Semiconductor light-emitting device
    2.
    发明申请
    Semiconductor light-emitting device 有权
    半导体发光装置

    公开(公告)号:US20060169997A1

    公开(公告)日:2006-08-03

    申请号:US11329589

    申请日:2006-01-10

    IPC分类号: H01L33/00

    CPC分类号: H01L33/20 Y10S257/918

    摘要: A semiconductor light-emitting device is provided. The semiconductor light-emitting device includes a laminated semiconductor structure portion composed of at least a first conductivity type first cladding layer, an active layer and a second conductivity type second cladding layer, wherein an outer peripheral surface of this laminated semiconductor structure portion is formed as a curved surface shape which is protrusively curved or bent with respect to the outside of the laminated direction.

    摘要翻译: 提供了一种半导体发光器件。 半导体发光装置包括由至少第一导电型第一包层,有源层和第二导电型第二包层构成的层叠半导体结构部,其中,该层叠半导体结构部的外周面形成为 相对于层叠方向的外侧突出地弯曲或弯曲的曲面形状。

    Semiconductor light-emitting device
    5.
    发明申请
    Semiconductor light-emitting device 有权
    半导体发光装置

    公开(公告)号:US20060170001A1

    公开(公告)日:2006-08-03

    申请号:US11331290

    申请日:2006-01-12

    IPC分类号: H01L33/00

    CPC分类号: H01L33/0075 H01L33/40

    摘要: A semiconductor light-emitting device is provided. In an InGaN-based semiconductor light-emitting device including an Ag electrode, a semiconductor layer on the contact side of at least the Ag electrode is a dislocation semiconductor layer of which dislocation density is selected to be less than 1×107 (1/cm2) and thereby short-circuit caused by Ag migration generated along this dislocation can be avoided. Thus, this semiconductor light-emitting device is able to solve a problem of a shortened life and a problem with the fraction of defective devices encountered with the InGaN-based semiconductor light-emitting device.

    摘要翻译: 提供了一种半导体发光器件。 在包括Ag电极的InGaN系半导体发光器件中,至少Ag电极的接触侧的半导体层是位错密度选择为小于1×10 7(1 / cm 2),从而可以避免沿着该位错产生的Ag迁移引起的短路。 因此,该半导体发光器件能够解决寿命缩短的问题,并且能够解决InGaN系半导体发光元件遇到的缺陷器件的分数的问题。

    Semiconductor light-emitting device
    6.
    发明授权
    Semiconductor light-emitting device 有权
    半导体发光装置

    公开(公告)号:US07468528B2

    公开(公告)日:2008-12-23

    申请号:US11329589

    申请日:2006-01-10

    IPC分类号: H01L33/00

    CPC分类号: H01L33/20 Y10S257/918

    摘要: A semiconductor light-emitting device is provided. The semiconductor light-emitting device includes a laminated semiconductor structure portion composed of at least a first conductivity type first cladding layer, an active layer and a second conductivity type second cladding layer, wherein an outer peripheral surface of this laminated semiconductor structure portion is formed as a curved surface shape which is protrusively curved or bent with respect to the outside of the laminated direction.

    摘要翻译: 提供了一种半导体发光器件。 半导体发光装置包括由至少第一导电型第一包层,有源层和第二导电型第二包层构成的层叠半导体结构部,其中,该层叠半导体结构部的外周面形成为 相对于层叠方向的外侧突出地弯曲或弯曲的曲面形状。

    Semiconductor light-emitting device
    8.
    发明授权
    Semiconductor light-emitting device 有权
    半导体发光装置

    公开(公告)号:US07956380B2

    公开(公告)日:2011-06-07

    申请号:US11331290

    申请日:2006-01-12

    IPC分类号: H01L33/00

    CPC分类号: H01L33/0075 H01L33/40

    摘要: A semiconductor light-emitting device is provided. In an InGaN-based semiconductor light-emitting device including an Ag electrode, a semiconductor layer on the contact side of at least the Ag electrode is a dislocation semiconductor layer of which dislocation density is selected to be less than 1×107 (1/cm2) and thereby short-circuit caused by Ag migration generated along this dislocation can be avoided. Thus, this semiconductor light-emitting device is able to solve a problem of a shortened life and a problem with the fraction of defective devices encountered with the InGaN-based semiconductor light-emitting device.

    摘要翻译: 提供了一种半导体发光器件。 在包括Ag电极的InGaN系半导体发光元件中,至少Ag电极的接触侧的半导体层是位错密度选择为小于1×10 7(1 / cm 2)的位错半导体层 ),从而可以避免沿着该位错产生的Ag迁移引起的短路。 因此,该半导体发光器件能够解决寿命缩短的问题,并且能够解决InGaN系半导体发光元件遇到的缺陷器件的分数的问题。

    Semiconductor light-emitting device, semiconductor light-emitting apparatus, and method of manufacturing semiconductor light-emitting device
    9.
    发明授权
    Semiconductor light-emitting device, semiconductor light-emitting apparatus, and method of manufacturing semiconductor light-emitting device 失效
    半导体发光装置,半导体发光装置以及半导体发光装置的制造方法

    公开(公告)号:US07700959B2

    公开(公告)日:2010-04-20

    申请号:US11568427

    申请日:2005-03-31

    摘要: A semiconductor light-emitting device capable of obtaining a high light reflectance through the use of a high-reflection metal layer formed on the side of an electrode on one side and capable of preventing migration of atoms from the high-reflectance metal layer is provided. Semiconductor layers of the opposite conduction types are formed on the opposite sides of an active layer, and an ohmic contact layer being a thin film for contriving a decrease in contact resistance, a transparent and conductive layer, and a high-reflection metal layer for reflecting light generated in the active layer are sequentially layered on one of the semiconductor layers. Since the transparent conductive layer functions also as a barrier layer and it transmits light, a high light take-out efficiency can be obtained through the reflection at the high-reflectance metal layer.

    摘要翻译: 提供一种半导体发光器件,其能够通过使用形成在电极侧的高反射金属层,并能够防止原子从高反射率金属层迁移而获得高的光反射率。 相反导电类型的半导体层形成在有源层的相对侧上,欧姆接触层是用于减小接触电阻的薄膜,透明导电层和用于反射的高反射金属层 在有源层中产生的光依次层叠在一个半导体层上。 由于透明导电层也用作阻挡层并且透射光,因此可以通过高反射率金属层的反射获得高的光取出效率。

    Semiconductor Light-Emitting Device, Semiconductor Light-Emitting Apparatus, and Method of Manufacturing Semiconductor Light-Emitting Device
    10.
    发明申请
    Semiconductor Light-Emitting Device, Semiconductor Light-Emitting Apparatus, and Method of Manufacturing Semiconductor Light-Emitting Device 失效
    半导体发光器件,半导体发光器件和半导体发光器件的制造方法

    公开(公告)号:US20080121904A1

    公开(公告)日:2008-05-29

    申请号:US11568427

    申请日:2005-03-31

    IPC分类号: H01L21/329 H01L33/00

    摘要: There is obtained a semiconductor light-emitting device capable of obtaining a high light reflectance through the use of a high-reflection metal layer formed on the side of an electrode on one side and capable of preventing migration of atoms from the high-reflectance metal layer. Semiconductor layers of the opposite conduction types are formed on the opposite sides of an active layer, and an ohmic contact layer being a thin film for contriving a decrease in contact resistance, a transparent and conductive layer, and a high-reflection metal layer for reflecting light generated in the active layer are sequentially layered on one of the semiconductor layers. Since the transparent conductive layer functions also as a barrier layer and it transmits light, a high light take-out efficiency can be obtained through the reflection at the high-reflectance metal layer.

    摘要翻译: 通过使用在一侧形成的电极侧形成的能够防止原子从高反射率金属层迁移的高反射金属层,能够得到高反射率的半导体发光元件 。 相反导电类型的半导体层形成在有源层的相对侧上,欧姆接触层是用于减小接触电阻的薄膜,透明导电层和用于反射的高反射金属层 在有源层中产生的光依次层叠在一个半导体层上。 由于透明导电层也用作阻挡层并且透射光,因此可以通过高反射率金属层的反射获得高的光取出效率。