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公开(公告)号：US08920723B2
公开(公告)日：2014-12-30
申请号：US12515131
申请日：2007-11-16
Applicant: John Damiano, Jr. , Stephen E. Mick , David P. Nackashi
Inventor： John Damiano, Jr. , Stephen E. Mick , David P. Nackashi
IPC: G01N15/06 , G01N23/04 , H01J37/20 , G01N27/416 , B82Y10/00 , B82Y30/00 , G01N27/30 , G01N27/06 , G01N27/333 , B82Y40/00
CPC classification number: G01N23/046 , B82Y10/00 , B82Y30/00 , B82Y40/00 , G01N27/06 , G01N27/302 , G01N27/3335 , G01N27/4167 , G01N2223/419 , H01J37/20 , H01J2237/26 , H01J2237/28 , Y10S436/805 , Y10S436/809 , Y10T436/25
Abstract: A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.
Abstract translation: 一种样品支撑结构，包括由半导体材料制成并在其中具有一个或多个开口的样品支架。 制作和使用样品支撑结构的方法。
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2.发明申请公开(公告)号：US20130264476A1
公开(公告)日：2013-10-10
申请号：US13813818
申请日：2011-08-02
Applicant: John Damiano, JR. , David P. Nackashi , Stephen E. Mick
Inventor： John Damiano, JR. , David P. Nackashi , Stephen E. Mick
IPC: H01J37/16
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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3.发明授权Sample holder providing interface to semiconductor device with high density connections 有权样品架提供与高密度连接的半导体器件的接口公开(公告)号：US08466432B2
公开(公告)日：2013-06-18
申请号：US13085273
申请日：2011-04-12
Applicant: John Damiano, Jr. , Stephen E. Mick , David P. Nackashi , Montie Roland , Paul A. Hakenewerth
Inventor： John Damiano, Jr. , Stephen E. Mick , David P. Nackashi , Montie Roland , Paul A. Hakenewerth
CPC classification number: H01J37/20 , H01J37/26 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 一种用于样品的新型样品支架，用于插入电子显微镜中的样品支撑装置。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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公开(公告)号：US09040939B2
公开(公告)日：2015-05-26
申请号：US12529429
申请日：2008-02-29
Applicant: John Damiano, Jr. , Stephen E. Mick , David P. Nackashi
Inventor： John Damiano, Jr. , Stephen E. Mick , David P. Nackashi
CPC classification number: G02B21/34 , B01L3/508 , B01L2300/0851 , G01N1/312 , G01N1/36 , G01N1/42 , H01J37/20 , H01J2237/2003
Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
Abstract translation: 具有集成支撑特征的样品支撑结构和制造和使用增强膜的方法。 样品支持结构可用于支持使用微观技术（如电子显微镜，光学显微镜，X射线显微镜，UV-VIS光谱和核磁共振（NMR））技术进行分析的样品。
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公开(公告)号：US20110127427A1
公开(公告)日：2011-06-02
申请号：US12933213
申请日：2009-03-17
Applicant: David P. Nackashi , John Damiano, JR. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
Inventor： David P. Nackashi , John Damiano, JR. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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Patent Agency Ranking
公开(公告)号：US20110079710A1
公开(公告)日：2011-04-07
申请号：US12599339
申请日：2008-05-09
Applicant: John Damiano, JR. , Stephen E. Mick , David P. Nackashi
Inventor： John Damiano, JR. , Stephen E. Mick , David P. Nackashi
CPC classification number: H01J37/20 , H01J37/26 , H01J37/261 , H01J2237/188 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/2602 , H01J2237/28 , H01J2237/2802
Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
Abstract translation: 电子显微镜支撑结构及其制作和使用方法。 支撑结构通常使用半导体材料和半导体制造工艺构造。 可以控制支撑结构的温度和/或气体或液体被限制在观察区域中用于反应和/或成像。
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公开(公告)号：US20100140497A1
公开(公告)日：2010-06-10
申请号：US12529429
申请日：2008-02-29
Applicant: John Damiano, JR. , Stephen E. Mick , David P. Nackashi
Inventor： John Damiano, JR. , Stephen E. Mick , David P. Nackashi
CPC classification number: G02B21/34 , B01L3/508 , B01L2300/0851 , G01N1/312 , G01N1/36 , G01N1/42 , H01J37/20 , H01J2237/2003
Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
Abstract translation: 具有集成支撑特征的样品支撑结构和制造和使用增强膜的方法。 样品支持结构可用于支持使用微观技术（如电子显微镜，光学显微镜，X射线显微镜，UV-VIS光谱和核磁共振（NMR））技术进行分析的样品。
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公开(公告)号：US08513621B2
公开(公告)日：2013-08-20
申请号：US12933213
申请日：2009-03-17
Applicant: David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
Inventor： David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
IPC: G21K5/08
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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9.发明申请SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH DENSITY CONNECTIONS 有权样品保持器为具有高密度连接的半导体器件提供界面公开(公告)号：US20110248165A1
公开(公告)日：2011-10-13
申请号：US13085273
申请日：2011-04-12
Applicant: John Damiano, JR. , Stephen E. Mick , David P. Nackashi , Montie Roland , Paul A. Hakenewerth
Inventor： John Damiano, JR. , Stephen E. Mick , David P. Nackashi , Montie Roland , Paul A. Hakenewerth
IPC: G21K5/08
CPC classification number: H01J37/20 , H01J37/26 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 一种用于样品的新型样品支架，用于插入电子显微镜中的样品支撑装置。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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10.发明申请REUSABLE TEMPLATE FOR CREATION OF THIN FILMS; METHOD OF MAKING AND USING TEMPLATE; AND THIN FILMS PRODUCED FROM TEMPLATE 审中-公开用于创建薄膜的可重复使用的模板; 制作和使用模板的方法; 和薄膜生产的薄膜公开(公告)号：US20100221488A1
公开(公告)日：2010-09-02
申请号：US12777623
申请日：2010-05-11
Applicant: Stephen E. Mick , John Damiano, JR. , David P. Nackashi
Inventor： Stephen E. Mick , John Damiano, JR. , David P. Nackashi
CPC classification number: H01J37/20 , H01J2237/2007 , Y10T428/24273 , Y10T428/24331
Abstract: The present invention is directed generally to templates used in the creation of thin-film replicas, for example, the creation of thin films, such as carbon films, for use as specimen support in electron-beam specimen analysis. More specifically, the present invention is directed to novel reusable patterned templates, the methodology of making these reusable templates, the templates made from such methodologies, the use and reuse of these templates to make thin films of any type for any purpose, and the thin films made from these templates. A feature of the novel template of the present invention is in its employment of one or more zones of discontinuity, or undercuts, associated with the patterns transferred into the template to allow for the removal of the thin film from the template without sacrificing the structural integrity of the template to prevent at least one re-use of the template.
Abstract translation: 本发明一般涉及用于制造薄膜复制品的模板，例如在电子束标本分析中用作样品载体的薄膜如碳膜。 更具体地，本发明涉及新颖的可重复使用的图案化模板，制造这些可再利用模板的方法，由这些方法制成的模板，这些模板的使用和再利用以制造用于任何目的的任何类型的薄膜，以及薄的 这些模板制作的电影。 本发明的新型模板的特征在于其使用与转移到模板中的图案相关联的一个或多个不连续区域或底切区域，以允许从模板移除薄膜而不牺牲结构完整性 的模板，以防止至少一次重新使用模板。
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