ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM USING THE SAME AND PATTERN FORMING METHOD
    3.
    发明申请
    ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM USING THE SAME AND PATTERN FORMING METHOD 有权
    化学敏感性或辐射敏感性树脂组合物,使用它们的抗静电膜和图案形成方法

    公开(公告)号:US20120003586A1

    公开(公告)日:2012-01-05

    申请号:US13257069

    申请日:2010-03-23

    IPC分类号: G03F7/20 G03F7/004

    摘要: Provided are an actinic ray-sensitive or radiation-sensitive resin composition; a resist film using the composition; and a pattern forming method. The actinic ray-sensitive or radiation-sensitive resin composition includes (A) a resin capable of increasing the solubility in an alkali developer by the action of an acid, the resin containing a repeating unit represented by formula (I), a repeating unit represented by formula (II) and a repeating unit represented by formula (III), and (B) a compound capable of generating a fluorine atom-containing acid upon irradiation with an actinic ray or radiation: wherein each of R1 and R11 independently represents a hydrogen atom or an alkyl group which may have a substituent, and R12 represents a phenyl group which may have a substituent.

    摘要翻译: 提供光化射线敏感或辐射敏感性树脂组合物; 使用该组合物的抗蚀剂膜; 和图案形成方法。 光化射线敏感性或辐射敏感性树脂组合物包含(A)能够通过酸的作用增加在碱性显影剂中的溶解性的树脂,含有式(I)表示的重复单元的树脂,表示的重复单元 通过式(II)表示的重复单元和式(III)表示的重复单元,和(B)能够在用光化学射线或辐射照射时能够产生含氟原子的酸的化合物:其中R 1和R 11各自独立地表示氢 原子或可以具有取代基的烷基,R12表示可以具有取代基的苯基。

    Actinic ray-sensitive or radiation-sensitive resin composition, and resist film and pattern forming method using the same
    5.
    发明授权
    Actinic ray-sensitive or radiation-sensitive resin composition, and resist film and pattern forming method using the same 有权
    光敏性或辐射敏感性树脂组合物,以及使用其的抗蚀剂膜和图案形成方法

    公开(公告)号:US08795945B2

    公开(公告)日:2014-08-05

    申请号:US13521332

    申请日:2011-03-04

    IPC分类号: G03F7/039 G03F7/20 G03F7/30

    摘要: An actinic ray-sensitive or radiation-sensitive resin composition, and a resist film and a pattern forming method using the composition are provided, the composition including (A) a compound capable of decomposing by the action of an acid to increase the solubility of the resin (A) in an alkali developer; (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; (C) a basic compound; and (D) a specific compound containing at least two specific alicyclic hydrocarbon groups each substituted with a hydroxyl group.

    摘要翻译: 提供光化射线敏感性或辐射敏感性树脂组合物,以及使用该组合物的抗蚀剂膜和图案形成方法,该组合物包含(A)能够通过酸的作用分解以增加其溶解度的化合物 树脂(A)在碱性显影剂中; (B)能够在用光化射线或辐射照射时能产生酸的化合物; (C)碱性化合物; 和(D)含有至少两个各自被羟基取代的特定脂环族烃基的化合物。

    Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using the same
    7.
    发明授权
    Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using the same 有权
    光化射线敏感性或辐射敏感性树脂组合物和使用其的图案形成方法

    公开(公告)号:US08877423B2

    公开(公告)日:2014-11-04

    申请号:US13378387

    申请日:2010-06-30

    IPC分类号: G03F7/004 G03F7/028

    摘要: An actinic ray-sensitive or radiation-sensitive resin composition including: (A) a resin that contains a repeating unit represented by formula (I) as defined in the specification, a repeating unit represented by formula (II) as defined in the specification and a repeating unit represented by formula (III-a) or (III-b) as defined in the specification; (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; and (C) a solvent, wherein the solvent (C) contains ethyl lactate, and a film and a pattern forming method using the composition are provided.

    摘要翻译: 一种光化射线敏感性或辐射敏感性树脂组合物,其包含:(A)含有本说明书中定义的式(I)表示的重复单元的树脂,由说明书中定义的式(II)表示的重复单元和 由本说明书中定义的式(III-a)或(III-b)表示的重复单元; (B)能够在用光化射线或辐射照射时能产生酸的化合物; 和(C)溶剂,其中溶剂(C)含有乳酸乙酯,并且提供使用该组合物的膜和图案形成方法。

    Pattern forming method, chemical amplification resist composition and resist film
    9.
    发明授权
    Pattern forming method, chemical amplification resist composition and resist film 有权
    图案形成方法,化学放大抗蚀剂组合物和抗蚀剂膜

    公开(公告)号:US08647812B2

    公开(公告)日:2014-02-11

    申请号:US13636834

    申请日:2011-03-18

    摘要: A pattern forming method comprising (i) a step of forming a film from a chemical amplification resist composition, (ii) a step of exposing the film, and (iii) a step of developing the exposed film by using an organic solvent-containing developer, wherein the resist composition contains (A) a resin capable of increasing the polarity to decrease the solubility for an organic solvent-containing developer by the action of an acid, (B) at least one kind of a compound capable of generating a sulfonic acid represented by the specific formula upon irradiation with an actinic ray or radiation, and (C) a solvent.

    摘要翻译: 一种图案形成方法,包括(i)从化学放大抗蚀剂组合物形成膜的步骤,(ii)曝光所述膜的步骤,以及(iii)通过使用含有机溶剂的显影剂使曝光的膜显影的步骤 ,其中抗蚀剂组合物含有(A)能够通过酸作用增加极性以降低对含有机溶剂的显影剂的溶解度的树脂,(B)至少一种能够产生磺酸的化合物 由光化射线或辐射照射时的具体式表示,和(C)溶剂。

    PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM
    10.
    发明申请
    PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM 有权
    图案形成方法,化学放大电阻组合物和电阻膜

    公开(公告)号:US20130011619A1

    公开(公告)日:2013-01-10

    申请号:US13636834

    申请日:2011-03-18

    IPC分类号: G03F7/20 B32B3/30

    摘要: A pattern forming method comprising (i) a step of forming a film from a chemical amplification resist composition, (ii) a step of exposing the film, and (iii) a step of developing the exposed film by using an organic solvent-containing developer, wherein the resist composition contains (A) a resin capable of increasing the polarity to decrease the solubility for an organic solvent-containing developer by the action of an acid, (B) at least one kind of a compound capable of generating a sulfonic acid represented by the specific formula upon irradiation with an actinic ray or radiation, and (C) a solvent.

    摘要翻译: 一种图案形成方法,包括(i)从化学放大抗蚀剂组合物形成膜的步骤,(ii)曝光所述膜的步骤,以及(iii)通过使用含有机溶剂的显影剂使曝光的膜显影的步骤 ,其中抗蚀剂组合物含有(A)能够通过酸作用增加极性以降低对含有机溶剂的显影剂的溶解度的树脂,(B)至少一种能够产生磺酸的化合物 由光化射线或辐射照射时的具体式表示,和(C)溶剂。