摘要:
A semiconductor flash EPROM/EEPROM device which includes a command port for receiving instruction on a data line and providing control signals to a memory for providing program and erase functions, a method to program and erase the memory. A program sequence is comprised of setting up a program command during a first write cycle, preforming a second write cycle to load address to address register and data to to a data register, programming during a program cycle and writing a program verify command during a third write cycle to verify the programmed data during a read cycle. An erase sequence is comprised of writing a setup erase command during a first write cycle, an erase command during a second write cycle providing the erasure during an erase cycle, writing the erase verify command during a third write cycle which also addresses the address of the memory and providing erase verification during a read cycle. Both the erase and program cycles provide for measured incremental erasing and programming.
摘要:
A semiconductor flash EPROM/EEPROM device which includes a command port controller for receiving command instructions from a data bus coupled to the memory device. Instruction words to a command port controller operates to instruct the device to perform read, erase, program, or verify functions and the command port controller generates necessary control signals to cause the memory to function appropriately. By utilizing the command port controller the memory device can be erased and programmed while the device is in the circuit and permits pin compatibility with the prior art EPROM and EEPROMs.
摘要:
Circuitry for propagating test mode signals associated with a memory array including a plurality of circuits for storing test mode signals, apparatus for selectively providing test mode data to each of the circuits for storing test mode signals, and apparatus for simultaneously activating all of the circuits for storing test mode signals to provide output signals to be used for testing.
摘要:
An arrangement for generating signals for generating a particular set of test conditions within a digital circuit including a plurality of latches for storing individual bits of data representing individual operations to be accomplished within the digital circuitry, the latches each having input and output terminals; the output terminals of each of the latches being connected to individual portions of the digital circuitry to effect an individual operation thereby; apparatus connected to the input terminals of the latches for setting individual selected ones of the latches to provide selected test conditions; and apparatus for transferring the condition of a selected number of the latches simultaneously to effect a selected test condition.
摘要:
A method for writing data to an entry in a portion of a flash EEPROM memory array during a period in which that portion of the array is being erased and writing is prohibited. The method includes writing the data to a new entry position apart from the portion of the array which is being erased along with a revision number which is greater than the revision number of the original data in the original portion of the array, writing of the busy condition of the original entry to a temporary storage position apart from the portion of the array which is being erased, and invalidating entries listed in the temporary storage position when the erase operation is concluded.
摘要:
A nonvolatile memory comprises a memory array and a control circuit coupled to the memory array for performing memory operations with respect to the memory array. A storage circuit associated with the memory array is provided for storing a data. When the data is stored in the storage circuit, the memory array is locked from being accessed for the memory operations. A logic circuit is coupled to the control circuit and the storage circuit for preventing the control circuit from accessing the memory array with respect to the memory operations in accordance with the data. The logic circuit prevents the control circuit from accessing the memory array when the storage circuit stores the data. A control input is provided for receiving a control signal. The control signal is applied to the logic circuit and can be in a first voltage state and a second voltage state. When the control signal is in the first voltage state, the logic circuit is enabled to lock the memory array with respect to the memory operations in accordance with the data stored in the storage circuit. When the control signal is in the second voltage state, the logic circuit is disabled to lock the memory array and the memory array is allowed for the memory operations regardless of the data stored in the storage circuit.
摘要:
Erase control circuitry for erasing a flash memory array. The erase control circuitry resides on the same substrate as the flash memory array, along with a command state machine. The command state machine recognizes and externally generated erase command applied to the terminals and generates an active erase control signal, to which the erase control circuitry responds. The erase control circuitry includes precondition pulse application circuitry, erase pulse application circuitry and erase verification circuitry. The precondition pulse application circuitry preconditions the array by programming each bit in the flash memory to a threshold voltage level representative of a programmed state. The erase pulse application circuitry applies a single erase pulse at a time to the flash memory array to erase the flash array by bringing the threshold voltage level of each cell in the array to a level representative of an erased state. The erase verification circuitry verifies the erasure of the flash memory array on a byte by byte basis. If the byte currently being verified has been erased; the erase verification circuitry brings a match signal to an active level. The erase control circuitry determines whether additional erase pulses should be applied to the flash array based upon the match signal and the number of erase pulses previously applied to the flash array described is program control circuitry and methods of programming and erasing a flash memory array in response to two step command sequences.
摘要:
A circuit which monitors the internal state of flash memory array programming circuitry and conveys that state to circuitry external to the flash memory array so that external circuitry need not delay during any period in which a programming operation is taking place within the flash memory array.
摘要:
A non-volatile memory is described. The memory includes a memory array that includes a main block and a boot block. The memory also includes a control input for receiving a control signal. The control signal can be in a first voltage state, a second voltage state, and a third voltage state. Circuitry means is coupled to receive the control signal at the control input for (1) allowing the boot block to be updated when the control signal is in the first state and for (2) generating a power off signal to switch the memory into a substantially powered off state when the control signal is in the third voltage state. A method of controlling a non-volatile memory is also described.
摘要:
A command state machine for control circuitry associated with a memory array which control circuitry includes apparatus for programming and erasing the memory array including first state machine logic apparatus for providing control signals for reading the memory array and for initiating operations of the apparatus for programming and erasing the memory array in response to commands, and second state machine logic apparatus for controlling information derived from the memory array, the first and second state machine logic apparatus being adapted to assume predetermined states in response to any invalid command which have no adverse affect on the memory array or the control circuitry.