0至5的整数。任选地并入多个R 1中的至少两个表示环结构,以及与R1结合的多个氧原子和构成R 2的碳原子并键合到这些氧上 原子 M +表示一价可辐射降解的鎓阳离子。