Transparent medium processing device
    1.
    发明授权
    Transparent medium processing device 有权
    透明介质处理装置

    公开(公告)号:US06707021B2

    公开(公告)日:2004-03-16

    申请号:US10098317

    申请日:2002-03-18

    IPC分类号: G01J132

    摘要: The transparent medium processing device comprises: a light control section 2 for performing variable control for the status of the laser beam emitted from the light source section 1, and a light status measurement section 4 for measuring the status of the laser beam inside the processing target TG. The light control section is adjusted based on the output of the light status measurement section so that the status of the laser beam inside the processing target becomes a desired status. Since the status of the laser beam inside the processing target, which is made of such a transparent medium as glass, is measured by the light status measurement section, and is fed back to the light control section, laser processing can be executed while maintaining an optimum status at a processing point inside the processing target.

    摘要翻译: 透明介质处理装置包括:用于对从光源部分1发射的激光束的状态执行可变控制的光控制部分2和用于测量处理目标内的激光束状态的光状态测量部分4 TG。 基于光状态测量部的输出调整光控制部,使得处理对象内的激光束的状态成为期望状态。 由于由玻璃制的透明介质构成的处理对象内部的激光束的状态由光状态测量部测量,并被反馈到光控制部,因此可以在维持 处理目标内处理点的最佳状态。

    Light track observing device
    2.
    发明授权
    Light track observing device 有权
    光轨观察装置

    公开(公告)号:US07046365B1

    公开(公告)日:2006-05-16

    申请号:US10343017

    申请日:2000-07-27

    IPC分类号: G01B9/02

    CPC分类号: G01J11/00 G04F13/02

    摘要: A light pulse from an ultrashort pulse light source 11 is split by a beam splitter 12 and guided, to a detection medium 4, as an excitation pulse and probe pulse having respective predetermined linearly polarized states by an excitation optical system 2 and probe optical system 3, respectively. A light track region which is generated in the detection medium 4 by incidence of the excitation pulse, and in which the refractive index is changed by a nonlinear optical effect, is irradiated with the probe pulse. Of components which have passed through the detection medium 4, a probe pulse component whose polarized state has changed through the light track region is detected by a camera 53 via an analyzer 51 in a photodetection part 5. This realizes a light track observation apparatus capable of directly observing the light track of an excitation pulse.

    摘要翻译: 来自超短脉冲光源11的光脉冲被分束器12分离,并通过激发光学系统2和探针光学系统3被引导到检测介质4作为具有各自的预定线偏振态的激励脉冲和探针脉冲 , 分别。 用探测脉冲照射通过入射激励脉冲而在检测介质4中产生的光线区域,其中折射率由非线性光学效应改变。 已经通过检测介质4的部件中,通过光检测部分5中的分析器51,通过照相机53检测其偏振状态已经通过光轨区域改变的探针脉冲分量。 这实现了能够直接观察激励脉冲的光轨的光轨观察装置。

    TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
    3.
    发明申请
    TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE 有权
    总反射TERAHERTZ波形测量装置

    公开(公告)号:US20110249253A1

    公开(公告)日:2011-10-13

    申请号:US12988158

    申请日:2009-04-27

    IPC分类号: G01J3/00

    摘要: A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.

    摘要翻译: 全反射太赫波测量装置1包括光源11,分支部12,斩波器13,光程长度差调节部14,偏振器15,分束器17,太赫兹波发生元件20,滤光器 25,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53a,光电检测器53b,差分放大器54和锁定放大器55。 内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化,太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化 滤光器25允许太赫兹波被透过并阻止泵浦光。 因此,能够实现小型化的全反射太赫兹波测量装置。

    Instrument for measuring lifetime of fluorescene
    5.
    发明授权
    Instrument for measuring lifetime of fluorescene 失效
    用于测量荧光寿命的仪器

    公开(公告)号:US07002162B1

    公开(公告)日:2006-02-21

    申请号:US10344850

    申请日:2000-08-18

    IPC分类号: G01N21/64

    CPC分类号: G01N21/6408 G01N21/6445

    摘要: A fluorescence component that passes through a region of a detection medium where a change in refractive index has been induced through a nonlinear optical effect produced in the detection medium by a gate pulse is observed as a fluorescence image by utilizing a change in polarization state. By observing the change in position of the fluorescence image while correlating with the change over time in the fluorescence, a fluorescence lifetime measuring apparatus is realized with which the change over time in the fluorescence, in particular the fluorescence lifetime, can be measured efficiently with high temporal resolution.

    摘要翻译: 通过利用偏振状态的变化,通过在检测介质中通过栅极脉冲产生的非线性光学效应,通过检测介质的区域的折射率变化的荧光成分被观察为荧光图像。 通过观察荧光图像的位置变化,同时与荧光中随时间的变化相关联,实现了荧光寿命测量装置,其中荧光寿命随时间的变化,特别是荧光寿命可以高效地测量 时间分辨率。

    Total reflection terahertz wave measurement device
    6.
    发明授权
    Total reflection terahertz wave measurement device 有权
    全反射太赫兹波测量装置

    公开(公告)号:US08415625B2

    公开(公告)日:2013-04-09

    申请号:US12988158

    申请日:2009-04-27

    IPC分类号: G01J5/02

    摘要: A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.

    摘要翻译: 全反射太赫波测量装置1包括光源11,分支部12,斩波器13,光程长度差调节部14,偏振器15,分束器17,太赫兹波发生元件20,滤光器 25,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53a,光电检测器53b,差分放大器54和锁定放大器55。 内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化,太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化 滤光器25允许太赫兹波被透过并阻止泵浦光。 因此,能够实现小型化的全反射太赫兹波测量装置。

    Image pickup device
    9.
    发明授权
    Image pickup device 有权
    图像拾取装置

    公开(公告)号:US07046360B2

    公开(公告)日:2006-05-16

    申请号:US10258450

    申请日:2001-03-16

    IPC分类号: G01J3/28 G01J4/00

    CPC分类号: G02B21/365 G02B21/002

    摘要: In an imaging apparatus, a detection section 9 detects a beam LF having passed through an aperture 5 in a first direction and a location designation beam LB having passed through the aperture 5 in the opposite direction is made incident to a position (x,y) in a first light image IM1 on an image pickup surface corresponding to a specific position (x,y) in a second light image IM2, whereby the result of detection of the beam LF detected at the detection section 9 indicates data at a specific position in an incoming light image designated by the location designation beam LB, regardless of whether there is a mechanical error in movement of the aperture 5.

    摘要翻译: 在成像装置中,检测部分9检测已经穿过第一方向上的孔5的光束L'F和穿过孔的位置指定光束L B 5相对于与第二光图像IM2中的特定位置(x,y)对应的图像拾取表面上的第一光图像IM 1中的位置(x,y)入射,从而得到 在检测部分9处检测到的光束L> F检测指示由位置指定光束L B B指定的入射光图像中的特定位置处的数据,而不管是否存在 是孔5的运动中的机械误差。