Method for forming light guide layer in semiconductor substrate
    5.
    发明授权
    Method for forming light guide layer in semiconductor substrate 有权
    在半导体衬底中形成导光层的方法

    公开(公告)号:US08546162B2

    公开(公告)日:2013-10-01

    申请号:US13243763

    申请日:2011-09-23

    IPC分类号: H01L21/00

    CPC分类号: G02B6/138 G02B6/136

    摘要: A method for forming a light guide layer with improved transmission reliability in a semiconductor substrate, the method including forming a trench in the semiconductor substrate, forming a cladding layer and a preliminary light guide layer in the trench such that only one of opposite side end portions of the preliminary light guide layer is in contact with an inner sidewall of the trench, and performing a thermal treatment on the substrate to change the preliminary light guide layer into the light guide layer.

    摘要翻译: 一种在半导体衬底中形成具有改善的透射可靠性的导光层的方法,所述方法包括在所述半导体衬底中形成沟槽,在所述沟槽中形成包覆层和预备导光层,使得只有一个相对侧端部 所述预备光导层与所述沟槽的内侧壁接触,并对所述基板进行热处理,以将所述初步导光层改变为所述导光层。

    METHOD FOR FORMING LIGHT GUIDE LAYER IN SEMICONDUCTOR SUBSTRATE
    6.
    发明申请
    METHOD FOR FORMING LIGHT GUIDE LAYER IN SEMICONDUCTOR SUBSTRATE 有权
    在半导体衬底中形成光导层的方法

    公开(公告)号:US20120088323A1

    公开(公告)日:2012-04-12

    申请号:US13243763

    申请日:2011-09-23

    IPC分类号: H01L33/58 H01L33/02

    CPC分类号: G02B6/138 G02B6/136

    摘要: A method for forming a light guide layer with improved transmission reliability in a semiconductor substrate, the method including forming a trench in the semiconductor substrate, forming a cladding layer and a preliminary light guide layer in the trench such that only one of opposite side end portions of the preliminary light guide layer is in contact with an inner sidewall of the trench, and performing a thermal treatment on the substrate to change the preliminary light guide layer into the light guide layer.

    摘要翻译: 一种在半导体衬底中形成具有改善的透射可靠性的导光层的方法,所述方法包括在所述半导体衬底中形成沟槽,在所述沟槽中形成包覆层和预备导光层,使得只有一个相对侧端部 所述预备光导层与所述沟槽的内侧壁接触,并对所述基板进行热处理,以将所述初步导光层改变为所述导光层。

    Semiconductor Device and Method of Fabricating the Same
    10.
    发明申请
    Semiconductor Device and Method of Fabricating the Same 有权
    半导体器件及其制造方法

    公开(公告)号:US20130187287A1

    公开(公告)日:2013-07-25

    申请号:US13627790

    申请日:2012-09-26

    IPC分类号: H01L23/498

    摘要: A semiconductor device includes a circuit pattern over a first surface of a substrate, an insulating interlayer covering the circuit pattern, a TSV structure filling a via hole through the insulating interlayer and the substrate, an insulation layer structure on an inner wall of the via hole and on a top surface of the insulating interlayer, a buffer layer on the TSV structure and the insulation layer structure, a conductive structure through the insulation layer structure and a portion of the insulating interlayer to be electrically connected to the circuit pattern, a contact pad onto a bottom of the TSV structure, and a protective layer structure on a second surface the substrate to surround the contact pad.

    摘要翻译: 半导体器件包括在衬底的第一表面上的电路图案,覆盖电路图案的绝缘夹层,填充通过绝缘夹层和衬底的通孔的TSV结构,在通孔的内壁上的绝缘层结构 并且在绝缘中间层的上表面上,具有TSV结构和绝缘层结构的缓冲层,通过绝缘层结构的导电结构和电连接到电路图案的绝缘夹层的一部分,接触垫 到TSV结构的底部,以及在第二表面上的保护层结构,以包围接触垫。