Gift-wrapping envelope
    3.
    发明申请
    Gift-wrapping envelope 审中-公开
    礼品包装信封

    公开(公告)号:US20070046441A1

    公开(公告)日:2007-03-01

    申请号:US11213539

    申请日:2005-08-25

    申请人: John McCormick

    发明人: John McCormick

    IPC分类号: G08B3/00 B65D65/38

    摘要: A gift-wrapping envelope including: a face panel; a back panel integrally coupled with the face panel; an expandable side panel coupled to both the face and back panels; an enclosure panel integrally coupled to the face, back, or side panels and releasably couplable to one of the panels to which it is not integrally coupled; a nametag area; and a releasably couplable accessory area. The gift-wrapping envelope may include an audio label. The nametag panel may be erasably writable. The releasably couplable accessory area may include a release liner and/or a no-rip material. The expandable side panel may include accordion-type folds.

    摘要翻译: 礼品包装信封包括:面板; 与所述面板一体地联接的后面板; 耦合到面板和后面板的可扩张侧板; 一体地联接到所述面,背面或侧面板并且可释放地联接到所述面板之一的外壳面板,所述面板未整体联接到所述外壳面板; 名词区 和可释放地联接的附件区域。 礼品包装信封可以包括音频标签。 命名面板可能是可擦写的。 可释放地联接的附件区域可以包括释放衬垫和/或无撕裂材料。 可膨胀侧板可以包括手风琴型折叠。

    Dual tip test probe assembly
    10.
    发明授权
    Dual tip test probe assembly 有权
    双尖端测试探头组件

    公开(公告)号:US08026734B2

    公开(公告)日:2011-09-27

    申请号:US12490624

    申请日:2009-06-24

    IPC分类号: G01R1/067 G01R31/00

    摘要: A dual tip test probe assembly for use in both cantilever and vertical probe applications includes first and second elongated test probes, each having a body portion and a tip portion with a tip configured to make contact with a device under test. An electrically-insulating material is disposed between but not in contact with the body portions of the first and second elongated test probes to electrically isolate the first and second elongated test probes. The first and second elongated test probes are held in alignment with respect to each other so that the tip of the first elongated test probe is adjacent to and not in contact with the tip of the second elongated test probe for making simultaneous contact with the device under test. The dual tip test probe assembly provides a low inductance and a small, stable footprint for testing small and/or non-flat test points.

    摘要翻译: 用于悬臂和垂直探头应用的双尖端测试探针组件包括第一和第二细长测试探针,每个具有主体部分和尖端部分,其顶端被配置为与被测器件接触。 电绝缘材料设置在第一和第二细长测试探针之间但不与第一和第二细长测试探针的主体部分接触,以电隔离第一和第二细长测试探针。 第一和第二细长测试探针相对于彼此保持对齐,使得第一细长测试探针的尖端与第二细长测试探针的尖端相邻并且不与第二细长测试探针的尖端接触,以与下面的装置同时接触 测试。 双尖端测试探头组件提供低电感和小的稳定占地面积,用于测试小型和/或非平坦测试点。